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11. 发明申请

US20100067102A1 OPTICAL MICROSCOPE 有权
标题翻译：光学显微镜
公开(公告)号：US20100067102A1
公开(公告)日：2010-03-18
申请号：US12553357
申请日：2009-09-03
申请人： Eiji YOKOI , Yoshinori Iketaki
发明人： Eiji YOKOI , Yoshinori Iketaki
IPC分类号： G02B21/06
CPC分类号： G02B21/16 , G01N21/636 , G01N21/6458 , G01N21/65 , G01N2021/1736 , G01N2021/6493
摘要： The present invention provides an optical microscope capable of suppressing unnecessary response light as a background and detecting desired response light in nonlinear optical response process with a good S/N ratio. The optical microscope for collecting, on a sample 8, stimulation light emitted from a stimulation light source 1 and having a single wavelength or a plurality of different wavelengths, and detecting response light emitted from the sample 8 in nonlinear optical response process, comprises: an erase light source 2 for emitting erase light having a wavelength different from that of the stimulation light and inducing an effect of suppressing secondary response light which appears due to irradiation of the stimulation light on the sample 8, wherein the erase light and the stimulation light are simultaneously irradiated on the sample 8 such that the erase light does not suppress response light emitted from a light-collecting area of the stimulation light but suppresses the secondary response light other than the response light emitted from a light-collecting area of the stimulation light.
摘要翻译：本发明提供一种能够抑制不必要的响应光作为背景的光学显微镜，并以良好的S / N比检测非线性光学响应处理中的期望的响应光。用于在样品8上收集从刺激光源1发射并具有单一波长或多个不同波长的刺激光并且在非线性光学响应过程中检测从样品8发射的响应光的光学显微镜包括：擦除光源2，用于发射具有与刺激光的波长不同的波长的擦除光，并且引起抑制由于刺激光照射在样品8上而出现的二次响应光的效果，其中擦除光和刺激光是同时对样品8照射，使得擦除光不抑制从刺激光的聚光区域发出的响应光，而是抑制除了从刺激光的聚光区域发出的响应光之外的二次响应光。

12. 发明申请

US20100014156A1 MICROSCOPE 审中-公开
标题翻译：显微镜
公开(公告)号：US20100014156A1
公开(公告)日：2010-01-21
申请号：US12438994
申请日：2007-08-08
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G02B21/06
CPC分类号： G02B21/16 , G01N21/6458 , G01N2021/6415 , G01N2201/06113 , G01N2201/104 , G01N2201/1053 , G02B5/20 , G02B5/3083 , G02B21/002 , G02B26/06 , G02B2207/113
摘要： A microscope for observing a sample containing a substance having at least two excited quantum states includes a pump light source 21 for emitting pump light, an erase light source 22 for emitting erase light, a light combining section 23 to 26 for coaxially combining the pump light and the erase light, a light collecting section 62 for collecting the combined lights, a scanning section 44 and 45 for scanning the sample with the combined lights, a detecting section 50 for detecting photoresponsive signals generated from the sample, a wavelength selecting element 42 arranged in the light path of the combined lights and provided with an erase light selecting region having a high wavelength selectivity for the erase light and with a pump light selecting region having a high wavelength selectivity for the pump light, and a space modulating element 43 arranged in the light path of the combined lights for spatially modulating the erase light corresponding to the erase light selecting region of the wavelength selecting element.
摘要翻译：用于观察含有具有至少两个激发量子态的物质的样品的显微镜包括用于发射泵浦光的泵浦光源21，用于发射擦除光的擦除光源22，用于同时组合泵浦光的光合成部23至26 擦除光，用于收集组合光的光收集部分62，用于组合光扫描样本的扫描部分44和45;检测部分50，用于检测从样本产生的光响应信号;波长选择元件42，被布置在组合光的光路中设置有对于擦除光具有高波长选择性的擦除光选择区域和对泵浦光具有高波长选择性的泵浦光选择区域，以及空间调制元件43，其布置在用于空间调制对应于擦除光选择区域的擦除光的组合光的光路的波长选择元件。

