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    • 121. 发明申请
    • RECORDING APPARATUS AND RECORDING METHOD
    • 记录装置和记录方法
    • US20100177250A1
    • 2010-07-15
    • US12602124
    • 2008-05-22
    • Hiromasa HoshinoSeiji HoritaTakayuki NakamuraTakanori OkadaHideaki Mita
    • Hiromasa HoshinoSeiji HoritaTakayuki NakamuraTakanori OkadaHideaki Mita
    • H04N9/64
    • H04N5/772H04N5/907H04N9/8042
    • A recording and reproducing apparatus (100) can record information on a recording memory (111) having a recording region where a smallest unit for erasing recorded information is a block, on a unit of a cluster that is a unit smaller than the block. The recording and reproducing apparatus (100) includes: an input unit (130) that receives a request for starting or ending recording a file; and a system control unit (101) that records a header section of the file and a data section following the header section, from the beginning of the block in the recording region, when the request for starting recording is received; and updates the header section and records the updated header section on another cluster different from the cluster on which the header section before update is recorded when the request for ending recording is received. The system control unit (101) further corrects management information indicating a connection order of information recorded on each of the clusters included by the recording medium so that the updated header section is followed by the data section, when the updated header section is recorded on the other cluster.
    • 记录和再现设备(100)可以将记录信息记录在具有小于该块的单元的单元上的具有用于擦除记录信息的最小单位的记录区域的记录存储器(111)。 记录和再现设备(100)包括:输入单元(130),其接收用于开始或结束记录文件的请求; 以及系统控制单元(101),当接收到开始记录请求时,从记录区域中的块的开头记录文件的标题部分和标题部分之后的数据部分; 并且当接收到用于结束记录的请求时,更新报头部分并且将更新的报头部分记录在与记录更新前的报头部分的集群不同的另一个集群上。 系统控制单元(101)进一步校正指示记录在由记录介质包括的每个群集上的信息的连接顺序的管理信息,以便当更新的报头部分被记录在 其他集群。
    • 122. 发明申请
    • Test apparatus and test method
    • US20080120059A1
    • 2008-05-22
    • US11600676
    • 2006-11-16
    • Toshiaki AwajiTakashi SekinoTakayuki Nakamura
    • Toshiaki AwajiTakashi SekinoTakayuki Nakamura
    • G01R31/3183
    • G01R31/31922G01R31/3016G01R31/31725G01R31/31727
    • There is provided a test apparatus that decides the good or bad of an electronic device adopting source synchronous clocking with high precision. The test apparatus according to this invention includes: a reference clock generator that generates a reference clock for the test apparatus; a first variable delay circuit that delays a data signal output from the device under test by a designated time to output the delayed signal as a delay data signal; a second variable delay circuit that delays a clock signal showing a timing at which the data signal should be acquired, which is output from the device under test, by a designated time to output the delayed clock signal as a first delay clock signal; a first flip-flop that acquires the delay data signal at a timing based on the reference clock; a second flip-flop that acquires the first delay clock signal at a timing based on the reference clock; a first delay adjusting section that adjust a delay amount of at least one of the first variable delay circuit and the second variable delay circuit so that the first flip-flop and the second flip-flop acquire the delay data signal and the first delay clock signal at a timing at which the signals are changed; a third variable delay circuit that delays the clock signal by a designated time to output the delayed clock signal as a second delay clock signal; a second delay adjusting section that adjusts a delay amount of the third variable delay circuit based on a result obtained by acquiring the first delay clock signal of which a phase is adjusted by the first delay adjusting section at a timing at which the second delay clock signal is changed, in order to adjust a phase difference between the first delay clock signal and the second delay clock signal to a desired phase difference; and a deciding section that decides the good or bad of the signal output from the device under test based on a result obtained by acquiring the delay data signal at a timing at which the second delay clock signal is changed.
    • 123. 发明授权
    • Interference checking device
    • 干扰检测装置
    • US07251543B2
    • 2007-07-31
    • US11160259
    • 2005-06-16
    • Takayuki Nakamura
    • Takayuki Nakamura
    • G06F19/00
    • G05B19/4069G05B2219/35314G05B2219/35316G05B2219/35318G05B2219/35324G05B2219/35333
    • Interference checking device including: a modeling database that stores data for three-dimensional modeling of tools, workpieces, and machine-tool constituting structures; an interference data memory for storing interference data defining inter-component interference relationships among the tool, the workpiece, and the structures; and an interference checking processor that, based on structure movement commands sent from a program analyzer for the machine tool, and on data stored in the modeling database and interference data memory, determines whether the tool, the workpiece, and the structures will interfere with each other. Movement commands in a block at least one block succeeding the block being executed in order to control the drive mechanisms that move the structures are sent from the program analyzer to the interference checking processor.
