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    • 123. 发明授权
    • Semiconductor article with porous structure
    • 具有多孔结构的半导体制品
    • US06246068B1
    • 2001-06-12
    • US09212432
    • 1998-12-16
    • Nobuhiko SatoTakao YoneharaKiyofumi Sakaguchi
    • Nobuhiko SatoTakao YoneharaKiyofumi Sakaguchi
    • H01L4700
    • H01L21/02032H01L21/3221H01L21/3223H01L21/3226H01L21/76251H01L21/76254H01L21/76259H01L31/1892Y02E10/50
    • A method is provided for producing, with high reproducibility, an SOI substrate which is flat and high in quality, and simultaneously for achieving resources saving and reduction in cost through recycling of a substrate member. For accomplishing this, a porous-forming step is performed forming a porous Si layer on at least a surface of an Si substrate and a large porosity layer forming step is performed for forming a large porosity layer in the porous Si layer. This large porosity layer forming step is performed by implanting ions into the porous Si layer with a given projection range or by changing current density of anodization in said porous-forming step. At this time, a non-porous single-crystal Si layer is epitaxial-grown on the porous Si layer. Thereafter, the surface of the porous Si layer and a support substrate are bonded together, and then separation is performed at the porous Si layer with the large porosity. Subsequently, selective etching is performed to remove the porous Si layer.
    • 提供了一种以高再现性制造平坦且质量高的SOI衬底的方法,同时用于通过再循环衬底构件实现资源节省和降低成本。 为了实现这一点,在Si衬底的至少一个表面上进行形成多孔Si层的多孔形成步骤,并且进行大孔隙层形成步骤以在多孔Si层中形成大孔隙率层。 通过将离子注入到具有给定投影范围的多孔Si层中或通过改变所述多孔形成步骤中的阳极氧化的电流密度来进行该大孔隙率层形成步骤。 此时,在多孔Si层上外延生长无孔单晶Si层。 此后,将多孔Si层和支撑基板的表面接合在一起,然后在具有大孔隙率的多孔Si层上进行分离。 随后,进行选择性蚀刻以去除多孔Si层。