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    • 96. 发明申请
    • PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT UNDER TEST
    • 预测,适用于测试中的集成电路的自适应电源
    • WO03065064A3
    • 2003-10-16
    • PCT/US0302581
    • 2003-01-29
    • FORMFACTOR INC
    • ELDRIDGE BENJAMIN NMILLER CHARLES A
    • G01R31/26G01R31/28G01R31/317G01R31/319G06F1/26H01L21/66G01R31/316
    • G06F1/26G01R31/2851G01R31/31721G01R31/31905G01R31/31924
    • A main power source supplies current through path impedance to a power terminal of an integrated circuit device under test (DUT). The DUT's demand for current at the power input terminal temporarily increases following edges of a clock signal applied to the DUT during a test as transistors within the IC switch in response to the clock signal edges. To limit variation (noise) in voltage at the power input terminal, an auxiliary power supply supplies an additional current pulse to the power input terminal to meet the increased demand during each cycle of the clock signal. The magnitude of the current pulse is a function of a predicted increase in current demand during that clock cycle, and of the magnitude of an adaption signal controlled by a feedback circuit provided to limit variation in voltage developed at the DUT's power input terminal.
    • 主电源将电流通过路径阻抗提供给被测集成电路器件(DUT)的电源端子。 在测试期间,DUT对电源输入端的电流需求暂时增加了在测试期间施加到DUT的时钟信号的随后边缘,作为IC开关中的晶体管响应于时钟信号的边缘。 为了限制电源输入端子的电压变化(噪声),辅助电源为电源输入端子提供额外的电流脉冲,以满足在时钟信号的每个周期期间增加的需求。 电流脉冲的大小是在该时钟周期期间电流需求的预测增加以及由反馈电路控制的适配信号的大小的函数,以设置用于限制在DUT的功率输入端产生的电压变化。