13. 发明申请

US20090261271A1 SAMPLE OBSERVING METHOD AND MICROSCOPE 审中-公开
标题翻译：样品观察方法和显微镜
公开(公告)号：US20090261271A1
公开(公告)日：2009-10-22
申请号：US12309440
申请日：2007-07-02
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G01N21/00 , G02B21/06 , G01J3/46
CPC分类号： G02B21/16 , G01N21/6458 , G01N2021/6432
摘要： A method for observing a sample containing photochromic molecules having a quantum state of at least a first stable state S0 and a second stable state S3. Used are first light for exciting the photochromic molecules from the first stable state S0 to a first excited state S1 enabling optical response, and second light for exciting the photochromic molecules from the first excited state S1 to a second excited state S2 of another energy level. The sample is irradiated with the first light and the second light partly overlapping each other so that the photochromic molecules in the region irradiated with the overlapping first and second lights are transformed through the second excited state S2 to the second stable state S3, and the photochromic molecules in the region irradiated with the first light only are transformed to the first excited state S1, thereby observing the sample.
摘要翻译：一种用于观察含有具有至少第一稳定状态S0和第二稳定状态S3的量子态的光致变色分子的样品的方法。使用的是用于激发从第一稳定状态S0到能够进行光响应的第一激发态S1的光致变色分子的第一光，以及用于将光致变色分子从第一激发态S1激励到另一能级的第二激发态S2的第二光。用第一光照射样品，第二光部分地彼此重叠，使得被重叠的第一和第二光照射的区域中的光致变色分子通过第二激发态S2转变为第二稳定状态S3，并且光致变色将仅用第一光照射的区域中的分子转变为第一激发态S1，从而观察样品。

14. 发明申请

US20070291353A1 Super-Resolution Microscope 有权
标题翻译：超分辨率显微镜
公开(公告)号：US20070291353A1
公开(公告)日：2007-12-20
申请号：US11659525
申请日：2005-07-25
申请人： Yoshinori Iketaki , Takeshi Watanabe , Masaaki Fujii
发明人： Yoshinori Iketaki , Takeshi Watanabe , Masaaki Fujii
IPC分类号： G02B21/06 , H01S3/00
CPC分类号： G01N21/6458 , G01N2021/6419 , G01N2021/6439 , G02B21/002 , G02B21/16 , G02B27/58
摘要： [Task] To provide a super-resolution microscope whereby the light source of pump light and erase light can be selected easily and a super-resolution can be reliably achieved through a simple and inexpensive arrangement. [Solution of the Task] A super-resolution microscope includes an optical system (3, 4, 9) for combining a part of a first coherent light from a first light source (2) and a part of a second coherent light from a second light source (1) and focusing the coherent lights onto a sample (10), scanning means (6, 7) for scanning the coherent lights, and detecting means (16) for detecting an optical response signal from the sample (10). The microscope is configured so as to satisfy the following conditions: σ01Ipτ≦1, and 0.65(λe/λp)≦τσdipIe where λp is the wavelength of the first coherent light, λe is the wavelength of the second coherent light, τ is the excited lifetime in which the molecule is excited by the first coherent light from the ground state to the first electron-excited state, Ip is the maximum photon flux on the sample surface of the first coherent light, Ie is the maximum photon flux on the sample surface of the second coherent light, σ01, is the absorption cross-sectional area when the molecule is exited from the ground state to the first electron-excited state, and σdip is the fluorescence suppression cross-sectional area.
摘要翻译： [任务]提供一种能够容易地选择泵浦光和擦除光的光源的超分辨率显微镜，并且通过简单且廉价的布置可以可靠地实现超分辨率。 [任务的解决方案]超分辨率显微镜包括用于组合来自第一光源（2）的第一相干光的一部分和来自第二光源的第二相干光的一部分的光学系统（3,4,9）光源（1），并将相干光聚焦到样品（10）上，用于扫描相干光的扫描装置（6,7）以及用于检测来自样品（10）的光响应信号的检测装置（16）。显微镜被配置为满足以下条件：<？in-line-formula description =“In-line Formulas”end =“lead”？> sigma Iptau <= 1，？in-line-formula description =“In-line Formulas”end =“tail”？> <？in-line-formula description =“In-line formula”end =“lead”？> 0.65（lambdae / lambdap） = tausigma Ie <？in-line-formula description =“In-line Formulas”end =“tail”？>其中lambdap是第一个相干光的波长，lambdae是第二相干光，tau是分子被从基态到第一电子激发态的第一相干光激发的激发寿命，Ip是第一相干光的样品表面上的最大光子通量，Ie是第二相干光的样品表面上的最大光子通量σσ是当分子从基态退出到第一电子激发态时的吸收横截面积，而西格玛浸渍是荧光抑制截面积。

