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    • 11. 发明申请
    • Method And Apparatus To Improve The Performance Of A Leached Cutter
    • 提高沥青切割机性能的方法和装置
    • US20130213720A1
    • 2013-08-22
    • US13482285
    • 2012-05-29
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • E21B10/46B08B3/12B08B3/04
    • C22C26/00B22F2003/244B22F2005/001E21B10/46E21B10/567
    • A cleaned component having a polycrystalline structure, a method and apparatus for cleaning a leached component to form the cleaned component, and a method for determining the effectiveness of cleaning the leached component. The cleaned component includes a leached layer that has at least a portion of by-product materials removed. The by-product materials were deposited into the leached layer during a leaching process that formed the leached layer. The apparatus and method for cleaning includes a tank, a cleaning fluid placed within the tank, and at least a portion of the leached layer immersed into the cleaning fluid. Optionally, a transducer emits ultrasonic waves into the leached layer. The method for determining the effectiveness of cleaning includes cleaning the leached component to form the cleaned component, measuring one or more capacitance values of the cleaned component, repeating the cleaning and the measuring until achieving a stable lower limit capacitance value.
    • 具有多晶结构的清洁部件,用于清洁浸出部件以形成清洁部件的方法和装置,以及用于确定清洗部件的有效性的方法。 清洁的部件包括具有除去的副产物材料的至少一部分的浸出层。 在形成浸出层的浸出过程中,副产物材料沉积到浸出层中。 用于清洁的装置和方法包括罐,置于罐内的清洗液,以及浸入清洗液中的浸出层的至少一部分。 可选地,换能器将超声波发射到浸出层中。 用于确定清洁效果的方法包括清洗浸出的部件以形成清洁的部件,测量清洁部件的一个或多个电容值,重复清洁和测量直到达到稳定的下限电容值。
    • 12. 发明授权
    • Use of capacitance to analyze polycrystalline diamond
    • 使用电容分析多晶金刚石
    • US09423370B2
    • 2016-08-23
    • US13401188
    • 2012-02-21
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • G01N27/22G01N33/40
    • G01N27/22G01N33/40
    • A method, system, and apparatus for non-destructively characterizing one or more regions within an ultra-hard polycrystalline structure using capacitance measurements. The apparatus includes a capacitance measuring device having a positive and negative terminal, a leached component comprising a polycrystalline structure, a first wire, and a second wire. The leached component includes a first surface and an opposing second surface. The first wire electrically couples the positive terminal to one of the surfaces of the leached component and the second wire electrically couples the negative terminal to the other surface of the leached component. The capacitance is measured one or more times and compared to a calibration curve to determine an estimated leaching depth within the polycrystalline structure. A data scattering range is ascertained to determine a relative porosity of the polycrystalline structure or the leaching quality within the polycrystalline structure.
    • 一种用于使用电容测量来非特异性地表征超硬多晶结构内的一个或多个区域的方法,系统和装置。 该装置包括具有正和负端子的电容测量装置,包括多晶结构的浸出部件,第一线和第二线。 浸出的组分包括第一表面和相对的第二表面。 第一线将正端子电耦合到浸出部件的一个表面,并且第二线将负极端子电耦合到浸出部件的另一表面。 测量电容一次或多次,并与校准曲线进行比较,以确定多晶结构内的估计浸出深度。 确定数据散射范围以确定多晶结构的相对孔隙率或多晶结构内的浸出质量。
    • 14. 发明授权
    • Method to improve the leaching process
    • 改善浸出过程的方法
    • US09128031B2
    • 2015-09-08
    • US13428635
    • 2012-03-23
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • B24D3/00B24D3/02B24D11/00B24D18/00C09K3/14C09C1/68G01N27/22E21B10/00B22F3/24C22C26/00B22F7/06E21B10/56
    • G01N27/221B22F3/24B22F7/06B22F2003/244C22C26/00E21B10/00E21B10/56
    • A method to leach a component that includes a polycrystalline structure. The method includes obtaining the component having the polycrystalline structure. The polycrystalline structure includes catalyst material deposited therein. The method also includes performing a leaching process on the polycrystalline structure to an intermediate leaching depth. The leaching process removes at least a portion of the catalyst material from the polycrystalline structure and forms one or more by-product materials deposited therein. The method also includes performing a cleaning process on the polycrystalline structure, which removes at least a portion of the by-product materials. The leaching process and the cleaning process are iteratively continued until the intermediate leaching depth reaches a desired leaching depth, both of which are measured from one end of the polycrystalline structure. The desired leaching depth is greater than at least one intermediate leaching depth.
