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    • 141. 发明申请
    • PILLAR DEVICES AND METHODS OF MAKING THEREOF
    • 支柱装置及其制造方法
    • US20110136326A1
    • 2011-06-09
    • US13026381
    • 2011-02-14
    • Vance DUNTONS. Brad HernerPaul Wai Kie PoonChuanbin PanMichael ChanMichael KoneveckiUsha Raghuram
    • Vance DUNTONS. Brad HernerPaul Wai Kie PoonChuanbin PanMichael ChanMichael KoneveckiUsha Raghuram
    • H01L21/36
    • H01L27/1021H01L29/8613H01L29/8615H01L29/868
    • A method of making a semiconductor device includes providing an insulating layer containing a plurality of openings, forming a first semiconductor layer in the plurality of openings in the insulating layer and over the insulating layer, and removing a first portion of the first semiconductor layer, such that first conductivity type second portions of the first semiconductor layer remain in lower portions of the plurality of openings in the insulating layer, and upper portions of the plurality of openings in the insulating layer remain unfilled. The method also includes forming a second semiconductor layer in the upper portions of the plurality of openings in the insulating layer and over the insulating layer, and removing a first portion of the second semiconductor layer located over the insulating layer. The second conductivity type second portions of the second semiconductor layer remain in upper portions of the plurality of openings in the insulating layer to form a plurality of pillar shaped diodes in the plurality of openings.
    • 制造半导体器件的方法包括提供包含多个开口的绝缘层,在绝缘层中的多个开口中并在绝缘层之上形成第一半导体层,以及去除第一半导体层的第一部分, 第一半导体层的第一导电类型的第二部分保留在绝缘层中的多个开口的下部,并且绝缘层中的多个开口的上部保持未填充。 该方法还包括在绝缘层中的多个开口的上部和绝缘层上形成第二半导体层,以及去除位于绝缘层之上的第二半导体层的第一部分。 第二半导体层的第二导电类型的第二部分保留在绝缘层中的多个开口的上部,以在多个开口中形成多个柱状二极管。
    • 144. 发明授权
    • Devices having reversible resistivity-switching metal oxide or nitride layer with added metal
    • 具有可逆电阻率切换金属氧化物或具有添加金属的氮化物层的器件
    • US07816659B2
    • 2010-10-19
    • US11287452
    • 2005-11-23
    • S. Brad HernerTanmay Kumar
    • S. Brad HernerTanmay Kumar
    • H01L29/02
    • H01L45/145H01L27/2409H01L27/2463H01L45/04H01L45/1233H01L45/146H01L45/1625H01L45/165H01L45/1658H01L45/1675
    • A layer of resistivity-switching metal oxide or nitride can attain at least two stable resistivity states. Such a layer may be used in a state-change element in a nonvolatile memory cell, storing its data state, for example a “0” or a “1”, in this resistivity state. Including additional metal atoms in a layer of such a resistivity-switching metal oxide or nitride compound decreases the current required to cause switching between resistivity states, reducing power requirements for an array of memory cells storing data in the resistivity state of such a layer. In various embodiments a memory cell may include a layer of resistivity-switching metal oxide or nitride compound with added metal formed in series with another element, such as a diode or a transistor.
    • 电阻率切换金属氧化物或氮化物层可达到至少两个稳定的电阻率状态。 这种层可以用在非易失性存储单元中的状态变化元件中,在该电阻率状态下存储其数据状态,例如“0”或“1”。 在这种电阻率切换金属氧化物或氮化物化合物的层中包括额外的金属原子降低了在电阻率状态之间导致切换所需的电流,从而降低了存储在这种层的电阻率状态下的数据的存储单元阵列的功率需求。 在各种实施例中,存储器单元可以包括电阻率切换金属氧化物或具有与另一元件(例如二极管或晶体管)串联形成的附加金属的氮化物化合物层。
    • 146. 发明授权
    • Method for isotropic doping of a non-planar surface exposed in a void
    • 在空隙中暴露的非平面表面的各向同性掺杂的方法
    • US07811916B2
    • 2010-10-12
    • US11610090
    • 2006-12-13
    • S. Brad Herner
    • S. Brad Herner
    • H01L21/223H01L21/383
    • H01L21/2236H01L21/2252H01L27/101H01L27/1021
    • A method is described for isotropic or nearly isotropic shallow doping of a non-planar surface exposed in a void. The results of ion implantation, a common doping method, are inherently planar. Some fabrication methods and devices may require doping a surface of a non-planar feature exposed in a void, such as a trench. The feature is doped by flowing a gas which will provide the dopant over the exposed surfaces, or by exposing the surfaces to a plasma including the dopant. The feature may be a patterned feature, including a top surface and a sidewall. In a preferred embodiment, a semiconductor feature having a top surface and a sidewall is exposed in a trench formed in a dielectric, and a gas providing a p-type or n-type dopant is flowed in the trench, providing a p-type or n-type dopant to the semiconductor.
    • 描述了在空隙中暴露的非平面表面的各向同性或近似各向同性的浅掺杂的方法。 离子注入的结果是一种普通的掺杂方法,它本身就是平面的。 一些制造方法和装置可能需要掺杂暴露在诸如沟槽的空隙中的非平面特征的表面。 该特征通过流动将在暴露表面上提供掺杂剂的气体或通过将表面暴露于包括掺杂剂的等离子体来掺杂。 该特征可以是图案特征,包括顶表面和侧壁。 在优选实施例中,具有顶表面和侧壁的半导体特征暴露在形成于电介质中的沟槽中,并且提供p型或n型掺杂剂的气体在沟槽中流动,提供p型或 n型掺杂剂。