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    • 103. 发明授权
    • Measurement of optical properties of passive optical devices using the matrix method
    • 使用矩阵法测量无源光学器件的光学特性
    • US06762829B2
    • 2004-07-13
    • US10373736
    • 2003-02-27
    • François BabinNormand Cyr
    • François BabinNormand Cyr
    • G01N2100
    • G01N21/21G01J4/04G01M11/337
    • A property of a device that is dependent upon both wavelength and state of polarization is measured by; passing through the device an optical signal having its wavelength and SOP varied, the wavelength over a spectral range of the device and the SOP between four Mueller SOPs; measuring the insertion loss of the device for each of the four SOPS and at each wavelength; using the four insertion loss measurements for each of the four different states of polarization for each wavelength to compute the four elements of the first line of the Mueller matrix for each wavelength; and using the Mueller matrix elements, computing insertion loss variations for the device for a multiplicity of input states of polarization in addition to the four states of polarization for which the actual attenuation measurements were made and using the insertion loss variations to compute the polarization and wavelength dependent property.
    • 取决于波长和极化状态的器件的性质是通过测量的; 通过该器件具有其波长和SOP的光信号变化,器件的光谱范围上的波长和四个Mueller SOP之间的SOP; 测量四个SOPS中每一个和每个波长的器件的插入损耗; 对于每个波长使用四种不同极化状态中的每一种的四次插入损耗测量来计算每个波长的Mueller矩阵的第一行的四个元素; 并且使用Mueller矩阵元素,除了进行实际衰减测量的四个极化状态之外,还计算多个输入极化状态的装置的插入损耗变化,并且使用插入损耗变化来计算极化和波长 依赖财产。
    • 105. 发明授权
    • Polarization dependent loss measurement in photonic devices
    • 光子器件中极化相关的损耗测量
    • US06650406B1
    • 2003-11-18
    • US10237213
    • 2002-09-09
    • Louis B. AllardJonathan ParadisJohn C. Martinho
    • Louis B. AllardJonathan ParadisJohn C. Martinho
    • G01N2100
    • G01M11/337
    • In order to calibrate an apparatus for measuring the polarization dependent loss of an optical device under test, a set of nominal polarization states of incident light are generated with a polarization generator. The incident light is then passed through a dot-product conserving polarization rotator at a first setting. A transmission characteristic is measured through a standard optical component with a known polarization dependent loss value for each polarization state. This step is repeated for a number of different settings of the polarization rotator. A polarization dependent loss value is calculated for the standard optical component based on the measured transmission characteristics at each polarization rotator setting. The calculated polarization dependent loss values are then processed to generate an aggregate error value. The aggregate error value is minimized by adjusting the values of the nominal polarization states to estimate the actual polarization states, which can then be used to calculate the polarization dependent loss of an optical device whose value is unknown.
    • 为了校准用于测量被测光学器件的偏振相关损耗的装置,利用偏振发生器产生一组入射光的标称极化状态。 然后入射光在第一设定下通过点积保存偏振旋转器。 透射特性通过具有已知偏振相关损耗值的标准光学元件测量,用于每个偏振状态。 对于偏振旋转器的许多不同设置重复该步骤。 基于每个偏振旋转器设置下测量的传输特性,为标准光学部件计算极化相关损耗值。 然后处理所计算的偏振相关损耗值以产生聚合误差值。 通过调整标称极化状态的值来估计聚合误差值,以估计实际极化状态,然后可以将其用于计算其值未知的光学器件的偏振相关损耗。
    • 106. 发明申请
    • Polarization dependent loss measuring apparatus
    • 偏振相关损耗测量仪
    • US20030117625A1
    • 2003-06-26
    • US10322840
    • 2002-12-18
    • Ando Electric Co., Ltd.
    • Kiyohisa Fujita
    • G01J004/00
    • G01M11/337
    • Wavelength dependent measurement is made by launching light into an object 8 to be measured and receiving transmitted light from the object 8 while continuously changing wavelengths of output light. Next, peak wavelength detection processing for detecting a wavelength at the time when loss or gain of the transmitted light from the object 8 becomes maximum based on a wavelength dependent measurement result is performed. Then, polarization dependent loss measurement processing for measuring polarization dependent loss of the object 8 is performed by measuring the transmitted light from the object 8 while launching light of a measurement wavelength detected into the object 8 and randomly changing a polarization state of the light. Further, a control circuit processes associating a wavelength dependent analysis result with a PDL measurement result, and displays its result on a display part 2.
