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    • 12. 发明授权
    • Semiconductor device having a mode of functional test
    • 具有功能测试模式的半导体器件
    • US07484135B2
    • 2009-01-27
    • US11374076
    • 2006-03-14
    • Katsuaki Matsui
    • Katsuaki Matsui
    • G06K5/04
    • G11C29/02G11C29/025G11C29/50012
    • A semiconductor device includes a circuit block; a first signal path for guiding a test signal to a signal input terminal of the circuit block; a second signal path for guiding a test clock to a clock input terminal of the circuit block; a third signal path for guiding a test output signal from a output terminal of the circuit block to a pad via a dummy latch; and a fourth signal path for guiding the test output signal from the output terminal of the circuit block, to another pad. A dummy latch latches the test output signal at substantially a same speed as an operational latch during a normal operation. The third signal path has a wiring delay time from the output terminal to the dummy latch that is substantially equal to a wiring delay time from the output terminal to the operational latch.
    • 半导体器件包括电路块; 用于将测试信号引导到电路块的信号输入端的第一信号路径; 用于将测试时钟引导到电路块的时钟输入端的第二信号路径; 第三信号路径,用于经由虚拟锁存器将测试输出信号从电路块的输出端引导到焊盘; 以及用于将测试输出信号从电路块的输出端引导到另一个焊盘的第四信号路径。 在正常操作期间,虚拟闩锁以与操作闩锁基本相同的速度锁存测试输出信号。 第三信号路径具有从输出端子到虚拟锁存器的布线延迟时间,其基本上等于从输出端子到操作锁存器的布线延迟时间。
    • 13. 发明授权
    • Nonvolatile semiconductor memory device
    • US07092302B2
    • 2006-08-15
    • US11144767
    • 2005-06-06
    • Katsuaki Matsui
    • Katsuaki Matsui
    • G11C13/00
    • G11C29/82G11C29/84
    • The present invention provides a nonvolatile semiconductor memory device capable of achieving the speeding-up of reading and a reduction in layout area. A control gate electrode of each of memory cell transistors employed in the nonvolatile semiconductor memory device according to the present invention is configured so as to be capable of assuming a first power supply potential (VCC) and a second power supply potential (VPP) higher than the first power supply potential upon its operation. A second NMOS transistor is provided between the gate of a first NMOS transistor that drives a control gate electrode (WL) to the first power supply potential (VCC) and a control signal (/ER) connected to the gate thereof. The source of the second NMOS transistor is inputted with the control signal (/ER) and the drain thereof is connected to the gate of the first NMOS transistor. A PMOS transistor is provided in parallel with the first NMOS transistor. A transfer gate comprising these NMOS and PMOS transistors drives the control gate electrode (WL).
    • 17. 发明授权
    • Non-volatile semiconductor storage device
    • 非易失性半导体存储器件
    • US07808835B2
    • 2010-10-05
    • US12408896
    • 2009-03-23
    • Hirokazu MiyazakiKatsuaki MatsuiTsutomu Higuchi
    • Hirokazu MiyazakiKatsuaki MatsuiTsutomu Higuchi
    • G11C11/34
    • G11C7/067G11C7/08G11C16/0441G11C16/26
    • In a memory cell array which is constituted with flash memory, a pair of a positive memory cell and a negative memory cell, to which data with mutually opposite values are written, is plurally provided. Bit lines and I/O lines connected to the memory cells of a data reading object are charged, and then a potential WL of a word line connected to the data reading object memory cells is raised. Hence, currents flow in the data reading object memory cells in accordance with the data that were written, and consequently one of a potential BL and a potential BLN of the I/O lines begins to fall. When one of the potentials BL and BLN falls below the circuit threshold of a sense amplifier, reading data is established, and the established reading data is outputted as a sense amplifier output signal SAOUT.
