专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

11. 发明专利

JP2005127811A Light irradiation device 有权
标题翻译：光照射装置
公开(公告)号：JP2005127811A
公开(公告)日：2005-05-19
申请号：JP2003362532
申请日：2003-10-22
申请人： Ccs Inc , シーシーエス株式会社
发明人： YONEDA KENJI , MASUMURA SHIGEKI , SUGITA TAKASHI
IPC分类号： G01N21/84 , F21V8/00 , F21Y101/02 , G02B6/00 , G02B21/06
CPC分类号： G02B6/32 , G02B6/4248 , G02B6/4298
摘要： PROBLEM TO BE SOLVED: To provide a light irradiation device compactible without decline of efficiency or the light quantity, and capable of very suitable light irradiation especially to a small-size work. SOLUTION: This device for irradiating the work W with light in a prescribed mode in order to detect a defect, a mark or the like on the work W is equipped with a fiber holding part 3 for holding output ends 21 of a plurality of optical fibers 2 in the aligned state, a reflecting face 4a provided on a position facing to the output ends 21 of the optical fibers 2, for reflecting light emitted from each output end 21, and a light diffusion face 5a for receiving and diffusing light reflected by the reflecting face 4a, and irradiating the work W therewith. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：提供光照射装置，而不会降低效率或光量，并且能够特别适合于小尺寸工件的光照射。解决方案：为了检测工件W上的缺陷，标记等，以规定的模式照射工件W的该装置配备有用于保持多个的输出端21的光纤保持部3 在对准状态下的光纤2的反射面4a，设置在面对光纤2的输出端21的位置的反射面4a，用于反射从每个输出端21发射的光，以及用于接收和漫射光的光漫射面5a 由反射面4a反射，并用其照射工件W. 版权所有（C）2005，JPO＆NCIPI

12. 发明专利

JP2005091049A Light irradiator for image processing and light irradiation method for image processing 审中-公开
标题翻译：用于图像处理的光照射器和用于图像处理的光照射方法
公开(公告)号：JP2005091049A
公开(公告)日：2005-04-07
申请号：JP2003322267
申请日：2003-09-12
申请人： Ccs Inc , シーシーエス株式会社
发明人： YONEDA KENJI , MASUMURA SHIGEKI , FUKUI SATOSHI , KASHIWABARA HIDEAKI
IPC分类号： G01N21/84 , G03B15/00 , G03B15/02 , H04N5/228
摘要： PROBLEM TO BE SOLVED: To provide a light irradiator for image processing, as it were, to be called as an intelligent light irradiator, structured so as to provide an image optimum for image processing by dynamically and automatically producing an illumination environment.
SOLUTION: This light irradiator A4 for image processing irradiates light L1 to a prescribed area in such a manner that at least one of light irradiation conditions can be changed which are irradiation direction, irradiation solid angle, irradiation intensity, irradiation range, and spectrum distribution while detecting the state of light irradiation in whole or in part of the prescribed area. While referring to the state of light irradiation, at least any one of the irradiation conditions is adjusted prior to image processing by an image processor each time the prescribed area is changed, thereby setting light irradiation conditions corresponding to the purpose of image processing.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：为了提供用作图像处理的光照射器，被称为智能光照射器，被构造成通过动态地且自动地产生照明环境来提供图像处理最佳的图像。解决方案：用于图像处理的这种光照射器A4将光L1照射到规定区域，使得可以改变照射方向，照射立体角，照射强度，照射范围和照射范围的至少一个光照射条件在检测整个或部分规定区域的光照射状态的同时进行光谱分布。在参照光照射状态的情况下，在每次规定的区域变化时，由图像处理器进行图像处理之前调整照射条件中的至少一个，从而设定与图像处理的目的对应的光照射条件。版权所有（C）2005，JPO＆NCIPI

13. 发明专利

JP2004212402A Light irradiation device 审中-公开
公开(公告)号：JP2004212402A
公开(公告)日：2004-07-29
申请号：JP2004045115
申请日：2004-02-20
申请人： Ccs Inc , シーシーエス株式会社
发明人： YONEDA KENJI , KONISHI ATSUSHI , MASUMURA SHIGEKI
IPC分类号： G01N21/84 , G01N21/956 , G02B6/32
摘要： PROBLEM TO BE SOLVED: To provide a light irradiation device which can vary the focal distance with a simple structure and is suitably used, for example, for spot illumination. SOLUTION: The light irradiation device X6 irradiating an irradiation target part with a light supplied from a light source device via an optical fiber bundle X7. The device is provided with an optical fiber bundle head element X6d for holding a tip end of the optical fiber bundle X7 and a ball lens head element X6c for holding a ball lens X9. The device is configured in such a manner that these head elements X6d, X6c are fitted to each other and the fitting depth is varied so that the distance between the tip end of the optical fiber bundle X7 and the ball lens X9 can be varied. As a result, the light irradiation device can deal with the demand for a small portion, such as a semiconductor chip or a soldering portion of the semiconductor chip to a print board, where closer inspection is needed. COPYRIGHT: (C)2004,JPO&NCIPI