    • 干涉检查装置包括:存储用于工具,工件和机床构造结构的三维建模的数据的建模数据库; 干涉数据存储器,用于存储限定所述工具,所述工件和所述结构之间的组件间干涉关系的干涉数据; 以及基于从机床的程序分析器发送的结构移动命令以及存储在建模数据库和干扰数据存储器中的数据的干扰检查处理器,确定工具,工件和结构是否会干扰每个 其他。 在块中的移动命令将被执行的块之后的至少一个块控制成将移动结构的驱动机构从程序分析器发送到干扰检查处理器。
    • 124. 发明授权
    • Electron beam length-measurement apparatus and measurement method
    • 电子束长度测量装置及测量方法
    • US06844549B2
    • 2005-01-18
    • US10274328
    • 2002-10-18
    • Jun MatsumotoTakayuki Nakamura
    • Jun MatsumotoTakayuki Nakamura
    • G01B15/00G01Q10/00G01Q30/02H01J37/147H01J37/21H01J37/28H01J37/244
    • H01J37/28G01B15/00H01J2237/2816
    • An electron beam length-measurement apparatus for measuring a length of a predetermined portion of an object by using an electron beam, includes: an electron gun for emitting the electron beam; a deflecting unit for deflecting the electron beam; an object holding unit on which the object is to be placed; a detector for detecting electrons that are scattered by the electron beam; a memory for storing layout position information that specifies a layout position at which the predetermined portion of the object; a length-measurement scanning controller for controlling the deflecting unit to scan with the electron beam to allow the layout position on the object to be irradiated with the electron beam; and a measurement unit operable to measure the length of the predetermined portion of the object based on a changing manner of the electrons successively detected by the detector while the length-measurement scanning controller scans with the electron beam.
    • 一种用于通过使用电子束测量物体的预定部分的长度的电子束长度测量装置,包括:用于发射电子束的电子枪; 用于偏转电子束的偏转单元; 物体保持单元,待放置物体; 用于检测由电子束散射的电子的检测器; 存储器,用于存储指定对象的预定部分的布局位置的布局位置信息; 长度测量扫描控制器,用于控制偏转单元用电子束扫描以允许物体上的布局位置用电子束照射; 以及测量单元,其可操作以基于当长度测量扫描控制器用电子束扫描时由检测器连续检测的电子的改变方式来测量物体的预定部分的长度。
    • 125. 发明授权
    • NC machining simulation apparatus
    • 数控加工仿真装置
    • US06751523B2
    • 2004-06-15
    • US09942658
    • 2001-08-31
    • Takayuki Nakamura
    • Takayuki Nakamura
    • G06F1900
    • G05B19/4068G05B19/4069Y02P90/265
    • The present invention relates to a more convenient machining simulation apparatus for simulating a machining operation in accordance with an NC program. The machining simulation apparatus is adapted to display the configuration of a tool and the configuration of a workpiece on a display device (31) and change the tool configuration and the workpiece configuration on the display device (31) in accordance with the NC program so as to check the movement and machining state of the tool on the display device (31). The apparatus includes a process image data storage section (27) for storing therein pixel data generated at the end of a machining process precedent to the designated machining process from the process image data storage section (27) to display the tool configuration and the workpiece configuration on the display device (31) and successively re-generates pixel data to display the tool configuration and the workpiece configuration on the display device (31).
    • 本发明涉及一种用于根据NC程序模拟加工操作的更方便的加工仿真装置。 该加工模拟装置适于在显示装置(31)上显示工具的构造和工件的构造,并且根据NC程序在显示装置(31)上改变工具配置和工件配置,以便 以检查显示装置(31)上的工具的移动和加工状态。 该装置包括:处理图像数据存储部(27),用于存储来自处理图像数据存储部(27)的在指定的加工处理的先前的加工处理结束时生成的像素数据,以显示工具配置和工件配置 在显示装置(31)上依次重新生成像素数据,以在显示装置(31)上显示工具配置和工件配置。
    • 130. 发明授权
    • Antitheft device for an audio device
    • 音响设备防盗装置
    • US4806926A
    • 1989-02-21
    • US923296
    • 1986-10-27
    • Takayuki Nakamura
    • Takayuki Nakamura
    • G08B13/00B60R11/02G08B13/14G06F7/04
    • G08B13/1409
    • Diodes are used for memorizing an identification number. A microcomputer judges a combination of diodes and decides an identification number corresponding to that combination. The microcomputer is connected directly to a battery. Whether the audio device provided with an antitheft device according to this invention is stolen or not is judged, depending on whether it is connected without interruption to the battery or not. It is judged that the device is stolen, only when the battery has been once disconnected, and in this case the microcomputer doesn't allow the audio device to work, unless the identification number is newly inputted.
    • 二极管用于记忆识别号码。 微型计算机判断二极管的组合,并决定与该组合对应的识别号码。 微型计算机直接与电池连接。 根据本发明的具有防盗装置的音频装置是否被窃取是否被判断,取决于是否连接而不中断电池。 只有当电池一旦断开连接时,才判定该设备被盗,在这种情况下,微机不允许音频设备工作,除非新输入的识别号码。