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    • 20. 发明授权
    • TAP and linking module for scan access of multiple cores with IEEE 1149.1 test access ports
    • TAP和连接模块,用于具有IEEE 1149.1测试访问端口的多个核心的扫描访问
    • US06324662B1
    • 2001-11-27
    • US09277504
    • 1999-03-26
    • Baher S. HarounLee D. Whetsel
    • Baher S. HarounLee D. Whetsel
    • G01R3128
    • G01R31/318536G01R31/318555G01R31/318563
    • An architecture for testing a plurality of circuits on an integrated circuit is described. The architecture includes a TAP Linking Module located between test pins on the integrated circuit and 1149.1 Test Access Ports (TAP) of the plurality of circuits to be tested. The TAP Linking Module operates in response to 1149.1 scan operations from a tester connected to the test pins to selectively switch between 1149.1 TAPs to enable test access between the tester and plurality of circuits. The TAP Linking Module's 1149.1 TAP switching operation is based upon augmenting 1149.1 instruction patterns to affix an additional bit or bits of information which is used by the TAP Linking Module for performing the TAP switching operation.
    • 描述了用于在集成电路上测试多个电路的架构。 该架构包括位于集成电路的测试引脚之间的TAP链接模块和待测试的多个电路的1149.1测试访问端口(TAP)。 TAP链接模块响应来自连接到测试引脚的测试仪的1149.1扫描操作,以选择性地在1149.1 TAP之间切换,以使测试仪和多个电路之间能够进行测试。 TAP链接模块的1149.1 TAP切换操作基于增加1149.1指令模式,以附加TAP链接模块用于执行TAP切换操作的附加位或位信息。