14. 发明专利

JP2010256087A Inspection system 有权
标题翻译：检查系统
公开(公告)号：JP2010256087A
公开(公告)日：2010-11-11
申请号：JP2009104290
申请日：2009-04-22
申请人： Ccs Inc , シーシーエス株式会社
发明人： MASUMURA SHIGEKI
IPC分类号： G01N21/89
摘要： PROBLEM TO BE SOLVED: To provide an inspection system performing high-accuracy imaging, by evenly applying a light to the entire surface of a workpiece.
SOLUTION: The inspection system includes an imager, including an area sensor with imaging elements planarly laid therein; a light-emitting unit for applying light to a domain imaged by the imager; a camera moving mechanism supporting the imager so as to allow the imager to reciprocate in a horizontal direction orthogonal to the flowing direction of inspecting objects; an illuminator-moving mechanism supporting the light-emitting unit so as to allow the light emitter to reciprocate in a horizontal direction orthogonal to the flowing direction of the inspecting objects; a movement controller for controlling the camera-moving mechanism and the illuminator-moving mechanism so to allow the imager and the light-emitting unit to move in synchronization with each other; and an imaging controller for controlling the imager and the light-emitting unit so that the imaging timing of the imager is synchronized with the light emission timing of the light-emitting unit.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：通过对工件的整个表面均匀地施加光，提供执行高精度成像的检查系统。解决方案：检查系统包括成像器，其包括具有平面放置在其中的成像元件的区域传感器; 用于将光照射到由成像器成像的域的发光单元; 照相机移动机构，其支撑所述成像器，以允许所述成像器在与检查对象的流动方向正交的水平方向上往复运动; 照明器移动机构，其支撑所述发光单元，以允许所述光发射器在与所述检查对象的流动方向正交的水平方向上往复运动; 移动控制器，用于控制相机移动机构和照明器移动机构，以使得成像器和发光单元彼此同步地移动; 以及成像控制器，用于控制成像器和发光单元，使得成像器的成像定时与发光单元的发光定时同步。版权所有（C）2011，JPO＆INPIT

15. 发明专利

JP2008157765A Weather measuring device 有权
标题翻译：天气测量装置
公开(公告)号：JP2008157765A
公开(公告)日：2008-07-10
申请号：JP2006347194
申请日：2006-12-25
申请人： Ccs Inc , Yokogawa Denshikiki Co Ltd , シーシーエス株式会社 , 横河電子機器株式会社
发明人： YONEDA KENJI , MASUMURA SHIGEKI , ASAMIYA MASANORI
IPC分类号： G01W1/14 , G01W1/00
CPC分类号： Y02A90/14
摘要： PROBLEM TO BE SOLVED: To provide a weather measuring device having a simple configuration, capable of not only performing accurate measurement relative to rainfall but also collecting correlatively various information on the weather of rain such as the size of rain droplets or dropping speed of the rain droplets, and measuring the weather such as snow or fog.
SOLUTION: This device is equipped with a light source 6; a collimating lens 7 for collimating light emitted from the light source 6 into parallel light L2 proceeding to a prescribed direction C; a condensing lens 8 arranged separately from the collimating lens 7 at a fixed distance in the prescribed direction C; and an image sensor 4 for receiving light from the condensing lens 8, and outputting image data of rain droplets, snow particles, fog particles or the like in the air passing between the lenses.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：提供一种具有简单结构的气象测量装置，其能够不仅相对于降雨进行精确的测量，而且相关地收集关于雨天的各种信息，例如雨滴的大小或降落速度的雨滴，并测量天气如雪或雾。
解决方案：本设备配有光源6; 准直透镜7，用于将从光源6发射的光准直到平行光L2进入规定的方向C; 与准直透镜7分开设置在规定方向C上固定距离的聚光透镜8; 以及用于接收来自聚光透镜8的光的图像传感器4，并且在透镜之间的空气中输出雨滴，雪粒子，雾粒等的图像数据。版权所有（C）2008，JPO＆INPIT

