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    • 14. 发明授权
    • Devices for detecting current leakage between deep trench capacitors in DRAM devices
    • 用于检测DRAM器件中深沟槽电容器之间的电流泄漏的装置
    • US07348596B2
    • 2008-03-25
    • US10979609
    • 2004-11-02
    • Yu-Chang Lin
    • Yu-Chang Lin
    • H01L27/108
    • H01L27/0207G11C11/401G11C29/006G11C29/50G11C2029/5006H01L22/34H01L27/10861
    • A test device for detecting current leakage between deep trench capacitors in DRAM devices. The test device is disposed in a scribe line region of a wafer. In the test device, a first trench capacitor pair has a first deep trench capacitor and a second deep trench capacitor connected in parallel. A first transistor has a first terminal electrically coupled to the first deep trench capacitor and a control terminal electrically coupled to a first word line. A second transistor has a first terminal electrically coupled to the second deep trench capacitor and a control terminal electrically coupled to a second word line. First and second bit lines are electrically coupled to the first and second transistors respectively. The first and second bit lines are separated and the first and second word lines are perpendicular to the bit line regions.
    • 一种用于检测DRAM器件中深沟槽电容器之间的电流泄漏的测试装置。 测试装置设置在晶片的划线区域中。 在测试装置中,第一沟槽电容器对具有并联连接的第一深沟槽电容器和第二深沟槽电容器。 第一晶体管具有电耦合到第一深沟槽电容器的第一端子和电耦合到第一字线的控制端子。 第二晶体管具有电耦合到第二深沟槽电容器的第一端子和电耦合到第二字线的控制端子。 第一和第二位线分别电耦合到第一和第二晶体管。 第一和第二位线被分离,第一和第二字线垂直于位线区域。
    • 15. 发明授权
    • Flash memory disk
    • 闪存盘
    • US07307849B2
    • 2007-12-11
    • US11438429
    • 2006-05-23
    • Lin-Ray HoYu-Chang Lin
    • Lin-Ray HoYu-Chang Lin
    • H05K7/12
    • H01R13/4538H05K5/0278
    • The frame of a flash memory disk has an opening, a resilient support and a pair of switches. The pair of switches is extended from the frame and is constricted at their connection portions. Two recesses are formed at inner surfaces of the pair of switches. A PCB includes a flash memory and a USB connector thereon. A carrier has a pair of resilient wing latches and a resilient end latch. The carrier accommodates the PCB and exposes the USB connector. The carrier slides within the frame to extend or to retract the USB connector through the opening. A spring is secured between the carrier and the frame. An upper housing is assembled upon the frame, wherein the upper housing includes a button contacting the resilient support. A lower housing is assembled to the frame.
    • 闪存盘的框架具有开口,弹性支撑件和一对开关。 该对开关从框架延伸并在其连接部分处收缩。 在一对开关的内表面形成两个凹槽。 PCB上包括闪存和USB连接器。 载体具有一对弹性翼闩和弹性端闩。 载体容纳PCB并暴露USB连接器。 载体在框架内滑动以延伸或缩回USB连接器通过开口。 弹簧固定在载体和框架之间。 上壳体组装在框架上,其中上壳体包括接触弹性支撑件的按钮。 下壳体组装到框架上。
    • 17. 发明申请
    • Double-layer fireproof curtain apparatus
    • 双层防火幕设备
    • US20060150533A1
    • 2006-07-13
    • US11250549
    • 2005-10-17
    • Yu-Chang LinEng-Nan Chuang
    • Yu-Chang LinEng-Nan Chuang
    • E04H6/00
    • E06B9/40A62C2/10E06B9/68
    • A double-layer fireproof curtain apparatus includes a storing mechanism consisted of a frame and a first and a second activating units installed on both sides of the frame; two fireproof curtains installed separately on the first and second activating units, so that an air gap is formed when the two fireproof curtains are descended; at least one sensing unit electrically connected with the first and second activating units; and at least one control unit electrically connected with the first and second activating units. With the foregoing structure, the air gap can be used to achieve the effect of insulating heat, blocking fire, and resisting smoke in a fire accident, and comply with the regulation of fire control equipments.
    • 一种双层防火帘装置,包括由框架和安装在框架两侧的第一和第二启动单元组成的存放机构; 两个防火帘分别安装在第一和第二启动单元上,使得当两个防火帘下降时形成气隙; 至少一个感测单元,与所述第一和第二激活单元电连接; 以及与第一和第二激活单元电连接的至少一个控制单元。 利用上述结构,可以利用气隙实现火灾事故中隔热,阻火,防烟的效果,符合消防设备的规定。
    • 18. 发明申请
    • TEST KEY FOR MONITORING GATE CONDUCTOR TO DEEP TRENCH MISALIGNMENT
    • 用于监控门控导体深度偏差的测试键
    • US20050269567A1
    • 2005-12-08
    • US10904652
    • 2004-11-21
    • Yu-Chang Lin
    • Yu-Chang Lin
    • H01L21/66H01L23/544
    • H01L22/34Y10S257/905Y10S257/908
    • A test key for monitoring GC-DT misalignment is provided. Deep trench capacitors are embedded in an interlacing matrix manner. GC lines are defined on a substrate and passing over the deep trench capacitors. A first bit line contact pattern surrounded by first assistant bit line contact patterns is disposed on the right side of a first deep trench capacitor. A second bit line contact pattern surrounded by second assistant bit line contact patterns is disposed on the left side of a second deep trench capacitor. The test key has a mirror symmetric line. The first assistant bit line contact patterns and second assistant bit line contact patterns are symmetric with respect to the mirror symmetric line. An active area connects the first bit line contact pattern and the second bit line contact pattern. A signal-in bit line is connected to the first bit line contact and a signal-out bit line is connected to the second bit line contact. The rest rows of the bit lines are dummy bit lines and floating.
    • 提供了一个用于监测GC-DT不对准的测试键。 深沟槽电容器以隔行矩阵的方式嵌入。 GC线定义在衬底上并穿过深沟槽电容器。 由第一辅助位线接触图案包围的第一位线接触图案设置在第一深沟槽电容器的右侧。 由第二辅助位线接触图案包围的第二位线接触图案设置在第二深沟槽电容器的左侧。 测试键具有镜像对称线。 第一辅助位线接触图案和第二辅助位线接触图案相对于镜像对称线对称。 有源区域连接第一位线接触图案和第二位线接触图案。 信号输入位线连接到第一位线触点,并且信号输出位线连接到第二位线触点。 位线的其余行是虚拟位线和浮动。