    • 通过将光发射到待测量的对象8中并且在连续改变输出光的波长的同时接收来自对象8的透射光而进行波长依赖测量。 接着,进行基于波长相关测量结果来检测来自对象8的透射光的损失或增益变为最大时的波长的峰值波长检测处理。 然后,通过在检测到对象8的测量波长的光的同时测量来自对象8的透射光并随机改变光的偏振状态来进行用于测量对象8的偏振相关损耗的偏振相关损耗测量处理。 此外,控制电路处理将波长相关分析结果与PDL测量结果相关联,并将其结果显示在显示部分2上。
    • 107. 发明授权
    • Apparatus and method employing depolarization to eliminate effect of
polarization dependent loss
    • 使用去极化以消除偏振相关损耗的影响的装置和方法
    • US6147757A
    • 2000-11-14
    • US255934
    • 1999-02-23
    • Paisheng ShenPeter C. Chang
    • Paisheng ShenPeter C. Chang
    • G01J4/00G01M11/00
    • G01M11/337G01J4/00
    • An apparatus for measuring the IL (insertion loss) and the PDL (polarization dependent loss) of an optical device, includes a first switch adapted to connected to plural light sources on one side and to either a first depolarizer or a polarization controller on the other side thereof. A second switch is connected to both the first depolarizer and the polarization controller on one side and to the device under test on the other side. A detection instrument is connected to the device under test opposite to the second switch. Therefore, a first test path is set up from the light source, the first switch, the first depolarizer, the second switch, the device under test (DUT), to the detection instrument for measuring the pure IL of the DUT without the PDL involved therein, while a second test path is set up from the light source, the polarization controller, the second switch, the DUT, to the detection instrument for measuring the PDL of the DUT.
    • 用于测量光学装置的IL(插入损耗)和PDL(偏振相关损耗)的装置包括:第一开关,其适于连接到一侧的多个光源以及另一个上的第一去偏振器或偏振控制器 侧。 第二开关在一侧连接到第一去极化器和偏振控制器,另一侧连接到被测器件。 检测仪器被连接到与第二开关相对的被测器件。 因此,将第一测试路径从光源,第一开关,第一去极化器,第二开关,被测器件(DUT)建立到用于测量DUT的纯IL的检测仪器,而不涉及PDL 其中,从光源,偏振光控制器,第二开关,DUT到第二测试路径,到用于测量DUT的PDL的检测仪器。
    • 108. 发明授权
    • Method and apparatus for measuring the polarization characteristics of
optical transmission medium
    • 用于测量光传输介质极化特性的方法和装置
    • US5965874A
    • 1999-10-12
    • US807870
    • 1997-02-26
    • Osamu AsoIsamu OhshimaHaruki Ogoshi
    • Osamu AsoIsamu OhshimaHaruki Ogoshi
    • G01J4/00G01J4/04G01M11/00G01N21/21G02F1/01
    • G01J4/00G01J4/04G01M11/336G01M11/337G01N21/21
    • A method to obtain polarization characteristics of an optical transmission medium is disclosed. Sequentially plural different states of polarized light are launched into the optical transmission medium. Intensities of light emerging from the optical transmission medium through combinations of optical elements are measured to obtain Stokes parameters from which Stokes vectors describing the emerging light corresponding to each of the plural sequentially launched states of polarization are obtained; for at least three different launched states of polarization, descriptors are used of these launched states of polarization and the Stokes vectors describing the corresponding emerging light to calculate a Jones matrix which mathematically models the changes that the launched light when described in terms of a Jones vector is subject to when passing through the optical transmission medium; and, the Jones matrix is used to describe the polarization characteristics of the optical transmission medium.
    • 公开了一种获得光传输介质的偏振特性的方法。 顺序地将多个不同的偏振光状态发射到光传输介质中。 测量通过光学元件的组合从光传输介质出射的光的强度,以获得斯托克斯参数,从其中获得描述与多个顺序发射的极化状态中的每一个相对应的出射光的斯托克斯矢量; 对于至少三种不同的发射极化状态,使用这些发射的极化状态的描述符,并且描述相应的出射光的斯托克斯矢量来计算琼斯矩阵,该矩阵在以Jones矢量描述时对发射的光进行数学模拟 经过光传输介质时经受; 并且,Jones矩阵用于描述光传输介质的偏振特性。