15. 发明授权

US06844963B2 Double-resonance-absorption microscope 有权
标题翻译：双共振吸收显微镜
公开(公告)号：US06844963B2
公开(公告)日：2005-01-18
申请号：US09814125
申请日：2001-03-22
申请人： Yoshinori Iketaki , Mashaaki Fujii , Takeshige Omatsu , Osamu Sato , Kimiyoshi Yamamoto
发明人： Yoshinori Iketaki , Mashaaki Fujii , Takeshige Omatsu , Osamu Sato , Kimiyoshi Yamamoto
IPC分类号： G01J3/44 , G01N21/64 , G02B21/16 , G21K7/00 , G02B21/00 , G01J3/30
CPC分类号： G01J3/4406 , G01N21/6428 , G01N21/6458 , G02B21/16
摘要： The present invention provides various embodiments of a double-resonance-absorption microscope which realizes a super-resolution by using double resonance absorption. In particular, a double-resonance-absorption microscope includes a light source for a pump light of a wavelength λ1 which excites a sample molecule to a first electronic excited state from a ground state, a light source for an erase light of a wavelength λ2 which excites the sample molecule to a second electronic excited state or a higher excited state from the first electronic excited state, and an overlap component for partially overlapping irradiating areas of the pump light and the erase light with each other. An emission area upon deexcitation of the sample molecule to the ground state from the first electronic excited state is partially inhibited by irradiating the pump light and the erase light through the overlap means. On an optical path of the erase light, a spatial filter is provided which has a condenser lens, a collimate lens, and a pinhole therebetween, and performs condensing of the erase light onto the pinhole by the condenser lens and collimating of the erase light passed through the pinhole into a parallel beam by the collimate lens.
摘要翻译：本发明提供了通过使用双共振吸收实现超分辨率的双共振吸收显微镜的各种实施方案。特别地，双共振吸收显微镜包括用于从基态将样品分子激发到第一电子激发态的波长λ1的泵浦光的光源，波长为λ2的擦除光的光源，将样品分子从第一电子激发态激发到第二电子激发态或更高的激发态，以及用于使泵浦光和擦除光的照射区域部分重叠的重叠部件。通过经由重叠装置照射泵浦光和擦除光，部分地抑制从第一电子激发态将样品分子脱离到基态的发射区域。在擦除光的光路上，提供了具有聚光透镜，准直透镜和针孔之间的空间滤光器，并且通过聚光透镜将擦除光聚焦到针孔上并准直通过的擦除光通过准直透镜通过针孔进入平行光束。

16. 发明授权

US5619382A Reflection type imaging optical system 失效
标题翻译：反射型成像光学系统
公开(公告)号：US5619382A
公开(公告)日：1997-04-08
申请号：US082514
申请日：1993-06-25
申请人： Mikiko Kato , Yoshinori Iketaki
发明人： Mikiko Kato , Yoshinori Iketaki
IPC分类号： G21K1/06 , G02B1/10 , G02B17/00 , G02B17/06 , G02B5/10 , G02B2/00
CPC分类号： G02B5/0808 , G02B17/061 , G02B17/0652 , G02B5/10
摘要： A reflection type imaging optical system is provided with at least one reflecting mirror, whose reflecting surface is constructed of a plurality of zone areas different from each other in spectral reflectance characteristics. Further, in the optical system, the spectral reflectance characteristics of each zone area are selected so that an incident angle providing the maximum reflectance when a ray of light of a predetermined wavelength is incident on each zone area has a value between the maximum and the minimum of the incident angle in the zone area. The reflection type imaging optical system thus provides an important advantage in practical use in that the reflection efficiency of each reflecting surface is enhanced to bring about the brightness necessary for the imaging surface.
摘要翻译：反射型成像光学系统设置有至少一个反射镜，其反射表面由光谱反射特性彼此不同的多个区域区域构成。此外，在光学系统中，选择每个区域的光谱反射率特性，使得当预定波长的光线入射到每个区域区域时提供最大反射率的入射角具有最大和最小值之间的值在区域内的入射角度。因此，反射型成像光学系统在实际应用中提供了重要的优点，因为每个反射表面的反射效率被增强以产生成像表面所需的亮度。

