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11. 发明授权

US6156427A Electroconductive resin composition for molding and electromagnetic wave interference shield structure molded from the composition 失效
标题翻译：用于成型的导电树脂组合物和由组合物模制的电磁波干扰屏蔽结构
公开(公告)号：US6156427A
公开(公告)日：2000-12-05
申请号：US769348
申请日：1991-10-02
申请人： Masao Gotoh , Makoto Iida , Kenichi Waragai , Meiichi Ohta , Susumu Iwai
发明人： Masao Gotoh , Makoto Iida , Kenichi Waragai , Meiichi Ohta , Susumu Iwai
IPC分类号： B29B9/14 , H01B1/22 , B32B1/04 , H01B1/06
CPC分类号： H01B1/22 , B29B9/14 , Y10T428/2938 , Y10T428/2956 , Y10T428/2973 , Y10T428/2998
摘要： An electromagnetic wave interference shield structure molded from an electroconductive resin composition for molding, which comprises columnar pellets of a specific length, made of a bundle of iron-based metal fibers as an essential component and at least one bundle of at least another kind of electroconductive fibers of different material in a different diameter than that of the iron-based metal fibers as independent electroconductive fiber-cores, coated with a thermoplastic resin having a specific range of heat distortion temperature continuously in the longitudinal direction has a stable and distinguished shield effect for a prolonged time.
摘要翻译：由用于成型的导电树脂组合物模制的电磁波干扰屏蔽结构，其包括由一束铁基金属纤维作为主要成分制成的特定长度的柱状颗粒和至少一种至少另一种导电与作为独立的导电纤维芯的铁基金属纤维的直径不同的不同材料的纤维在长度方向上连续地涂覆有热变形温度特定范围的热塑性树脂具有稳定和显着的屏蔽效果长时间

12. 发明申请

US20100060889A1 SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD 有权
标题翻译：基板检查装置和基板检查方法
公开(公告)号：US20100060889A1
公开(公告)日：2010-03-11
申请号：US12540825
申请日：2009-08-13
申请人： Susumu Iwai , Noboru Kato
发明人： Susumu Iwai , Noboru Kato
IPC分类号： G01N21/88
CPC分类号： G01N21/896
摘要： A substrate inspection method includes the following steps. Substrates are sequentially moved while an optical system including a light-projecting system and a light-receiving system are moved in a direction orthogonal to the moving direction of each substrate, so as to change the scanned area of each substrate which is scanned with an inspection light having a specific width in the direction orthogonal to the moving direction of the substrate from the light-projecting system; data of the inspected defects of the substrates in the scanned areas are stored for each scanned area; and the stored data of the defects of the substrates in the scanned areas are updated with newly inspected data of the defects of the substrates in the same scanned areas for each substrate, and defect data of one substrate are produced based on the data of the defects of the substrates in a plurality of scanned areas.
摘要翻译：基板检查方法包括以下步骤。基板依次移动，同时包括投光系统和光接收系统的光学系统在与每个基板的移动方向正交的方向上移动，以便通过检查来改变扫描的每个基板的扫描区域光从与投影系统的基板的移动方向正交的方向上具有特定宽度的光; 对于每个扫描区域存储扫描区域中的基板的检查缺陷的数据; 并且利用对每个基板的相同扫描区域中的基板的缺陷的新检查数据更新存储的扫描区域中的基板的缺陷数据，并且基于缺陷的数据产生一个基板的缺陷数据的多个扫描区域中的基板。

13. 发明授权

US07830502B2 Substrate inspection device and substrate inspection method 有权
标题翻译：基板检查装置和基板检查方法
公开(公告)号：US07830502B2
公开(公告)日：2010-11-09
申请号：US12540825
申请日：2009-08-13
申请人： Susumu Iwai , Noboru Kato
发明人： Susumu Iwai , Noboru Kato
IPC分类号： G01N21/88
CPC分类号： G01N21/896
摘要： A substrate inspection method includes the following steps. Substrates are sequentially moved while an optical system including a light-projecting system and a light-receiving system are moved in a direction orthogonal to the moving direction of each substrate, so as to change the scanned area of each substrate which is scanned with an inspection light having a specific width in the direction orthogonal to the moving direction of the substrate from the light-projecting system; data of the inspected defects of the substrates in the scanned areas are stored for each scanned area; and the stored data of the defects of the substrates in the scanned areas are updated with newly inspected data of the defects of the substrates in the same scanned areas for each substrate, and defect data of one substrate are produced based on the data of the defects of the substrates in a plurality of scanned areas.
摘要翻译：基板检查方法包括以下步骤。基板依次移动，同时包括投光系统和光接收系统的光学系统在与每个基板的移动方向正交的方向上移动，以便通过检查来改变扫描的每个基板的扫描区域光从与投影系统的基板的移动方向正交的方向上具有特定宽度的光; 对于每个扫描区域存储扫描区域中的基板的检查缺陷的数据; 并且利用对每个基板的相同扫描区域中的基板的缺陷的新检查数据更新存储的扫描区域中的基板的缺陷数据，并且基于缺陷的数据产生一个基板的缺陷数据的多个扫描区域中的基板。

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