    • 在由闪速存储器构成的存储单元阵列中,多个提供了一对具有相互相反值的数据被写入的正存储单元和负存储单元。 连接到数据读取对象的存储单元的位线和I / O线被充电,然后提高连接到数据读取对象存储单元的字线的电位WL。 因此,根据写入的数据,电流在数据读取对象存储单元中流动,因此I / O线的电位BL和电位BLN之一开始下降。 当电位BL和BLN中的一个低于读出放大器的电路阈值时,建立读取数据,并将所建立的读取数据作为读出放大器输出信号SAOUT输出。
    • 18. 发明申请
    • Non-volatile semiconductor storage device
    • 非易失性半导体存储器件
    • US20080025110A1
    • 2008-01-31
    • US11785527
    • 2007-04-18
    • Hirokazu MiyazakiKatsuaki MatsuiTsutomu Higuchi
    • Hirokazu MiyazakiKatsuaki MatsuiTsutomu Higuchi
    • G11C7/06
    • G11C7/067G11C7/08G11C16/0441G11C16/26
    • In a memory cell array which is constituted with flash memory, a pair of a positive memory cell and a negative memory cell, to which data with mutually opposite values are written, is plurally provided. Bit lines and I/O lines connected to the memory cells of a data reading object are charged, and then a potential WL of a word line connected to the data reading object memory cells is raised. Hence, currents flow in the data reading object memory cells in accordance with the data that were written, and consequently one of a potential BL and a potential BLN of the I/O lines begins to fall. When one of the potentials BL and BLN falls below the circuit threshold of a sense amplifier, reading data is established, and the established reading data is outputted as a sense amplifier output signal SAOUT.
    • 在由闪速存储器构成的存储单元阵列中,多个提供了一对具有相互相反值的数据被写入的正存储单元和负存储单元。 连接到数据读取对象的存储单元的位线和I / O线被充电,然后提高连接到数据读取对象存储单元的字线的电位WL。 因此,根据写入的数据,电流在数据读取对象存储单元中流动,因此I / O线的电位BL和电位BLN之一开始下降。 当电位BL和BLN中的一个低于读出放大器的电路阈值时,建立读取数据,并将所建立的读取数据作为读出放大器输出信号SAOUT输出。
    • 19. 发明授权
    • Nonvolatile semiconductor memory device
    • 非易失性半导体存储器件
    • US06977861B1
    • 2005-12-20
    • US10911515
    • 2004-08-05
    • Katsuaki Matsui
    • Katsuaki Matsui
    • G11C8/00G11C29/00
    • G11C29/82G11C29/84
    • The present invention provides a nonvolatile semiconductor memory device capable of achieving the speeding-up of reading and a reduction in layout area. A control gate electrode of each of memory cell transistors employed in the nonvolatile semiconductor memory device according to the present invention is configured so as to be capable of assuming a first power supply potential (VCC) and a second power supply potential (VPP) higher than the first power supply potential upon its operation. A second NMOS transistor is provided between the gate of a first NMOS transistor that drives a control gate electrode (WL) to the first power supply potential (VCC) and a control signal (/ER) connected to the gate thereof. The source of the second NMOS transistor is inputted with the control signal (/ER) and the drain thereof is connected to the gate of the first NMOS transistor. A PMOS transistor is provided in parallel with the first NMOS transistor. A transfer gate comprising these NMOS and PMOS transistors drives the control gate electrode (WL).
    • 本发明提供一种能够实现读取加速和布局面积减小的非易失性半导体存储器件。 在根据本发明的非易失性半导体存储器件中使用的每个存储单元晶体管的控制栅电极被配置为能够使第一电源电位(VCC)和第二电源电位(VPP)高于 其运行时的第一个电源潜力。 第二NMOS晶体管设置在驱动控制栅电极(WL)到第一电源电位(VCC)的第一NMOS晶体管的栅极和连接到其栅极的控制信号(/ ER)之间。 第二NMOS晶体管的源极输入控制信号(/ ER),其漏极连接到第一NMOS晶体管的栅极。 PMOS晶体管与第一NMOS晶体管并联提供。 包括这些NMOS和PMOS晶体管的传输门驱动控制栅电极(WL)。
    • 20. 发明授权
    • Voltage boosting circuit with two main charge pumps
    • 两个主电荷泵的升压电路
    • US06774708B2
    • 2004-08-10
    • US10218078
    • 2002-08-14
    • Katsuaki Matsui
    • Katsuaki Matsui
    • G05F302
    • H02M3/07H02M2003/077
    • A voltage boosting circuit has two charge pumps connected to an output node from which a boosted potential, higher than the power-supply potential, is supplied to a load circuit. One charge pump is activated when the load circuit is activated, regardless of the output node potential. The other charge pump is activated while the load circuit is active, if the potential of the output node falls below a predetermined level. Use of these two charge pumps reduces electrical noise and ensures that the output node is brought to an adequate potential when the load circuit is activated.
    • 升压电路具有连接到输出节点的两个电荷泵,高于电源电位的升压电势被提供给负载电路。 负载电路激活时,无论输出节点电位如何,都会激活一个电荷泵。 如果输出节点的电位低于预定电平,则另一个电荷泵在负载电路有效时被激活。 使用这两个电荷泵可以降低电气噪声,并确保在负载电路被激活时使输出节点达到足够的电位。