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    • 11. 发明申请
    • CONNECTION TESTING APPARATUS AND METHOD AND CHIP USING THE SAME
    • 连接测试装置和使用它的方法和芯片
    • US20090079457A1
    • 2009-03-26
    • US11860754
    • 2007-09-25
    • Ju-Tien ChengYih-Long TsengHon-Yuan LeoCheng-Chi Yen
    • Ju-Tien ChengYih-Long TsengHon-Yuan LeoCheng-Chi Yen
    • G01R31/02
    • G01R31/2853G01R31/31717G01R31/318505G01R31/31905
    • A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.
    • 提供了一种连接测试装置,连接测试方法以及使用它们的芯片。 该方法可用于测试芯片之间的连接,以解决常规多芯片连接测试需要大量测试模式的问题,导致测试时间长,测试成本高,连接条件 测试失败后,故障难以分析。 在本发明中,当芯片中的ESD元件被导通时引起的电压变化,并且使用比较电路来确定连接是否正确。 此外,测试装置内置在芯片中,使得连接测试可以快速有效地完成。 一旦发生连接故障,也可以找到故障连接引脚,从而有利于工程分析,从而有效节省测试成本。
    • 12. 发明授权
    • Reflective type liquid crystal panel and pixel structure thereof
    • 反射型液晶面板及其像素结构
    • US07388624B2
    • 2008-06-17
    • US11164024
    • 2005-11-08
    • Wei-Hsiao ChenHon-Yuan LeoCheng-Chi YenYao-Jen Tsai
    • Wei-Hsiao ChenHon-Yuan LeoCheng-Chi YenYao-Jen Tsai
    • G02F1/1335G02F1/1333
    • G02F1/136213G02F1/133553
    • A reflective type liquid crystal panel including a substrate, an array of transistors, capacitors, metal patterns, conductive walls, reflective pixel electrodes, an opposite substrate, and a liquid crystal layer is provided. The transistors and the capacitors are disposed on the substrate, and the capacitors are surrounding drain terminals of the corresponding transistors respectively. The metal patterns cover the corresponding transistors and overlap the corresponding capacitors respectively, and the metal patterns are electrically connected to the corresponding drain terminals respectively. The conductive walls surround the corresponding transistors and are connected between the corresponding metal patterns and the corresponding capacitors respectively. The reflective pixel electrodes are disposed over the corresponding metal patterns and electrically connected to the corresponding drain terminals respectively. The opposite substrate has a transparent electrode layer thereon, and the liquid crystal layer is disposed between the transparent electrode layer and the reflective pixel electrodes.
    • 提供了包括基板,晶体管阵列,电容器,金属图案,导电壁,反射像素电极,相对基板和液晶层的反射型液晶面板。 晶体管和电容器设置在衬底上,并且电容器分别是相应晶体管的周围的漏极端子。 金属图案分别覆盖对应的晶体管并与相应的电容器重叠,并且金属图案分别电连接到相应的漏极端子。 导电壁围绕对应的晶体管,分别连接在相应的金属图案和相应的电容器之间。 反射像素电极设置在相应的金属图案上并分别电连接到相应的漏极端子。 相对基板上具有透明电极层,液晶层设置在透明电极层和反射像素电极之间。
    • 13. 发明申请
    • LIGHT SOURCE CURRENT SENSING CIRCUIT AND DRIVING CIRCUIT IN A DISPLAY DEVICE
    • 光源电流感应电路和显示器件中的驱动电路
    • US20080084222A1
    • 2008-04-10
    • US11539298
    • 2006-10-06
    • Cheng-Chi Yen
    • Cheng-Chi Yen
    • G01R31/08G01R27/08
    • H05B33/0827G09G3/3283H05B33/0815Y02B20/347
    • A current sensing circuit for sensing a current flowing through a LED bank and a driver circuit for driving the LED bank are provided. The current sensing circuit comprises: a matched transistor group, having a first current path coupled to the load device for sensing the load current and a second current path for generating a first current according to the load current; an operation amplifier, coupled to the first and second current paths; and a current source, having a third current path coupled to the second current path and a fourth current path for generating a second current according to the first current, the second current indicating conductive condition of the load device.