16. 发明专利

JP2007234342A Light irradiation apparatus 有权
标题翻译：光照射装置
公开(公告)号：JP2007234342A
公开(公告)日：2007-09-13
申请号：JP2006053317
申请日：2006-02-28
申请人： Ccs Inc , シーシーエス株式会社
发明人： MASUMURA SHIGEKI , YONEDA KENJI
IPC分类号： F21S2/00 , F21V13/00 , F21W131/40 , F21Y101/02
摘要： PROBLEM TO BE SOLVED: To provide a light irradiation apparatus capable of reducing a region without having a light emitting part when an observation hole is viewed from an observation object region without causing complication and expansion of a structure, and of appropriately executing shadowless illumination or the like.
SOLUTION: This light irradiation apparatus is provided with: the observation hole arranged between an external observation point and the observation object region and on an observation axis line connecting them; a first light emitting part arranged around the observation hole for irradiating the observation object region with light; a half mirror arranged obliquely with respect to the observation axis line between the observation hole and the external observation point; a second light emitting part arranged at a position where the light emitted therefrom is reflected by the half mirror and emitted to the observation object region through the observation hole; and an optical path wall inside surface covering an optical path from the second light emitting part to the half mirror and an optical path from the half mirror to the observation hole; and is structured such that a part or the whole of the optical path wall inside surface is a mirror surface.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种能够在观察对象区域观察观察孔而不会发光的情况下能够减少区域的光照射装置，而不会引起结构的复杂化和扩大，并且适当地执行无阴影照明等。解决方案：该照射装置设置有：观察孔，其布置在外部观察点和观察对象区域之间以及连接它们的观察轴线上; 布置在观察孔周围的用于用光照射观察对象区域的第一发光部; 相对于观察孔与外部观察点之间的观察轴线倾斜配置的半反射镜; 第二发光部，配置在从其发出的光被半反射镜反射的位置，并通过观察孔向观察对象区域射出; 以及覆盖从第二发光部到半反射镜的光路的光路壁内表面和从半反射镜到观察孔的光路; 并且被构造成使得光路壁内表面的一部分或全部是镜面。版权所有（C）2007，JPO＆INPIT

17. 发明专利

JP2003202294A LIGHTING SYSTEM FOR INSPECTION 审中-公开
公开(公告)号：JP2003202294A
公开(公告)日：2003-07-18
申请号：JP2001352453
申请日：2001-11-16
申请人： CCS INC
发明人： MASUMURA SHIGEKI , YONEDA KENJI , SUGITA TAKASHI
IPC分类号： G01B11/30 , G01N21/84 , H05K3/34
摘要： PROBLEM TO BE SOLVED: To provide a lighting system for surface inspection capable of uniformly lighting every part without generating a dark part. SOLUTION: A plurality of lighting parts 3 respectively provided with a focusing means 16 at a light irradiation side of a linear light source 14 wherein a number of illuminants are linearly arranged, respectively irradiate the approximately same part of an inspection object, and the illuminants VL1, VR1 of the plurality of lighting parts 3 are arranged in a such manner that the positions of the inspection object irradiated by each of illuminants VL1 of the lighting part 3 and the positions of the inspection object irradiated by each of illuminants VR1 are different from each other in the longitudinal direction of a linear group of illuminants. COPYRIGHT: (C)2003,JPO

18. 发明专利

JP2003057008A Matter recognition apparatus 有权
标题翻译：事故识别装置
公开(公告)号：JP2003057008A
公开(公告)日：2003-02-26
申请号：JP2001244937
申请日：2001-08-10
申请人： Ccs Inc , シーシーエス株式会社
发明人： MASUMURA SHIGEKI , YONEDA KENJI
IPC分类号： G01B11/00 , H05K13/04
摘要： PROBLEM TO BE SOLVED: To provide a matter recognition apparatus capable of recognizing two matters accurately and rapidly while making it possible to avoid the size- increase of the apparatus. SOLUTION: A common image pickup means 7 is provided between first and second matters 1 and 2 so as to pick up the images of both matters. A first illumination means 5 for illuminating the first matter 1 and a second illumination means 6 for illuminating the second matter 2 are provided, and an obstruction means 8 for obstructing the irradiation of the first matter 1 with light of at least a certain wavelength range in the light reflected from the second matter 2 is provided, or a quantity-of-light regulation means 8X for making the ratio of quantity of light attenuated up to the image pickup means 4 from two matters almost same is provided. Alternatively, both of the obstruction means 8 and the quantity-of-light regulation means 8X are provided.
摘要翻译：要解决的问题：提供能够准确，快速地识别两个事项的物品识别装置，同时能够避免装置的尺寸增大。解决方案：在第一和第二物品1和2之间提供公共图像拾取装置7，以便拾取两件事情的图像。设置用于照射第一物质1的第一照明装置5和用于照射第二物质2的第二照明装置6，以及用于阻挡第一物质1与至少一定波长范围的光照射的障碍装置8 或者提供从第二物质2反射的光，或者设置使光衰减到图像拾取装置4的光的比率几乎相同的光量调节装置8X。或者，设置障碍装置8和光量调节装置8X。