    • 一种浸出包括多晶结构的组分的方法。 所述方法包括获得具有多晶结构的部件。 多晶结构包括沉积在其中的催化剂材料。 该方法还包括对多晶结构进行中间浸出深度的浸出过程。 浸出过程将催化剂材料的至少一部分从多晶结构中去除并形成沉积在其中的一种或多种副产物材料。 该方法还包括对多晶结构进行清洁处理,其去除至少一部分副产物材料。 迭代过程和清洗过程直到中间浸出深度达到所需的浸出深度,两者都是从多晶结构的一端测量的。 所需的浸出深度大于至少一个中间浸出深度。
    • 15. 发明授权
    • Anti-balling coating on drill bits and downhole tools
    • 钻头和井下工具上的防球涂层
    • US09085703B2
    • 2015-07-21
    • US13652148
    • 2012-10-15
    • William W. KingVamsee Chintamaneni
    • William W. KingVamsee Chintamaneni
    • C09D7/12E21B41/00E21B10/00E21B10/46
    • C09D7/40C08K3/14C08K2003/0887C09D7/61C09D175/04E21B10/00E21B10/46E21B41/00
    • A coating that includes a polyisocyanate compound and at least one metal inclusion selected from the group consisting of tungsten and tungsten carbide. The metal inclusions range between about five percent by weight to about fifty percent by weight. A downhole tool that includes a body, a shank positioned at one end of the body, at least one cutter coupled to the body, and a coating coupled to at least a portion of one or more of the body or the shank. The coating includes a polyisocyanate compound and at least one metal inclusion selected from the group consisting of tungsten, tungsten carbide, and aluminum. The metal inclusions range between about five percent by weight to about fifty percent by weight. An intermediate coating is optionally disposed between at least a portion of the coating and at least one of the body or the shank.
    • 包括多异氰酸酯化合物和选自钨和碳化钨中的至少一种金属夹杂物的涂层。 金属夹杂物的重量在约5%至约50%之间。 一种井下工具,其包括主体,位于所述主体的一端的柄,连接到所述主体的至少一个切割器,以及耦合到所述主体或所述柄中的一个或多个的至少一部分的涂层。 涂层包括多异氰酸酯化合物和选自钨,碳化钨和铝的至少一种金属夹杂物。 金属夹杂物的重量在约5%至约50%之间。 中间涂层任选地设置在涂层的至少一部分与主体或柄之中的至少一个之间。
    • 16. 发明申请
    • Leached Cutter And Method For Improving The Leaching Process
    • 浸出式切割机及改进浸出工艺的方法
    • US20130248258A1
    • 2013-09-26
    • US13482322
    • 2012-05-29
    • Federico BellinVamsee Chintamaneni
    • Federico BellinVamsee Chintamaneni
    • B44C1/22E21B10/567
    • G01N27/221B22F3/24B22F7/06B22F2003/244C22C26/00E21B10/00E21B10/56
    • A method to leach a component that includes a polycrystalline structure. The method includes obtaining the component having the polycrystalline structure. The polycrystalline structure includes catalyst material deposited therein. The method also includes performing a leaching process on the polycrystalline structure to an intermediate leaching depth. The leaching process removes at least a portion of the catalyst material from the polycrystalline structure and forms one or more by-product materials deposited therein. The method also includes performing a cleaning process on the polycrystalline structure, which removes at least a portion of the by-product materials. The leaching process and the cleaning process are iteratively continued until the intermediate leaching depth reaches a desired leaching depth, both of which are measured from one end of the polycrystalline structure. The desired leaching depth is greater than at least one intermediate leaching depth.
    • 一种浸出包括多晶结构的组分的方法。 该方法包括获得具有多晶结构的部件。 多晶结构包括沉积在其中的催化剂材料。 该方法还包括对多晶结构进行中间浸出深度的浸出过程。 浸出过程将催化剂材料的至少一部分从多晶结构中去除并形成沉积在其中的一种或多种副产物材料。 该方法还包括对多晶结构进行清洁处理,其去除至少一部分副产物材料。 迭代过程和清洗过程直到中间浸出深度达到所需的浸出深度,两者都是从多晶结构的一端测量的。 所需的浸出深度大于至少一个中间浸出深度。
    • 17. 发明申请
    • Use of Capacitance And Eddy Currents to Analyze Polycrystalline Diamond
    • 使用电容和涡流分析多晶金刚石
    • US20130214769A1
    • 2013-08-22
    • US13401335
    • 2012-02-21
    • William W. KingFederico BellinVamsee Chintamaneni
    • William W. KingFederico BellinVamsee Chintamaneni
    • G01R33/12
    • G01N27/22G01N33/40
    • A method for non-destructively characterizing one or more regions within a polycrystalline structure using capacitance and eddy current measurements. The eddy current measurements include at least one of an impedance amplitude and a phase shift angle. The capacitance is measured one or more times and compared to a first calibration curve to determine an estimated leaching depth within the polycrystalline structure. A first data scattering range is ascertained from the capacitance measurements to determine a relative porosity or the leaching quality within the polycrystalline structure. The eddy current is measured one or more times and compared to a second calibration curve to determine an estimated leaching depth within the polycrystalline structure. A second data scattering range is ascertained from the eddy current measurements to determine a relative porosity or the leaching quality within the polycrystalline structure. Results from both measurements are used to ascertain a quality of the polycrystalline structure.
    • 一种使用电容和涡流测量在多晶结构内非破坏性地表征一个或多个区域的方法。 涡电流测量包括阻抗幅度和相移角中的至少一个。 测量电容一次或多次,并与第一校准曲线进行比较,以确定多晶结构内的估计浸出深度。 从电容测量确定第一数据散射范围以确定多晶结构内的相对孔隙率或浸出质量。 测量涡流一次或多次,并与第二校准曲线进行比较,以确定多晶结构内的估计浸出深度。 从涡流测量确定第二数据散射范围以确定多晶结构内的相对孔隙率或浸出质量。 使用两个测量结果来确定多晶结构的质量。