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    • 12. 发明申请
    • Device and method for testing and for diagnosing digital circuits
    • 用于测试和诊断数字电路的装置和方法
    • US20070168814A1
    • 2007-07-19
    • US11364369
    • 2006-03-01
    • Andreas LeiningerMichael Goessel
    • Andreas LeiningerMichael Goessel
    • G01R31/28G06F11/00
    • G01R31/31928G01R31/31922G01R31/31937G11C29/40
    • A test apparatus includes a test input signal generator that generates a test input signal of word width N, and terminals that connect to inputs and outputs of an electrical circuit to be tested. The electrical circuit includes N digital test inputs and M digital test outputs. The terminals for the test inputs are connected to the test input signal and an electrical circuit is driven such that it outputs at its test outputs data with a macro clock cycle T of length L as test response. A compactor includes M inputs that are connected to the terminals for the test outputs of the circuit to be tested. The compactor compacts the test response with a micro clock cycle t of length l and outputs a data word of width m, where the length L is at least twice as large as the length l.
    • 测试装置包括测试输入信号发生器,其产生字宽N的测试输入信号,以及连接到要测试的电路的输入和输出的端子。 电路包括N个数字测试输入和M个数字测试输出。 测试输入的端子连接到测试输入信号,并且驱动电路,使得其测试输出以长度为L的宏时钟周期T作为测试响应输出数据。 压实机包括连接到端子的M个输入端,用于待测电路的测试输出。 压实机用长度为l的微时钟周期t压缩测试响应,并输出宽度为m的数据字,其中长度L至少是长度l的两倍。
    • 15. 发明授权
    • Device and method for testing and for diagnosing digital circuits
    • 用于测试和诊断数字电路的装置和方法
    • US08312332B2
    • 2012-11-13
    • US11364369
    • 2006-03-01
    • Andreas LeiningerMichael Goessel
    • Andreas LeiningerMichael Goessel
    • G01R31/28
    • G01R31/31928G01R31/31922G01R31/31937G11C29/40
    • A test apparatus includes a test input signal generator that generates a test input signal of word width N, and terminals that connect to inputs and outputs of an electrical circuit to be tested. The electrical circuit includes N digital test inputs and M digital test outputs. The terminals for the test inputs are connected to the test input signal and an electrical circuit is driven such that it outputs at its test outputs data with a macro clock cycle T of length L as test response. A compactor includes M inputs that are connected to the terminals for the test outputs of the circuit to be tested. The compactor compacts the test response with a micro clock cycle t of length l and outputs a data word of width m, where the length L is at least twice as large as the length l.
    • 测试装置包括测试输入信号发生器,其产生字宽N的测试输入信号,以及连接到要测试的电路的输入和输出的端子。 电路包括N个数字测试输入和M个数字测试输出。 测试输入的端子连接到测试输入信号,并且驱动电路,使得其测试输出以长度为L的宏时钟周期T作为测试响应输出数据。 压实机包括连接到端子的M个输入端,用于待测电路的测试输出。 压实机用长度为l的微时钟周期t压缩测试响应,并输出宽度为m的数据字,其中长度L至少是长度l的两倍。
    • 16. 发明授权
    • Circuit arrangement and method for error detection and arrangement for monitoring of a digital circuit
    • 用于数字电路监控的错误检测和布置的电路布置和方法
    • US08136009B2
    • 2012-03-13
    • US12188746
    • 2008-08-08
    • Michael GoesselEgor Sogomonyan
    • Michael GoesselEgor Sogomonyan
    • G06F11/00
    • H03M13/00
    • A circuit arrangement is formed as follows. A combinational circuit has n binary inputs E1, . . . , En for inputting n (n≧2) information bits x1, . . . , xn and m binary outputs for outputting m (m≧1) check bits c1, . . . , cm. The combinational circuit is configured for realizing a Boolean function ci=fi(xi1, . . . , xini) for i=1, . . . , m at the i-th output for determining a check bit ci, wherein the set {xi1, . . . , xini} at the ni information bits that determine the check bit ci is a subset of all n information bits {x1, . . . , xn}. The combinational circuit is furthermore configured for realizing a first Boolean function f1(x11, . . . , x1n1) of the form c1=f1(x11, . . . , x1n1)=f11(x11, x12) XOR f12(x13, x14) XOR . . . XOR f1k1(x1(n1−1), x1n1) at a first output for outputting a first check bit c1, wherein n1 is an even number where n1≧2 and 2 k1=n1 and the Boolean functions f11(x11, x12), . . . , f1k1(x1(n1−1), x1n1) are in each case nonlinear Boolean functions of two variables which can be realized by logic gates having two inputs and one output, wherein the logic gates each have a controlling value c11, . . . , c1k1.