19. 发明专利

JP2013164406A Inspection method and inspection device 有权
标题翻译：检验方法和检验装置
公开(公告)号：JP2013164406A
公开(公告)日：2013-08-22
申请号：JP2012028984
申请日：2012-02-13
申请人： Ccs Inc , シーシーエス株式会社 , Bosch Corp , ボッシュ株式会社
发明人： MASUMURA SHIGEKI , HARA HIDEYUKI
IPC分类号： G01N21/88 , F02M61/18
摘要： PROBLEM TO BE SOLVED: To provide an inspection method and inspection device capable of inspecting a bottom part of a deep hole formed in a fuel injection device at a high speed and with high accuracy by machine vision or the like.SOLUTION: The inspection method includes an image formation position setting step for setting the positions of a surface light source 1 and a lens 2 to an injection nozzle W such that an image formation surface IM on which the surface light source 1 is subjected to image formation is in the vicinity of a bottom part W2 of the deep hole W1, and an irradiation solid angle inclination adjustment step for setting the position of a first diaphragm 31 to the lens 2 such that a central axis of an irradiation solid angle regulated by inspection light made incident on an outer edge part of the image formation surface IM is parallel with an optical axis or that the central axis is deviated from the optical axis and inclined only by a prescribed amount.
摘要翻译：要解决的问题：提供一种检查方法和检查装置，其能够通过机器视觉等以高速高精度地检查形成在燃料喷射装置中的深孔的底部。检查方法包括图像形成位置设定步骤，用于将表面光源1和透镜2的位置设置到喷嘴W，使得其上进行图像形成的表面光源1的图像形成面IM处于深孔W1的底部W2和照射立体角度倾斜调整步骤，用于将第一隔膜31的位置设定在透镜2上，使得被检查光调节的照射立体角的中心轴入射到外缘图像形成表面IM的一部分与光轴平行或中心轴偏离光轴并且仅倾斜规定量。

20. 发明专利

JP2012225690A Light irradiation device 有权
标题翻译：光照射装置
公开(公告)号：JP2012225690A
公开(公告)日：2012-11-15
申请号：JP2011091463
申请日：2011-04-15
申请人： Ccs Inc , シーシーエス株式会社
发明人： MASUMURA SHIGEKI , OSAWA TAKASHI
IPC分类号： G01N21/84
摘要： PROBLEM TO BE SOLVED: To provide a light irradiation device capable of effectively suppressing unevenness of brightness on a workpiece surface and suitably performing non-shadow lighting or the like even with a simple configuration.SOLUTION: A light irradiation device comprises: an observation hole which is provided between a workpiece of a product or the like, which is a light irradiation object, and an external observation point, on an observation axis connecting them; a first light source section provided around the observation hole, for irradiating the workpiece with light; a half-mirror provided obliquely with respect to the observation axis on a position facing the observation hole on the external observation point side; a second light source section provided at a position where light emitted therefrom is reflected by the half-mirror and irradiated to the workpiece through the observation hole; and a transparent member engaged into the observation hole.
摘要翻译：要解决的问题：提供一种能够有效地抑制工件表面上的亮度不均匀性并且即使以简单的结构适当地执行非阴影照明等的光照射装置。解决方案：光照射装置包括：在连接它们的观察轴上，设置在作为光照射对象的产品等的工件和外部观察点之间的观察孔; 设置在观察孔周围的用于用光照射工件的第一光源部; 在与外观察点侧的观察孔相对的位置上相对于观察轴倾斜地设置的半反射镜; 第二光源部，其设置在由所述半反射镜反射并且通过所述观察孔照射到所述工件的位置处，以及接合到观察孔中的透明构件。版权所有（C）2013，JPO＆INPIT

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式