17. 发明授权

US5590168A X-ray microscope 失效
标题翻译： X光显微镜
公开(公告)号：US5590168A
公开(公告)日：1996-12-31
申请号：US466973
申请日：1995-06-06
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G21K7/00
CPC分类号： G21K7/00 , H01J2237/2522
摘要： An X-ray microscope for observing a transmitted X-ray microscopic image of a specimen by irradiating the specimen with X-rays and exciting radiation rays, in which the exciting radiation rays are made incident upon the specimen at a large photon flux in an efficient manner without loss, so that a contrast of the image can be increased. The invention provides a desired relationship between thickness of specimen, wavelength of X-rays and tone resolving power of image fro obtaining a transmitted X-ray microscopic image having an excellent contrast. The invention further proposes optimizations for a photon flux of exciting radiation rays as well am for a timing of irradiation of X-rays and exciting radiation rays. The X-ray microscope can observe particular element contained in particular substance without being affected by the same element contained in other substances which constitute a specimen together with the particular substance by suitably selecting a wavelength of the exciting radiation rays. The invention further propose a secondary electron microscope, in which a specimen is irradiated with X-rays and exciting radiation rays and secondary electrons emitted from the specimen are detected by an electron monochrometer.
摘要翻译：一种X射线显微镜，用于通过用X射线和激发的射线照射样品来观察样品的透射X射线显微镜图像，其中激发的辐射线以高光子通量以高光子通量入射到样品上方式而没有损失，使得可以增加图像的对比度。本发明提供试样的厚度，X射线的波长和图像的色调分辨能力之间的期望的关系，以获得具有优异对比度的透射的X射线显微镜图像。本发明还提出了针对激发辐射线的光子通量的优化以及用于X射线和激发辐射射线的照射的定时。 X射线显微镜可以通过适当地选择激发的射线的波长来观察特定物质中所含的特定元素而不受与构成样品的其它物质中所含的相同元素一起受特定物质的影响。本发明还提出了一种二次电子显微镜，其中用X射线和激发的辐射照射样品，并且通过电子单色仪检测从样品发射的二次电子。

18. 发明授权

US5216699A X-ray microscope 失效
标题翻译： X光显微镜
公开(公告)号：US5216699A
公开(公告)日：1993-06-01
申请号：US945700
申请日：1992-09-16
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G21K7/00
CPC分类号： G21K7/00
摘要： An X-ray microscope has an X-ray filter for transmitting a wavelength between 43.7 and 65 .ANG. and a light source for emitting ultraviolet light of a wavelength of at least 100 nm in an optical path so that a specimen is irradiated with X rays and an image of an object is formed by an X-ray detector, in which the ultraviolet light is reflected from the X-ray filter to irradiate the specimen. Thus, the X-ray microscope allows biological observation to be made with a transmitted microscopic image of high quality and has advantages in design and choice of materials in fabricating its system.
摘要翻译： X射线显微镜具有用于在光路中透射波长在43.7和65之间的波长的X射线滤光器和用于发射波长至少为100nm的紫外光的光源，使得样品被X射线照射，并且通过X射线检测器形成物体的图像，其中紫外光从X射线滤光器反射以照射样本。因此，X射线显微镜允许通过高质量的透射显微图像进行生物学观察，并且在制造其系统中的材料的设计和选择方面具有优点。

