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    • 11. 发明授权
    • Semiconductor wafer and method of fabricating the same
    • 半导体晶片及其制造方法
    • US07675091B2
    • 2010-03-09
    • US11463137
    • 2006-08-08
    • Young-Soo ParkKyoo-Chul ChoShin-Hyeok HanTae-Soo Kang
    • Young-Soo ParkKyoo-Chul ChoShin-Hyeok HanTae-Soo Kang
    • H01L29/80
    • H01L29/045H01L21/76251H01L21/84H01L27/1203H01L29/78687H01L29/78696
    • Disclosed is a semiconductor wafer and method of fabricating the same. The semiconductor wafer is comprised of a semiconductor layer formed on an insulation layer on a base substrate. The semiconductor layer includes a surface region organized in a first crystallographic orientation, and another surface region organized in a second crystallographic orientation. The performance of a semiconductor device with unit elements that use charges, which are activated in high mobility to the crystallographic orientation, as carriers is enhanced. The semiconductor wafer is completed by forming the semiconductor layer with the second crystallographic orientation on the plane of the first crystallographic orientation, growing an epitaxial layer, forming the insulation layer on the epitaxial layer, and then bonding the insulation layer to the base substrate.
    • 公开了半导体晶片及其制造方法。 半导体晶片由在基底基板上的绝缘层上形成的半导体层构成。 半导体层包括以第一晶体取向组织的表面区域和以第二晶体取向组织的另一表面区域。 带有单元元件的半导体器件的性能随着载流子的增强而被使用以高结晶取向的高迁移率激活的电荷。 半导体晶片通过在第一晶体取向的平面上形成具有第二晶体取向的半导体层,生长外延层,在外延层上形成绝缘层,然后将绝缘层接合到基底来完成。