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121. 发明专利

JP2004511781A Module of the inspection apparatus for inspecting a printed circuit board 有权
公开(公告)号：JP2004511781A
公开(公告)日：2004-04-15
申请号：JP2002534850
申请日：2001-09-28
申请人：アーテーゲー、テスト、ジステムス、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツング、ウント、コンパニー、コマンディット、ゲゼルシャフトAtg Test Systems Gmbh & Co. Kg
发明人：ゴールドシュミット，フォルカー , シューマッハー，エッカルト , ブランドト，ペーター , ロートハウク，ウヴェ
IPC分类号： G01R1/073 , G01R31/02 , G01R31/28 , H05K3/00
CPC分类号： G01R31/2808 , G01R1/07328
摘要： The invention relates to a module for a testing device which tests printed circuit boards, comprising a plurality of contact points arranged in a strip-shaped section of a testing plane and an electronic unit forming at least one part of an electronic evaluation system which is used to evaluate the testing signal, said electronic unit being disposed in the area below the strip-shaped section, forming a structural unit with the contact points. The contact points are arranged in a grid-like structure at a distance of not more than 2 mm and at least two contact points are electrically connected to each other. The electrically connected contact points are connected respectively to an input of the electronic unit. The aim of the invention is to provide a module which can be used to produce a low-cost, basic grid-like structure with high density contact points.

122. 发明专利

JP2004502139A A vacuum chuck having an integrated electrical inspection points 审中-公开
公开(公告)号：JP2004502139A
公开(公告)日：2004-01-22
申请号：JP2002505162
申请日：2001-06-21
申请人：ハネウエル・インターナシヨナル・インコーポレーテツド
发明人：アラヤ，ジエイム , ミンスマイヤー，デイビツド , モルダフスキー，ボーリス
IPC分类号： G01R31/02 , B23Q3/08 , B25B11/00 , G01R1/073 , G01R31/28
CPC分类号： G01R31/2808 , B25B11/005 , G01R1/07328 , Y10S279/904 , Y10T279/11
摘要：その表面に埋設された導電回路を有する真空チャックであって、真空チャックは、検査されるべきフレキシブルパネルの全領域に渡り高い信頼性があり且つ均一な機械的支持物だけでなく、電気的検査のための高い信頼性がある導電路を提供する。一つの可能な形態においては、真空チャックは、導電性材料でコーティングされた表面を有する空気透過性の微粒子多孔アルミナセラミックモジュールを備え、コーティングは、空気が導電性材料またはセラミックモジュールを通過するのを妨げないほど充分に薄い。導電性材料は、パネルの検査を容易にするための導電性パターンにエッチングされ、または導電性パターンに形成されることができる。

123. 发明专利

JPS5925186B2 JPS5925186B2 - 失效
公开(公告)号：JPS5925186B2
公开(公告)日：1984-06-15
申请号：JP1635878
申请日：1978-02-15
申请人： Teredain Inc
发明人： JONASON HOWAADO KATSUTSU
IPC分类号： G01R1/06 , G01R1/067 , G01R1/073 , G01R31/02 , G01R31/28 , H01B7/00 , H01B7/08
CPC分类号： H01B7/08 , G01R1/07314 , G01R1/07328

124. 发明专利

JPS57124262A Device for inspecting printed circuit board 失效
标题翻译：检查印刷电路板的装置
公开(公告)号：JPS57124262A
公开(公告)日：1982-08-03
申请号：JP876381
申请日：1981-01-23
申请人： Toshiba Corp
发明人： HAMANO HIROSHI
IPC分类号： G01R31/02 , G01R1/073
CPC分类号： G01R1/07328
摘要： PURPOSE:To perform a continuity test without an exchange of an adapter owing to a change of kinds of a printed circuit board by exchanging a guide board in which a thrusting hole of a socket is provided so as to coincide with a through hole. CONSTITUTION:A plurality of probe sockets 26, which are inserted and supported between thrusting holes 25 of a guide plate 23 and a stand board 21 freely attachably and detachably, and inspection pins 27 at the top end are allowed to coincide with through holes 10 of multilayered printed circuit plates 11. And when a press plate is placed, inspection pins 27 are moved downward against the energizing force of the springs in the inside of the sockets 26 and all of the pin 27 are well connected with through holes 10 of the base plates 11 without affecting against any warp. thus, in the case of inspecting the different kinds of base plate the guid plate is taken out and a probe sockets are left as they are, and only the fixing of the guide plate to coincide with the through holes after the change is enough.
摘要翻译：目的：通过更换插座的推动孔以与通孔重合的引导板，由于印刷电路板的种类的变化，进行连续性测试而不更换适配器。构成：多个探针插座26被插入并支撑在引导板23的推压孔25和可自由拆卸地自由地安装的支承板21之间，允许顶端的检查销27与通孔10 多层印刷电路板11.并且当放置压板时，检查销27抵抗插座26内部的弹簧的激励力向下移动，并且所有的销27都与底座的通孔10良好连接板11不影响任何翘曲。因此，在检查不同种类的基板的情况下，引导板被取出并且探针插座原样保持，并且只有在更换之后导板的固定与通孔一致就足够了。

125. 发明授权

EP1662266B1 Positionierungsvorrichtung und Verfahren zu deren Herstellung 有权
标题翻译：定位装置以及它们的制备方法
公开(公告)号：EP1662266B1
公开(公告)日：2010-09-01
申请号：EP05025082.8
申请日：2005-11-16
申请人： Rohde & Schwarz Messgerätebau GmbH
发明人： Reisinger, Hans-Georg
IPC分类号： G01R31/28
CPC分类号： G01R1/07328 , G01R31/2808 , G01R31/2887

