专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

11. 发明授权

US06493956B1 Gauge for calibrating three-dimensional coordinate measuring machine and method for calibrating three-dimensional coordinate measuring machine using the gauge 失效
标题翻译：用于校准三维坐标测量机的量规和使用量规校准三维坐标测量机的方法
公开(公告)号：US06493956B1
公开(公告)日：2002-12-17
申请号：US09464383
申请日：1999-12-16
申请人： Jiro Matsuda
发明人： Jiro Matsuda
IPC分类号： G01B330
CPC分类号： G01B21/042
摘要： A CMM calibrating gauge includes a block gauge which has a first end face and an opposite second end face and whose length absolute value has been certified, and a sphere fixed to a front surface of the block gauge. A method for calibrating a CMM using the CMM calibrating gauge includes the steps of bringing a probe of the CMM into contact with the first end face of the block gauge to specify planarity of the first end face, bringing the probe into contact with the peripheral surface and the pole point of the sphere to specify coordinates of the center of the sphere relative to the first end face and the diameter of the sphere, bringing the probe into contact with the second end face of the block gauge to measure planarity of the second end face, and bringing the probe into contact with the peripheral surface and the pole point of the sphere to measure coordinates of the center of the sphere relative to the second end face and the diameter of the sphere and revise the specified planarity of the first end face and the specified sphere center coordinates and sphere diameter, thereby specifying three-dimensional dimensions of the CMM calibrating gauge to calibrating the CMM.
摘要翻译： CMM校准表包括具有第一端面和相对的第二端面并且其长度绝对值已经被认证的块规，以及固定到块规的前表面的球。使用CMM校准计量器校准CMM的方法包括以下步骤：使CMM的探针与块计数器的第一端面接触，以指定第一端面的平面度，使探针与周边表面接触和球体的极点，以指定球体相对于第一端面的中心的坐标和球的直径，使探针与块计的第二端面接触，以测量第二端的平面度使探头与球体的外周表面和极点接触，以测量球体的中心相对于第二端面和球体的直径的坐标，并修正第一端面的指定平面度和指定的球体中心坐标和球体直径，从而指定CMM校准仪的三维尺寸以校准CMM。

IPRDB

热门服务

关于我们

友情链接

联系方式