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    • 11. 发明授权
    • Wafer backside protection apparatus
    • 晶片背面保护装置
    • US06220771B1
    • 2001-04-24
    • US09461349
    • 1999-12-15
    • Fu-Ching TungHong-Ming ChenWu-Lang LinChia-Ming ChenJen-Rong HuangPeter L. MahnekeJanathan Wang
    • Fu-Ching TungHong-Ming ChenWu-Lang LinChia-Ming ChenJen-Rong HuangPeter L. MahnekeJanathan Wang
    • G03D500
    • H01L21/6708G03F7/707G03F7/70916H01L21/67028
    • A wafer backside protection apparatus includes a motor, a vacuum chuck, an annular seat and a top cover. The motor has an output shaft upon which the chuck is mounted. The chuck has a front surface to suck and hold a wafer from its backside. The chuck has a backside in which a water guard ring and a plurality of slant bores are formed. The slant bores run from the water guard ring through the wafer front surface. The annular seat is located below the chuck and has two symmetrical slant nozzles projecting toward motor rotating direction for ejecting protection liquid to the water guard ring. Protection liquid may be spun and splashed out through the slant bores to form a protection liquid film between the chuck and the wafer backside due to centrifugal force resulting from chuck and wafer rotation driven by the motor. The protection liquid film may protect wafer backside from chemical erosion and contamination resulting from wafer production process.
    • 晶片背面保护装置包括电动机,真空吸盘,环形座和顶盖。 马达具有输出轴,卡盘安装在该输出轴上。 卡盘具有从其背面吸取并保持晶片的前表面。 卡盘具有背面,其中形成有防水环和多个倾斜孔。 倾斜的孔从防水环穿过晶片正面。 环形座位于卡盘下方,并具有朝向马达旋转方向突出的两个对称倾斜喷嘴,用于将防护液喷射到防水环上。 保护液体可以通过倾斜孔旋转溅出,由卡盘和由马达驱动的晶片旋转产生的离心力在卡盘和晶片背面之间形成保护液膜。 保护液膜可以保护晶片背面免受晶片生产过程中的化学侵蚀和污染。
    • 12. 发明授权
    • Door for wafer container having rotatable cammed member and movable links
    • 具有旋转凸轮部件和活动连接件的晶片容器的门
    • US06622883B1
    • 2003-09-23
    • US09644653
    • 2000-08-24
    • Tzong-Ming WuJen-Rong HuangMuh-Wang Liang
    • Tzong-Ming WuJen-Rong HuangMuh-Wang Liang
    • B65D4528
    • H01L21/67373Y10T292/0837Y10T292/0839
    • A Modified door for wafer container, includes a rotatable cammed member, two first links coupled to the rotatable cammed member and vertically aligned and moved in and out of respective first latch holes on the wafer transport module upon rotary motion of the rotatable cammed member, and two second links respectively coupled to the first links and horizontally moved in and out of respective second latch holes on the wafer transport module upon movement of the first links. The links each have a slope adapted to be moved with the respective link over a respective bearing means of the door body to force the door body inwards against the wafer transport module, keeping the wafer transport module well sealed.
    • 一种用于晶片容器的修改门,包括可旋转的凸轮构件,两个第一连杆,其联接到可旋转的凸轮构件,并且在可旋转的凸轮构件的旋转运动时垂直对准并移入和移出晶片传送模块上的相应的第一闩锁孔;以及 两个第二链节分别耦合到第一链节并且在第一链节移动时水平地移入和移出晶片传送模块上的相应的第二闩锁孔。 连接件各自具有适于与相应的连杆一起移动到相应的门体的相应轴承装置上的斜面,以将门体向内抵靠晶片传送模块,从而保持晶片传送模块的良好密封。
    • 13. 发明授权
    • Deposition nozzle and apparatus for thin film deposition process
    • 沉积喷嘴和薄膜沉积工艺的设备
    • US08944347B2
    • 2015-02-03
    • US13495889
    • 2012-06-13
    • Jen-Rong Huang
    • Jen-Rong Huang
    • B05B1/28C23C16/455C23C16/458C23C16/48
    • C23C16/45551C23C16/45574C23C16/4584C23C16/482
    • A deposition nozzle and a deposition apparatus include a nozzle body, a precursor passageway formed at a central region of the nozzle body for a precursor gas to be sprayed on the substrate such that the precursor gas reacts with a surface of the substrate, an extraction passageway formed in the nozzle body and located at a peripheral side of the precursor passageway, and extracting residues after the precursor gas reacts with the surface of the substrate, and an air curtain passageway formed in the nozzle body and located at a peripheral side of the extraction passageway for isolating gas to be sprayed on the substrate so as to form a closed gas flow field enclosing a process reaction region between a substrate carrier and the deposition nozzle such that the residues after the precursor gas reacts with the surface of the substrate do not leak.
    • 沉积喷嘴和沉积设备包括喷嘴体,前体通道,形成在喷嘴体的中心区域,用于待喷涂在基板上的前体气体,使得前体气体与基板的表面反应,提取通道 形成在喷嘴体中并且位于前体通路的周边,并且在前体气体与基板的表面反应之后提取残留物,以及形成在喷嘴体中并位于提取物的外围侧的气幕通道 用于将待喷雾的气体隔离在基板上,以形成封闭的气体流场,其包围基板载体和沉积喷嘴之间的工艺反应区域,使得前体气体与基板表面反应的残留物不会泄漏 。
    • 16. 发明授权
    • Method for liquid phase deposition
    • 液相沉积方法
    • US06653245B2
    • 2003-11-25
    • US09874108
    • 2001-06-06
    • Muh-Wang LiangPang-Min ChiangChen MaxJen-Rong HuangChing-Fa Yeh
    • Muh-Wang LiangPang-Min ChiangChen MaxJen-Rong HuangChing-Fa Yeh
    • H01L2131
    • H01L21/67086H01L21/316Y10T137/4643Y10T137/4891Y10T137/5386Y10T137/5474Y10T137/8593Y10T307/779
    • A method for liquid phase deposition, including the steps of providing at least two raw materials from at least two supply devices of a saturation reaction system into a mixture trough and stirring until saturation occurs, filtering out unnecessary solid-state particles, and providing saturated and filtered liquid into an over-saturation reaction trough of a steady-flow over-saturation loop reaction system and stopping the saturated and filtered liquid when the over-saturation reaction trough is filled and the saturated and filtered liquid over-flows into a liquid level control trough to a pre-determined level. The method also includes the steps of providing a substrate in the over-saturation reaction trough, providing reactants from at least two supply devices into the over-saturation reaction trough, and depositing a thin film onto the substrate when the saturated liquid becomes over-saturated.
    • 一种用于液相沉积的方法,包括以下步骤:将饱和反应体系的至少两个供应装置的至少两种原料提供到混合物槽中,并搅拌直到饱和发生,过滤不需要的固态颗粒,并提供饱和和 过滤液体进入稳流过饱和环路反应系统的过饱和反应槽,当过饱和反应槽填满时停止饱和和过滤的液体,饱和和过滤的液体过量流入液位控制 低谷达到预定水平。 该方法还包括以下步骤:在过饱和反应槽中提供衬底,将反应物从至少两个供应装置提供到过饱和反应槽中,并且当饱和液体变得过度饱和时,将薄膜沉积到衬底上 。