    • 电路装置如下形成。 组合电路具有n个二进制输入E1。 。 。 ,En用于输入n(n≥2)个信息位x1。 。 。 ,xn和m个二进制输出,用于输出m(m≥1)个校验位c1,。 。 。 , 厘米。 组合电路被配置为实现i = 1的布尔函数ci = fi(xi1,...,xini)。 。 。 ,m在第i个输出端用于确定校验位ci,其中集合{xi1,..., 。 。 ,xini}在确定校验位ci的ni信息位是所有n个信息位{x1,...的子集。 。 。 ,xn}。 组合电路还被配置为实现形式为c1 = f1(x11,...,x1n1)= f11(x11,x12)XOR f12(x13,x14)的第一布尔函数f1(x11,...,x1n1) )异或。 。 。 用于输出第一校验位c1的第一输出处的XOR f1k1(x1(n1-1),x1n1),其中n1是其中n1≥2和2k1 = n1的偶数,以及布尔函数f11(x11,x12) 。 。 。 在每种情况下,f1k1(x1(n1-1),x1n1))可以由具有两个输入和一个输出的逻辑门实现的两个变量的非线性布尔函数,其中逻辑门各自具有控制值c11。 。 。 ,c1k1。
    • 17. 发明授权
    • Error detection device and method for error detection for a command decoder
    • 用于命令解码器的错误检测装置和错误检测方法
    • US07979783B2
    • 2011-07-12
    • US11672652
    • 2007-02-08
    • Michael GoesselFranz KlugSteffen Marc Sonnekalb
    • Michael GoesselFranz KlugSteffen Marc Sonnekalb
    • G06F11/00G08C25/00H03M13/00H04L1/00
    • G06F11/10
    • An error detection device for a command decoder is described, the command decoder reading out an associated sequence of control signal words from a command memory based on an input word, wherein the sequence of control signal words has at least one control signal word, having: a controller designed to provide the input word at a first time and the input word at a second time for reading out the command memory, wherein the second time is delayed with respect to the first time, to effect a readout of the sequence of control signal words at a first time and a readout of the sequence of control signal words at a second time; and a comparator designed to receive and compare the associated sequences of control signal words read out at the first and second times, and to output a signal indicating an error if the associated sequences of control signal words read out at the first and second times are different.
    • 描述了一种用于命令解码器的错误检测装置,命令解码器基于输入字从命令存储器中读出相关序列的控制信号字,其中控制信号字序列具有至少一个控制信号字,具有: 控制器,其被设计为在第一时间提供输入字,并且输入字在第二时间用于读出指令存储器,其中第二时间相对于第一次被延迟,以实现控制信号序列的读出 第一时间的字和读出控制信号字的序列; 以及比较器,用于接收和比较在第一次和第二次读出的控制信号字的相关序列,并且如果在第一次和第二次读出的相关序列的控制信号字不同,则输出指示错误的信号 。
    • 18. 发明申请
    • Circuit Arrangement and Method for Error Detection and Arrangement for Monitoring of a Digital Circuit
    • 电路布置及数字电路监控误差检测与布置方法
    • US20090049369A1
    • 2009-02-19
    • US12188746
    • 2008-08-08
    • Michael GoesselEgor Sogomonyan
    • Michael GoesselEgor Sogomonyan
    • H03M13/09G06F11/10
    • H03M13/00
    • A circuit arrangement is formed as follows. A combinational circuit has n binary inputs E1, . . . , En for inputting n (n≧2) information bits x1, . . . , xn and m binary outputs for outputting m (m≧1) check bits c1, . . . , cm. The combinational circuit is configured for realizing a Boolean function ci=fi(xi1, . . . , xini) for i=1, . . . , m at the i-th output for determining a check bit ci, wherein the set {xi1, . . . , xini} at the ni information bits that determine the check bit ci is a subset of all n information bits {x1, . . . , xn}. The combinational circuit is furthermore configured for realizing a first Boolean function f1(x11, . . . , x1n1) of the form c1=f1(x11, . . . , x1n1)=f11(x11, x12) XOR f12(x13, x14) XOR . . . XOR f1k1(x1(n1−1), x1n1) at a first output for outputting a first check bit c1, wherein n1 is an even number where n1≧2 and 2 k1=n1 and the Boolean functions f11(x11, x12), . . . , f1k1(x1(n1−1), x1n1) are in each case nonlinear Boolean functions of two variables which can be realized by logic gates having two inputs and one output, wherein the logic gates each have a controlling value c11, . . . , c1k1.
    • 电路装置如下形成。 组合电路具有n个二进制输入E1。 。 。 ,En用于输入n(n> = 2)个信息位x1。 。 。 ,xn和m个二进制输出,用于输出m(m> = 1)校验位c1,。 。 。 , 厘米。 组合电路被配置为实现i = 1的布尔函数ci = fi(xi1,...,xini)。 。 。 ,m在第i个输出端用于确定校验位ci,其中集合{xi1,..., 。 。 ,xini}在确定校验位ci的ni信息位是所有n个信息位{x1,...的子集。 。 。 ,xn}。 组合电路还被配置为实现形式为c1 = f1(x11,...,x1n1)= f11(x11,x12)XOR f12(x13,x14)的第一布尔函数f1(x11,...,x1n1) )异或。 。 。 用于输出第一校验位c1的第一输出处的XOR f1k1(x1(n1-1),x1n1),其中n1是其中n1> = 2和2k1 = n1的偶数,并且布尔函数f11(x11,x12) ,。 。 。 在每种情况下,f1k1(x1(n1-1),x1n1))可以由具有两个输入和一个输出的逻辑门实现的两个变量的非线性布尔函数,其中逻辑门各自具有控制值c11。 。 。 ,c1k1。