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    • 12. 发明授权
    • Thin film piezoelectric resonator and method for manufacturing the same
    • 薄膜压电谐振器及其制造方法
    • US07965017B2
    • 2011-06-21
    • US12438794
    • 2007-08-24
    • Kazuki IwashitaKeigo NagaoShinji Fukuda
    • Kazuki IwashitaKeigo NagaoShinji Fukuda
    • H01L41/09
    • H03H9/173H03H3/02H03H9/02086H03H9/02149H03H9/132H03H9/174H03H2003/021
    • A thin film piezoelectric resonator suppresses deterioration of impedance at antiresonant frequency and has a high Q value. The thin film piezoelectric resonator is provided with a semiconductor substrate (8); an insulating layer (6) formed on the semiconductor substrate (8) in contact with the surface of the semiconductor substrate; and a piezoelectric resonator stack (14) formed above the insulating layer and having a lower electrode (10), a piezoelectric layer (2) and an upper electrode (12) in this order from the insulating layer side. An oscillation space (4) is formed corresponding to an oscillation region where the lower electrode (10) and the upper electrode (12) of the piezoelectric resonator stack (14) overlap each other in the thickness direction. The fixed charge density in the insulating layer (6) is 1×1011 cm−2 or less. At the time of manufacturing the thin film piezoelectric resonator, the insulating layer is formed in contact with the semiconductor substrate and then, heat treatment at 300° C. or higher is performed under non-oxygenated atmosphere.
    • 薄膜压电谐振器抑制反谐振频率下的阻抗恶化并具有高Q值。 薄膜压电谐振器设置有半导体衬底(8); 形成在与半导体衬底的表面接触的半导体衬底上的绝缘层; 以及在绝缘层的上方形成有绝缘层侧依次具有下电极(10),压电层(2)和上电极(12)的压电谐振器叠层(14)。 对应于压电谐振器叠层(14)的下电极(10)和上电极(12)在厚度方向上彼此重叠的振荡区域形成振荡空间(4)。 绝缘层(6)中的固定电荷密度为1×1011cm -2以下。 在制造薄膜压电谐振器时,绝缘层形成为与半导体衬底接触,然后在非氧化气氛下进行300℃以上的热处理。
    • 13. 发明申请
    • THIN FILM PIEZOELECTRIC RESONATOR AND METHOD FOR MANUFACTURING THE SAME
    • 薄膜压电谐振器及其制造方法
    • US20090322186A1
    • 2009-12-31
    • US12438794
    • 2007-08-24
    • Kazuki IwashitaKeigo NagaoShinji Fukuda
    • Kazuki IwashitaKeigo NagaoShinji Fukuda
    • H01L41/053
    • H03H9/173H03H3/02H03H9/02086H03H9/02149H03H9/132H03H9/174H03H2003/021
    • A thin film piezoelectric resonator suppresses deterioration of impedance at antiresonant frequency and has a high Q value. The thin film piezoelectric resonator is provided with a semiconductor substrate (8); an insulating layer (6) formed on the semiconductor substrate (8) in contact with the surface of the semiconductor substrate; and a piezoelectric resonator stack (14) formed above the insulating layer and having a lower electrode (10), a piezoelectric layer (2) and an upper electrode (12) in this order from the insulating layer side. An oscillation space (4) is formed corresponding to an oscillation region where the lower electrode (10) and the upper electrode (12) of the piezoelectric resonator stack (14) overlap each other in the thickness direction. The fixed charge density in the insulating layer (6) is 1×1011 cm−2 or less. At the time of manufacturing the thin film piezoelectric resonator, the insulating layer is formed in contact with the semiconductor substrate and then, heat treatment at 300° C. or higher is performed under non-oxygenated atmosphere.
