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1. 发明授权

US06650406B1 Polarization dependent loss measurement in photonic devices 有权
标题翻译：光子器件中极化相关的损耗测量
公开(公告)号：US06650406B1
公开(公告)日：2003-11-18
申请号：US10237213
申请日：2002-09-09
申请人： Louis B. Allard , Jonathan Paradis , John C. Martinho
发明人： Louis B. Allard , Jonathan Paradis , John C. Martinho
IPC分类号： G01N2100
CPC分类号： G01M11/337
摘要： In order to calibrate an apparatus for measuring the polarization dependent loss of an optical device under test, a set of nominal polarization states of incident light are generated with a polarization generator. The incident light is then passed through a dot-product conserving polarization rotator at a first setting. A transmission characteristic is measured through a standard optical component with a known polarization dependent loss value for each polarization state. This step is repeated for a number of different settings of the polarization rotator. A polarization dependent loss value is calculated for the standard optical component based on the measured transmission characteristics at each polarization rotator setting. The calculated polarization dependent loss values are then processed to generate an aggregate error value. The aggregate error value is minimized by adjusting the values of the nominal polarization states to estimate the actual polarization states, which can then be used to calculate the polarization dependent loss of an optical device whose value is unknown.
摘要翻译：为了校准用于测量被测光学器件的偏振相关损耗的装置，利用偏振发生器产生一组入射光的标称极化状态。然后入射光在第一设定下通过点积保存偏振旋转器。透射特性通过具有已知偏振相关损耗值的标准光学元件测量，用于每个偏振状态。对于偏振旋转器的许多不同设置重复该步骤。基于每个偏振旋转器设置下测量的传输特性，为标准光学部件计算极化相关损耗值。然后处理所计算的偏振相关损耗值以产生聚合误差值。通过调整标称极化状态的值来估计聚合误差值，以估计实际极化状态，然后可以将其用于计算其值未知的光学器件的偏振相关损耗。

2. 发明授权

US07253906B2 Polarization state frequency multiplexing 有权
标题翻译：极化状态频率复用
公开(公告)号：US07253906B2
公开(公告)日：2007-08-07
申请号：US10600925
申请日：2003-06-23
申请人： Thomas Friessnegg , Yi Liang , John C. Martinho
发明人： Thomas Friessnegg , Yi Liang , John C. Martinho
IPC分类号： G01B9/02
CPC分类号： G01M11/336 , G01M11/331 , G02B6/272 , G02B6/2773 , G02B6/29349 , G02B6/2935 , G02B6/29395
摘要： A method for the rapid measurement of polarization dependent properties of an optical device under test uses a novel technique to generate light in four different polarization states in which each state is individually sensed at a different interference frequency.The device for executing this method includes a Mach-Zehnder interferometer (M-Z) having a reference arm and a signal arm. In the signal arm, a device called a “polarization state frequency multiplexer” (PSFM) splits the light into four ports, transforms each part into one of four predetermined polarization states and then combines the light in the different polarization states together. The combined light is then passed through the device under test and combined/interfered with the light propagating through the reference arm at the output of the M-Z interferometer. Since the optical frequency of the input light to the M-Z interferometer is scanned through a range of wavelengths at a fixed repetition rate, the output light intensity (reference pattern) from the interferometer is modulated. By analyzing the M-Z interferometer output in the frequency domain, the signal levels of each polarization state can be identified and measured.
摘要翻译：用于快速测量被测光学器件的偏振相关特性的方法使用一种新技术来产生四种不同偏振状态的光，其中每种状态以不同的干扰频率单独感测。用于执行该方法的装置包括具有参考臂和信号臂的马赫 - 曾德干涉仪（M-Z）。在信号臂中，称为“偏振状态频率复用器”（PSFM）的装置将光分成四个端口，将每个部分转换成四个预定极化状态中的一个，然后将不同极化状态的光组合在一起。然后将组合的光通过被测器件，并与在M-Z干涉仪的输出处通过参考臂传播的光合并/干扰。由于通过以固定的重复频率在一定范围的波长上扫描到M-Z干涉仪的输入光的光频率，所以调制来自干涉仪的输出光强度（参考图案）。通过分析频域中的M-Z干涉仪输出，可以识别和测量每个极化状态的信号电平。

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