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    • 13. 发明授权
    • System and method of providing a programmable clock architecture for an advanced microcontroller
    • 为高级微控制器提供可编程时钟架构的系统和方法
    • US06614320B1
    • 2003-09-02
    • US10000383
    • 2001-10-24
    • Bert SullamHarold Kutz
    • Bert SullamHarold Kutz
    • H03B2800
    • G06F1/32G06F1/06G06F1/08
    • One embodiment of the present invention is a programmable clock architecture for a microcontroller that provides multiple different clocking signal frequencies that may be utilized by one or more programmable logic blocks of the microcontroller. In this manner, the clocking architecture enables the programmable logic blocks to perform a wider variety of functions because they have access to a wider variety of clock signal frequencies. Specifically, the clocking architecture of the present embodiment includes a plurality of clocking sources. For example, the output clocking signal of one of the clock oscillators is divided down to different smaller frequencies and also multiplied to provide more frequencies that may be utilized by the programmable circuit blocks and processor of the microcontroller. Additionally, the clocking architecture includes a programmable option of utilizing precision clocking signals and/or less precise clocking signals depending on the desired applications of the microcontroller's programmable circuit blocks.
    • 本发明的一个实施例是用于微控制器的可编程时钟架构,其提供可由微控制器的一个或多个可编程逻辑块利用的多个不同的时钟信号频率。 以这种方式,时钟架构使得可编程逻辑块能够执行更多种功能,因为它们可以访问更多种类的时钟信号频率。 具体地,本实施例的时钟体系结构包括多个时钟源。 例如,其中一个时钟振荡器的输出时钟信号被分成不同的较小频率,并且相乘以提供可被微控制器的可编程电路块和处理器利用的更多频率。 此外,时钟架构包括根据微控制器的可编程电路块的期望应用利用精确时钟信号和/或更精确的时钟信号的可编程选项。
    • 17. 发明授权
    • Reconfigurable testing system and method
    • 可重构测试系统和方法
    • US08402313B1
    • 2013-03-19
    • US11986338
    • 2007-11-20
    • Matthew A. PleisBert SullamTodd Lesher
    • Matthew A. PleisBert SullamTodd Lesher
    • G06F11/00
    • G06F11/273
    • One disclosed system and method enables dynamic reconfiguration of an electronic device in association with testing activities in a convenient and efficient manner. In one implementation, the electronic device includes a bus for communicating information, a microprocessor for processing data, a programmable functional component including a plurality of functional blocks programmable to provide a plurality of functions and configurations, and a memory for storing instructions including instructions for causing the programmable functional component to change functions and configurations. The components are programmably configurable to perform a variety of functions. In one example, the memory stores a plurality of configuration images that define the configuration and functionality of the circuit. The information stored in the memory facilitates dynamic reconfiguration of the circuit in accordance with the test harness instructions. Based upon a command from a test computer, the electronic device is automatically reconfigured by the test harness activating different configuration images.
    • 一种公开的系统和方法能够以方便和有效的方式与测试活动相关联地进行电子设备的动态重新配置。 在一个实现中,电子设备包括用于传送信息的总线,用于处理数据的微处理器,包括可编程以提供多个功能和配置的多个功能块的可编程功能组件,以及用于存储包括用于引起 可编程功能组件来改变功能和配置。 这些组件可编程配置以执行各种功能。 在一个示例中,存储器存储定义电路的配置和功能的多个配置图像。 存储在存储器中的信息有助于根据测试线束指令对电路的动态重新配置。 基于来自测试计算机的命令,电子设备由激活不同配置图像的测试线束自动重新配置。