    • 薄膜压电谐振器抑制反谐振频率下的阻抗恶化并具有高Q值。 薄膜压电谐振器设置有半导体衬底(8); 形成在与半导体衬底的表面接触的半导体衬底上的绝缘层; 以及在绝缘层的上方形成有绝缘层侧依次具有下电极(10),压电层(2)和上电极(12)的压电谐振器叠层(14)。 对应于压电谐振器叠层(14)的下电极(10)和上电极(12)在厚度方向上彼此重叠的振荡区域形成振荡空间(4)。 绝缘层(6)中的固定电荷密度为1×10 11 cm -2以下。 在制造薄膜压电谐振器时,绝缘层形成为与半导体衬底接触,然后在非氧化气氛下进行300℃以上的热处理。
    • 14. 发明申请
    • Method of manufacturing piezoelectric thin film device and piezoelectric thin film device
    • 制造压电薄膜器件和压电薄膜器件的方法
    • US20060033595A1
    • 2006-02-16
    • US10538137
    • 2004-12-17
    • Keigo NagaoTetsuro KunisawaTetsuo Yamada
    • Keigo NagaoTetsuro KunisawaTetsuo Yamada
    • H03H9/54
    • H03H3/04H01L41/316H03H9/173H03H9/174
    • Method of producing a piezoelectric thin film device comprises a step of forming an insulating layer (12) capable of being etched by a specific chemical substance on the upper surface of a substrate (11); a step of forming a sacrificial layer (13) made of a substance having a higher etching rate by the specific chemical substance than the insulating layer on a partial region of the insulating layer; a step of forming a lower electrode (15) on a region including the sacrificial layer; a step of forming the piezoelectric thin film (16) on a region including a part of the lower electrode; a step of forming an upper electrode (17) on a region including a part of the piezoelectric thin film; a step of forming via hole (18), which penetrates the piezoelectric thin film and lower electrode, so as to expose a part of the sacrificial layer; and a step of forming a space (20) for oscillation by etching both the sacrificial layer and the insulating layer with the same specific chemical substance by introducing the specific chemical substance through the via hole.
    • 制造压电薄膜器件的方法包括在衬底(11)的上表面上形成能够被特定化学物质蚀刻的绝缘层(12)的步骤; 在所述绝缘层的部分区域上形成由具有比所述绝缘层更高的蚀刻速率的物质制成的牺牲层(13)的步骤; 在包括所述牺牲层的区域上形成下电极(15)的步骤; 在包括下电极的一部分的区域上形成压电薄膜(16)的步骤; 在包括压电薄膜的一部分的区域上形成上电极(17)的步骤; 形成穿过压电薄膜和下电极的通孔(18)的步骤,以暴露牺牲层的一部分; 以及通过使特定的化学物质通过通孔,通过用相同的特定化学物质蚀刻牺牲层和绝缘层来形成用于振荡的空间(20)的步骤。
    • 19. 发明授权
    • Filter using film bulk acoustic resonator and transmission/reception switch
    • 使用薄膜体声波谐振器和发射/接收开关进行滤波
    • US06885260B2
    • 2005-04-26
    • US10476218
    • 2002-05-10
    • Kosuke NishimuraKeigo NagaoChisen HashimotoEiji MasuiHirofumi Kimura
    • Kosuke NishimuraKeigo NagaoChisen HashimotoEiji MasuiHirofumi Kimura
    • H03H7/19H03H9/05H03H9/58H04B1/52H03H9/70H03H9/56
    • H03H9/706H03H7/19H03H9/0571H04B1/52
    • A transmission band filter (110) having a series of elements (111, 113, 115) each composed of a film bulk acoustic resonator and grounded shunt elements (112, 114) each composed of a film bulk acoustic resonator is connected between a transmission port (102) and an antenna port (106). A reception band filter (130) having a series of elements (131, 133, 135) each composed of a film bulk acoustic resonator and grounded shunt elements (132, 134, 136) each composed of a film bulk acoustic resonator is connected between a reception port (104) and the antenna port (106). A film bulk acoustic resonator (150) for adjustment is connected between the antenna port (106) and the ground. The resonance frequency of the adjusting film bulk acoustic resonator (150) lies between the upper limit frequency of the transmission frequency pass band of the transmission band filter (110) and the lower limit frequency of the reception frequency pass band of the reception band filter (130). Therefore a duplexer such that it can be a monolithic element, the power handling capability is good, the size is small, and the cost is low is provided.
    • 具有由薄膜体声波谐振器构成的一系列元件(111,113,115)的传输带滤波器(110)和由薄膜体声共振器构成的接地分流元件(112,114)连接在传输端口 (102)和天线端口(106)。 具有由薄膜体声波谐振器和由薄膜体声波谐振器组成的接地分路元件(132,134,136)构成的一系列元件(131,133,135)的接收带滤波器(130)连接在 接收端口(104)和天线端口(106)。 用于调整的薄膜体声共振器(150)连接在天线端口(106)和地面之间。 调整膜体声波谐振器(150)的共振频率位于传输带滤波器(110)的发送频率通带的上限频率与接收频带滤波器的接收频率通带的下限频率之间 130)。 因此,双工器可以是单片元件,功率处理能力好,尺寸小,成本低廉。