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    • 11. 发明授权
    • Semiconductor memory device with memory cells on multiple layers
    • 具有多层存储单元的半导体存储器件
    • US07812390B2
    • 2010-10-12
    • US11777293
    • 2007-07-13
    • Ki-Tae ParkJung-Dal ChoiJae-Sung Sim
    • Ki-Tae ParkJung-Dal ChoiJae-Sung Sim
    • H01L25/065H01L27/115
    • H01L27/11551G11C11/5621G11C16/0483G11C2211/5641H01L27/0688H01L27/105H01L27/11526H01L27/11529
    • A semiconductor memory device includes a first substrate having at least one string including a first select transistor, a second select transistor, and first memory cells connected in series between the first and second select transistors of the first substrate. The semiconductor memory device further includes a second substrate having at least one string including a first select transistor, a second select transistor, and second memory cells connected in series between the first and second select transistors of the second substrate. The number of the first memory cells of the at least one string of the first substrate is different from a number of the second memory cells of the at least one string of the second substrate. For example, the number of second memory cells may be less than the number of first memory cells.
    • 半导体存储器件包括具有包括第一选择晶体管,第二选择晶体管和串联连接在第一衬底的第一和第二选择晶体管之间的第一存储单元的至少一个串的第一衬底。 半导体存储器件还包括具有至少一个串的第二衬底,该至少一个串包括串联连接在第二衬底的第一和第二选择晶体管之间的第一选择晶体管,第二选择晶体管和第二存储单元。 第一衬底的至少一个串的第一存储器单元的数量与第二衬底的至少一个串的第二存储单元的数量不同。 例如,第二存储器单元的数量可以小于第一存储器单元的数量。
    • 14. 发明申请
    • NAND FLASH MEMORY DEVICE HAVING DUMMY MEMORY CELLS AND METHODS OF OPERATING SAME
    • 具有存储单元的NAND闪速存储器件及其操作方法
    • US20090097326A1
    • 2009-04-16
    • US12340250
    • 2008-12-19
    • Ki-Tae ParkJung-Dal ChoiJong-Sun SelYoo-Cheol Shin
    • Ki-Tae ParkJung-Dal ChoiJong-Sun SelYoo-Cheol Shin
    • G11C16/06
    • G11C16/0483G11C16/107G11C16/12G11C16/3445
    • A NAND flash memory device includes a control circuit configured to apply, during a program operation, a first word line voltage to non-selected ones of a plurality of serially-connected memory cells, a second word line voltage greater than the first word line voltage to a selected one of the plurality of memory cells, and a third word line voltage lower than the first word line voltage to a dummy memory cell connected in series with the plurality of memory cells. In other embodiments, a control circuit is configured to program a dummy memory cell before and/or after each erase operation on a plurality of memory cells connected in series therewith. In still other embodiments, a control circuit is configured to forego erasure of a dummy memory cell while erasing a plurality of memory cells connected in series therewith.
    • NAND闪速存储器件包括控制电路,其被配置为在编程操作期间将第一字线电压施加到多个串联存储器单元中的未选择的电压,第二字线电压大于第一字线电压 到多个存储单元中的一个选择的一个,以及比第一字线电压低的第三字线电压到与多个存储单元串联连接的虚拟存储单元。 在其他实施例中,控制电路被配置为在与每个擦除操作之间的每个擦除操作之前和/或之后对与其串联的多个存储器单元进行编程。 在其他实施例中,控制电路被配置为在擦除与其串联连接的多个存储器单元时,放弃擦除伪存储器单元。
    • 19. 发明申请
    • NAND FLASH MEMORY DEVICE HAVING DUMMY MEMORY CELLS AND METHODS OF OPERATING SAME
    • 具有存储单元的NAND闪速存储器件及其操作方法
    • US20110090738A1
    • 2011-04-21
    • US12977419
    • 2010-12-23
    • Ki-Tae ParkJung-Dal ChoiJong-Sun SelYoo-Cheol Shin
    • Ki-Tae ParkJung-Dal ChoiJong-Sun SelYoo-Cheol Shin
    • G11C16/12
    • G11C16/0483G11C16/107G11C16/12G11C16/3445
    • A NAND flash memory device includes a control circuit configured to apply, during a program operation, a first word line voltage to non-selected ones of a plurality of serially-connected memory cells, a second word line voltage greater than the first word line voltage to a selected one of the plurality of memory cells, and a third word line voltage lower than the first word line voltage to a dummy memory cell connected in series with the plurality of memory cells. In other embodiments, a control circuit is configured to program a dummy memory cell before and/or after each erase operation on a plurality of memory cells connected in series therewith. In still other embodiments, a control circuit is configured to forego erasure of a dummy memory cell while erasing a plurality of memory cells connected in series therewith.
    • NAND闪速存储器件包括控制电路,其被配置为在编程操作期间将第一字线电压施加到多个串联存储器单元中的未选择的电压,第二字线电压大于第一字线电压 到多个存储单元中的一个选择的一个,以及比第一字线电压低的第三字线电压到与多个存储单元串联连接的虚拟存储单元。 在其他实施例中,控制电路被配置为在与每个擦除操作之间的每个擦除操作之前和/或之后对与其串联的多个存储器单元进行编程。 在其他实施例中,控制电路被配置为在擦除与其串联连接的多个存储器单元时,放弃擦除伪存储器单元。