126. 发明授权

EP0840130B1 Standard- and limited-access hybrid test fixture 失效
标题翻译：混合测试适配器与标准和有限的无障碍区
公开(公告)号：EP0840130B1
公开(公告)日：2006-05-03
申请号：EP97113011.7
申请日：1997-07-29
申请人： Agilent Technologies, Inc. (a Delaware corporation)
发明人： Sayre, Tracy L. , Slutz, Robert A. , Pelzel, Leanne C.
IPC分类号： G01R1/073
CPC分类号： G01R1/07328 , G01R1/07378

127. 发明公开

EP1512978A2 Loaded-board, guided-probe test fixture 失效
公开(公告)号：EP1512978A2
公开(公告)日：2005-03-09
申请号：EP04027669.3
申请日：1997-07-29
申请人： Agilent Technologies Inc. (a Delaware Corporation)
发明人： Sayre, Tracy, L. , Slutz, Robert, A. , Kanack, Kris, J.
IPC分类号： G01R1/04 , G01R1/073
CPC分类号： G01R1/07378 , G01R1/07328 , G01R1/07357 , G01R1/07371
摘要： A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates (516) and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited -access, no-clean test targets (520). The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates (524), personality pins (528) and an alignment plate (534) in order to couple test targets (520) with multiplexed tester resources (500). The guided-probe test fixture of the present invention may also utilize a universal interface plate (852) with double-headed spring probes (854) and/or a wireless interface printed circuit board (502) to facilitate the electrical coupling of test targets (520) to tester resources (500). Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board (518) containing both standard-access and limited-access, no-clean test targets (520). The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets (520), while at the same time capable of probing standard-access test targets (520).

128. 发明公开

EP1438591A1 COAXIAL TILT PIN FIXTURE FOR TESTING HIGH FREQUENCY CIRCUIT BOARDS 审中-公开
标题翻译：倾斜同轴引脚测试高频电路板等
公开(公告)号：EP1438591A1
公开(公告)日：2004-07-21
申请号：EP01977631.9
申请日：2001-10-10
申请人： Delaware Capital Formation, Inc.
发明人： JOHNSTON, Charles, J.
IPC分类号： G01R1/067
CPC分类号： G01R1/07328 , G01R1/06772 , G01R1/07357 , G01R1/07378
摘要： A translator fixture for use in testing high frequency or high speed digital circuit boards. The fixture has a pin supporting top plate (29) and base plate (32) and coaxial constant impedance test pins (23) incorporated into the fixture to provide a signal path from a test analyzer to the circuit board (16) under test. The board under test is coupled to an upper surface of the top plate. The impedance of the coaxial pins is matched to the impedance of the board under test as well as the impedance of the test analyzer. Force exerted on the coaxial pins ensures contact of the pins with test points on the circuit board under test. The force may be exerted by spring loaded probes (12) mounted on a compliant test interface (10) below the base plate. The force may also be exerted by Euler buckling the pins by relative movement between the circuit board under test and a second circuit board coupled to the base plate or to the test analyzer.

129. 发明公开

EP1322967A1 MODUL FÜR EINE PRÜFVORRICHTUNG ZUM TESTEN VON LEITERPLATTEN 有权
标题翻译： MODULE FOR测试仪，电路板检测
公开(公告)号：EP1322967A1
公开(公告)日：2003-07-02
申请号：EP01983514.9
申请日：2001-09-28
申请人： atg test systems GmbH & Co. KG
发明人： ROTHAUG, Uwe , BRANDT, Peter , GOLDSCHMITT, Volker , SCHUHMACHER, Eckart
IPC分类号： G01R1/073 , G01R31/28
CPC分类号： G01R31/2808 , G01R1/07328
摘要： The invention relates to a module for a testing device which tests printed circuit boards, comprising a plurality of contact points arranged in a strip-shaped section of a testing plane and an electronic unit forming at least one part of an electronic evaluation system which is used to evaluate the testing signal, said electronic unit being disposed in the area below the strip-shaped section, forming a structural unit with the contact points. The contact points are arranged in a grid-like structure at a distance of not more than 2 mm and at least two contact points are electrically connected to each other. The electrically connected contact points are connected respectively to an input of the electronic unit. The aim of the invention is to provide a module which can be used to produce a low-cost, basic grid-like structure with high density contact points.

130. 发明公开

EP0942288A3 Method and apparatus for assigning pins for electrical testing of printed circuit boards 审中-公开
标题翻译：的方法和装置的针的分配用于电测试的印刷电路板
公开(公告)号：EP0942288A3
公开(公告)日：2003-07-02
申请号：EP99200714.6
申请日：1999-03-10
申请人： ManiaBarco N.V.
发明人： Jackson, William E. , Guthrie, Thomas L.
IPC分类号： G01R1/073 , G01R31/28 , G01R31/316 , G01R3/00
CPC分类号： G01R31/2808 , G01R1/07328 , G01R3/00 , G01R31/2886
摘要： A process for creating a pin assignment for a test fixture for electronic circuits is disclosed. A difficulty rating is determined for each test point on an electronic circuit. The difficult areas are assigned the probe pins on a test grid, with the difficulty rating of adjacent test points being iteratively determined as the process continues. If a probe pin cannot be assigned because of conflicts, one or more adjacent test points are reassigned probe pins, with the difficulty matrix being recalculated with each change and with probe pins being reassessed and reassigned. When all test points are assigned a probe pin, the probe pins are checked to see if they interfere with each other, and further iterations may result.

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