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    • 102. 发明授权
    • Lithographic apparatus and device manufacturing method utilizing data filtering
    • 利用数据滤波的平版印刷设备和器件制造方法
    • US07403265B2
    • 2008-07-22
    • US11093259
    • 2005-03-30
    • Patricius Aloysius Jacobus TinnemansJohannes Jacobus Matheus Baselmans
    • Patricius Aloysius Jacobus TinnemansJohannes Jacobus Matheus Baselmans
    • G03B27/54G03B27/42G03B27/32
    • G03F7/70191G03F7/70291G03F7/70433G03F7/70508
    • An apparatus and method are used to form patterns on a substrate. The comprise a projection system, a patterning device, a low-pass filter, and a data manipulation device. The projection system projects a beam of radiation onto the substrate as an array of sub-beams of radiation. The patterning device modulates the sub-beams of radiation to substantially produce a requested dose pattern on the substrate. The low-pass filter operates on pattern data derived from the requested dose pattern in order to form a frequency-clipped target dose pattern that comprises only spatial frequency components below a selected threshold frequency. The data manipulation device produces a control signal comprising spot exposure intensities to be produced by the patterning device, based on a direct algebraic least-squares fit of the spot exposure intensities to the frequency-clipped target dose pattern. In various examples, filters for pattern sharpening, image log slope control, and/or CD biasing can also be used.
    • 使用装置和方法在基板上形成图案。 包括投影系统,图案形成装置,低通滤波器和数据操作装置。 投影系统将辐射束投射到基板上作为辐射子束阵列。 图案形成装置调制辐射的子光束以在衬底上基本上产生所要求的剂量图案。 低通滤波器对从所请求的剂量图案导出的图形数据进行操作,以便形成仅包含低于选定阈值频率的空间频率分量的限幅目标剂量模式。 数据处理装置基于斑点曝光强度与限幅目标剂量图案的直接代数最小二乘拟合,产生包括由图案形成装置产生的点曝光强度的控制信号。 在各种示例中,还可以使用用于图案锐化,图像对数斜率控制和/或CD偏置的滤波器。
    • 107. 发明授权
    • Lithographic method and assembly
    • 平版印刷方法和装配
    • US09423701B2
    • 2016-08-23
    • US13438526
    • 2012-04-03
    • Shaoxian ZhangJohannes Jacobus Matheus BaselmansJohannes Christiaan Maria Jasper
    • Shaoxian ZhangJohannes Jacobus Matheus BaselmansJohannes Christiaan Maria Jasper
    • G03B27/68G03F7/20
    • G03F7/706G03F7/70616G03F7/70625
    • A lithographic method of determining a sensitivity of a property of a pattern feature to change in optical aberrations of a lithographic apparatus used to provide that pattern feature. The method includes controlling a configuration of the lithographic apparatus to establish a first aberration state, forming a first image of the pattern feature with that lithographic apparatus when the lithographic apparatus is in that first aberration state, measuring a property of the image, controlling a configuration of the lithographic apparatus to establish a second, different, aberration state, forming an image of the same pattern feature with that lithographic apparatus when the lithographic apparatus is in that second aberration state, measuring a same property of the image, and using the measurements to determine the sensitivity of the property of the pattern feature to changes in the aberration state.
    • 确定图案特征的属性的灵敏度以改变用于提供该图案特征的光刻设备的光学像差的光刻方法。 该方法包括控制光刻设备的配置以建立第一像差状态,当光刻设备处于第一像差状态时,利用该光刻设备形成图案特征的第一图像,测量图像的属性,控制配置 的光刻设备,以建立第二,不同的像差状态,当光刻设备处于第二像差状态时,与该光刻设备形成相同图案特征的图像,测量图像的相同特性,并使用测量值 确定图案特征的属性对像差状态变化的敏感度。