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    • 18. 发明授权
    • Preparation of metal imino/amino complexes for metal oxide and metal nitride thin films
    • 金属氧化物和金属氮化物薄膜的金属亚氨基/氨基络合物的制备
    • US06552209B1
    • 2003-04-22
    • US10179818
    • 2002-06-24
    • Xinjian LeiJohn Anthony Thomas Norman
    • Xinjian LeiJohn Anthony Thomas Norman
    • C07F900
    • C07F9/005
    • This invention relates to an improved process to produce metal imino/amino complexes having the formula R1N=M(NR2R3)3 where M is a pentavalent metal or (R1N=)2M′(NR2R3)2 where M′ is a hexavalent metal. In the process MX5 and two-equivalents of primary amine R1NH2 or metal hexahalide, M′X6 with seven-equivalents of primary amine H2NR1 are reacted in the presence of excess pyridine. The resulting reaction product R1N═MX3(py)2 or [(R1N)2M′X2(py)]2 then is followed by the addition of LiNR2R3. The process provides the final product in high yield and in high purity as well as representing a simplified procedure for synthesizing R1N═M(NR2 R3)3 or (R1N═)2M′(NR2R3)2type complexes.
    • 本发明涉及制备具有式R 1 N = M(NR 2 R 3)3的金属亚氨基/氨基络合物的改进方法,其中M是五价金属或(R1N =)2M'(NR2R3)2,其中M'是六价金属。 在该方法中,MX5和2当量的伯胺R 1 NH 2或金属六氢化物,具有7当量伯胺H 2 N R 1的M'X 6在过量的吡啶的存在下反应。 得到的反应产物R1N = MX3(py)2或[(R1N)2M'X2(py)] 2然后加入LiNR2R3。 该方法以高产率和高纯度提供最终产物,以及代表合成R1N = M(NR2 R3)3或(R1N =)2M'(NR2R3)2型络合物的简化程序。
    • 19. 发明授权
    • Process for metal metalloid oxides and nitrides with compositional gradients
    • 具有组成梯度的金属准金属氧化物和氮化物的工艺
    • US06537613B1
    • 2003-03-25
    • US09546867
    • 2000-04-10
    • Yoshihide SenzakiArthur Kenneth HochbergJohn Anthony Thomas Norman
    • Yoshihide SenzakiArthur Kenneth HochbergJohn Anthony Thomas Norman
    • C23C1606
    • C23C16/52C23C16/029
    • A process for deposition of a multiple metal and metalloid compound layer with a compositional gradient of the metal and metalloid in the layer on a substrate of an electronic material, comprising: a) providing two or more metal-ligand and metalloid-ligand complex precursors, wherein the ligands are preferably the same; b) delivering the precursors to a deposition zone where the substrate is located; c) contacting the substrate under deposition conditions with the precursors; d) varying the temperature of deposition from a first temperature to a second distinct temperature which is at least 40° C. from said first temperature during the contact, and e) depositing a multiple metal and metalloid compound layer on the substrate from the precursors resulting in the compositional gradient of the metal and metalloid in the layer as a result of step d). An oxygen source can be added to result in a metal-metalloid oxide, or a nitrogen source can be added to result in a metal-metalloid nitride, or a mixture of an oxygen and a nitrogen source can be added to result in a metal-metalloid oxynitride. The metalloid would preferably be silicon.
    • 一种用于在电子材料的基底上的层中沉积具有金属和准金属的组成梯度的多金属和准金属化合物层的方法,包括:a)提供两种或更多种金属 - 配体和准金属 - 配体复合物前体, 其中配体优选相同; b)将前体输送到基底所在的沉积区; c)在沉积条件下将基材与前体接触; d)在接触期间将沉积温度从第一温度变化到与所述第一温度至少40℃的第二不同温度,以及e)从所述前体沉积多个金属和准金属化合物层到所述衬底上, 在层中的金属和准金属的组成梯度中作为步骤d)的结果。 可以加入氧源以产生金属 - 类金属氧化物,或者可以加入氮源以产生金属 - 准金属氮化物,或者可以加入氧和氮源的混合物以产生金属 - 准金属氧氮化物 准金属将优选为硅。