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    • 12. 发明专利
    • DE59700227D1
    • 1999-07-29
    • DE59700227
    • 1997-07-17
    • ENDRESS HAUSER GMBH CO
    • GERST PETERBANHOLZER KARLHEINZFLOEGEL KARLJUNG PETER
    • G01L13/06G01L9/12G01L19/00G01L19/04
    • The sensor (1) consists of a liquid filled measurement cell with membranes (3a, 3b) each subject to a static pressure (Ps) plus an additional pressure (P1, P2). The capacitances of measurement capacitors (C1, C2) change with changes in pressure. A temperature measurement circuit (7) converts the output of a temperature sensor (6) to a signal corresponding to the differential pressure sensor temperature. A measurement circuit (8) retunes the inverse values (1/C1, 1/C2) and a computer (9) determines the sum ( ) of the inverse capacitances and from their difference ( DELTA ) a differential pressure value ( DELTA Pm) providing an output signal which corresponds to the difference (P1-P2). The sum of the inverse capacitances (1/C1, 1/C2) relates to an internal temperature (Ti) which is equal to a temperature off-set (T0) when neither membrane is subjected to a static pressure, and no differences exists between the first and second pressures and a first correction value ( DELTA K) is determined from the relationship: DELTA K = Ti-Ts-T0 where the correction value at a temperature (Tr) is a measure of the static pressure (Ps). The differential pressure is then determined from the differential pressure value ( DELTA Pm) by applying the correction value ( DELTA K) to allow for the static pressure.
    • 15. 发明专利
    • DE59306341D1
    • 1997-06-05
    • DE59306341
    • 1993-12-08
    • ENDRESS HAUSER GMBH CO
    • OTTO JOHANNGEORGBURGER STEFANGERST PETER
    • G01F23/28G01F23/284G01F25/00G01S13/88
    • A level measuring device using microwaves comprises an antenna for sending transmitted waves toward the surface of a material whose level is to be measured, and for the reception of echo waves resulting from reflection at the surface, and a receiving and evaluating circuit which derives from the echo waves received by the antenna an echo function representative of the echo amplitudes as a function of the distance and determines from the echo function the transit time of the microwaves from the antenna to the surface of the material and therefrom the distance of the surface of the material from the antenna. In order to detect the formation of deposits of the material on the antenna or further trouble conditions, such as damage to the antenna or the loss thereof, the level measuring device comprises an arrangement which compares a section of the echo function originating from a reference reflection point in the antenna or in the vicinity of the antenna with a predetermined threshold value and produces a signal indicating the existence of a state above or below the said threshold value. The reference reflection point may be constituted by a part of the antenna or a separate reference reflector mounted in the antenna or in the vicinity thereof.
    • 16. 发明专利
    • DE4241910A1
    • 1994-06-16
    • DE4241910
    • 1992-12-11
    • ENDRESS HAUSER GMBH CO
    • JOHANNGEORG OTTO DRGERST PETERBURGER STEFAN
    • G01F23/28G01F23/284G01F25/00G01S13/88G01S7/40G01S7/03
    • A level measuring device using microwaves comprises an antenna for sending transmitted waves toward the surface of a material whose level is to be measured, and for the reception of echo waves resulting from reflection at the surface, and a receiving and evaluating circuit which derives from the echo waves received by the antenna an echo function representative of the echo amplitudes as a function of the distance and determines from the echo function the transit time of the microwaves from the antenna to the surface of the material and therefrom the distance of the surface of the material from the antenna. In order to detect the formation of deposits of the material on the antenna or further trouble conditions, such as damage to the antenna or the loss thereof, the level measuring device comprises an arrangement which compares a section of the echo function originating from a reference reflection point in the antenna or in the vicinity of the antenna with a predetermined threshold value and produces a signal indicating the existence of a state above or below the said threshold value. The reference reflection point may be constituted by a part of the antenna or a separate reference reflector mounted in the antenna or in the vicinity thereof.
    • 20. 发明专利
    • DE4241910C2
    • 1996-08-01
    • DE4241910
    • 1992-12-11
    • ENDRESS HAUSER GMBH CO
    • JOHANNGEORG OTTO DRGERST PETERBURGER STEFAN
    • G01F23/28G01F23/284G01F25/00G01S13/88G01S7/40G01S7/03
    • A level measuring device using microwaves comprises an antenna for sending transmitted waves toward the surface of a material whose level is to be measured, and for the reception of echo waves resulting from reflection at the surface, and a receiving and evaluating circuit which derives from the echo waves received by the antenna an echo function representative of the echo amplitudes as a function of the distance and determines from the echo function the transit time of the microwaves from the antenna to the surface of the material and therefrom the distance of the surface of the material from the antenna. In order to detect the formation of deposits of the material on the antenna or further trouble conditions, such as damage to the antenna or the loss thereof, the level measuring device comprises an arrangement which compares a section of the echo function originating from a reference reflection point in the antenna or in the vicinity of the antenna with a predetermined threshold value and produces a signal indicating the existence of a state above or below the said threshold value. The reference reflection point may be constituted by a part of the antenna or a separate reference reflector mounted in the antenna or in the vicinity thereof.