    • 提供了用于感测流过LED组的电流的电流感测电路和用于驱动LED组的驱动电路。 电流感测电路包括:匹配晶体管组,具有耦合到负载装置的第一电流路径,用于感测负载电流;以及第二电流路径,用于根据负载电流产生第一电流; 耦合到所述第一和第二电流路径的运算放大器; 以及电流源,具有耦合到第二电流路径的第三电流路径和用于根据第一电流产生第二电流的第四电流路径,第二电流指示负载装置的导电状态。
    • 16. 发明授权
    • Connection testing apparatus and method and chip using the same
    • 连接测试仪器和方法与芯片采用相同
    • US07683607B2
    • 2010-03-23
    • US11860754
    • 2007-09-25
    • Ju-Tien ChengYih-Long TsengHon-Yuan LeoCheng-Chi Yen
    • Ju-Tien ChengYih-Long TsengHon-Yuan LeoCheng-Chi Yen
    • H01L23/58
    • G01R31/2853G01R31/31717G01R31/318505G01R31/31905
    • A connection testing apparatus, a connection testing method, and a chip using the same are provided. The method can be used for testing connections between chips, so as to solve the problems that a conventional multi-chip connection test needs a plenty of test patterns, resulting in a long test time and a high test cost, and the condition of a connection failure is hard to be analyzed after a test failure. In the present invention, a voltage variation caused when an ESD element in a chip is conducted and a comparison circuits are used to determine whether a connection is correct. Furthermore, the test apparatus is built in the chip, so that the connection test may be accomplished quickly and efficiently. Once a connection failure occurs, the failed connection pin can also be found, so as to be favorable for engineering analysis and thereby effectively saving the test cost.
    • 提供了一种连接测试装置,连接测试方法以及使用它们的芯片。 该方法可用于测试芯片之间的连接,以解决常规多芯片连接测试需要大量测试模式的问题,导致测试时间长,测试成本高,连接条件 测试失败后,故障难以分析。 在本发明中,当芯片中的ESD元件被导通时引起的电压变化,并且使用比较电路来确定连接是否正确。 此外,测试装置内置在芯片中,使得连接测试可以快速有效地完成。 一旦发生连接故障,也可以找到故障连接引脚,从而有利于工程分析,从而有效节省测试成本。
    • 20. 发明授权
    • Light source current sensing circuit and driving circuit in a display device
    • 光源电流检测电路和显示装置中的驱动电路
    • US07385402B2
    • 2008-06-10
    • US11539298
    • 2006-10-06
    • Cheng-Chi Yen
    • Cheng-Chi Yen
    • G01R31/08
    • H05B33/0827G09G3/3283H05B33/0815Y02B20/347
    • A current sensing circuit for sensing a current flowing through a LED bank and a driver circuit for driving the LED bank are provided. The current sensing circuit includes: a matched transistor group, having a first current path coupled to the load device for sensing the load current and a second current path for generating a first current according to the load current; an operation amplifier, coupled to the first and second current paths; and a current source, having a third current path coupled to the second current path and a fourth current path for generating a second current according to the first current, the second current indicating conductive condition of the load device.
    • 提供了用于感测流过LED组的电流的电流感测电路和用于驱动LED组的驱动电路。 电流感测电路包括:匹配晶体管组,具有耦合到负载装置的第一电流路径,用于感测负载电流;以及第二电流路径,用于根据负载电流产生第一电流; 耦合到所述第一和第二电流路径的运算放大器; 以及电流源,具有耦合到第二电流路径的第三电流路径和用于根据第一电流产生第二电流的第四电流路径,第二电流指示负载装置的导电状态。