19. 发明授权

US5022064A X-ray optical system formed by multilayer reflecting mirrors for reflecting X-rays of different wavelengths 失效
标题翻译：由用于反射不同波长的X射线的多层反射镜形成的X射线光学系统
公开(公告)号：US5022064A
公开(公告)日：1991-06-04
申请号：US474152
申请日：1990-02-02
申请人： Yoshinori Iketaki
发明人： Yoshinori Iketaki
IPC分类号： G02B5/08 , G21K1/06
CPC分类号： B82Y10/00 , G21K1/062 , G21K2201/061
摘要： An optical system for X rays having a multilayer reflecting mirror which has high reflectances for X rays of different wavelengths. One type of multilayer reflecting mirror is such that the mirror surface of the multilayer reflecting mirror is divided into a plurality of regions, and the regions are provided with multilayers which are such that the reflectance of each multilayer is maximum for X rays of a corresponding wavelength. Another type of multilayer reflecting mirror has a substrate and a plurality of multilayer laid on the substrate, wherein the wavelength of X rays to be reflected with a maximum reflectance varies from multilayer to multilayer. The optical system for X rays according to the present invention is a focusing optical system having a plurality of such multilayer reflecting mirrors and can obtain object images by using X rays of a plurality of wavelengths.
摘要翻译：一种用于X射线的光学系统，具有对不同波长的X射线具有高反射率的多层反射镜。一种类型的多层反射镜是这样的：多层反射镜的镜面被分成多个区域，并且这些区域设置有多层膜，使得每层的反射率对于相应波长的X射线是最大的。另一种类型的多层反射镜具有衬底和铺设在衬底上的多层多层，其中以最大反射率反射的X射线的波长从多层到多层不同。根据本发明的用于X射线的光学系统是具有多个这种多层反射镜的聚焦光学系统，并且可以通过使用多个波长的X射线来获得物体图像。

20. 发明授权

US08487271B2 Optical microscope configured to simultaneously irradiate the erase light and the stimulation light 有权
标题翻译：光学显微镜被配置为同时照射擦除光和刺激光
公开(公告)号：US08487271B2
公开(公告)日：2013-07-16
申请号：US12553357
申请日：2009-09-03
申请人： Eiji Yokoi , Yoshinori Iketaki
发明人： Eiji Yokoi , Yoshinori Iketaki
IPC分类号： G01N21/64 , G01N21/65
CPC分类号： G02B21/16 , G01N21/636 , G01N21/6458 , G01N21/65 , G01N2021/1736 , G01N2021/6493
摘要： The present invention provides an optical microscope capable of suppressing unnecessary response light as a background and detecting desired response light in nonlinear optical response process with a good S/N ratio. The optical microscope for collecting, on a sample 8, stimulation light emitted from a stimulation light source 1 and having a single wavelength or a plurality of different wavelengths, and detecting response light emitted from the sample 8 in nonlinear optical response process, comprises: an erase light source 2 for emitting erase light having a wavelength different from that of the stimulation light and inducing an effect of suppressing secondary response light which appears due to irradiation of the stimulation light on the sample 8, wherein the erase light and the stimulation light are simultaneously irradiated on the sample 8 such that the erase light does not suppress response light emitted from a light-collecting area of the stimulation light but suppresses the secondary response light other than the response light emitted from a light-collecting area of the stimulation light.
摘要翻译：本发明提供一种能够抑制不必要的响应光作为背景的光学显微镜，并以良好的S / N比检测非线性光学响应处理中的期望的响应光。用于在样品8上收集从刺激光源1发射并具有单一波长或多个不同波长的刺激光并且在非线性光学响应过程中检测从样品8发射的响应光的光学显微镜包括：擦除光源2，用于发射具有与刺激光的波长不同的波长的擦除光，并且引起抑制由于刺激光照射在样品8上而出现的二次响应光的效果，其中擦除光和刺激光是同时对样品8照射，使得擦除光不抑制从刺激光的聚光区域发出的响应光，而是抑制除了从刺激光的聚光区域发出的响应光之外的二次响应光。

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