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1. 发明申请

US20130321798A1 DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD AND LOW LIGHT DETECTOR 有权
标题翻译：缺陷检测方法，低光检测方法和低光检测器
公开(公告)号：US20130321798A1
公开(公告)日：2013-12-05
申请号：US13882542
申请日：2011-10-14
申请人： Yuta Urano , Toshifumi Honda , Takahiro Jingu
发明人： Yuta Urano , Toshifumi Honda , Takahiro Jingu
IPC分类号： G01N21/88
CPC分类号： G01N21/8806 , G01N21/4795 , G01N21/8851 , G01N21/9501 , G01N21/956 , G01N2021/8835
摘要： A defect inspection method includes an illumination light adjustment step of adjusting light emitted from a light source, an illumination intensity distribution control step of forming light flux obtained in the illumination light adjustment step into desired illumination intensity distribution, a sample scanning step of displacing a sample in a direction substantially perpendicular to a longitudinal direction of the illumination intensity distribution, a scattered light detection step of counting the number of photons of scattered light emitted from plural small areas in an area irradiated with illumination light to produce plural scattered light detection signals corresponding to the plural small areas, a defect judgment step of processing the plural scattered light detection signals to judge presence of a defect, a defect dimension judgment step of judging dimensions of the defect in each place in which the defect is judged to be present and a display step of displaying a position on sample surface and the dimensions of the defect in each place in which the defect is judged to be present.
摘要翻译：缺陷检查方法包括调整从光源发出的光的照明光调节步骤，将在所述照明光调节步骤中获得的光束形成为期望的照度分布的照度分布控制步骤，将样品置换的样本扫描步骤在与照明强度分布的长度方向大致正交的方向上，对从照明光照射的区域的多个小区域发射的散射光的光数进行计数，生成与多个散射光检测信号对应的散射光检测信号的散射光检测步骤多个小区域，处理多个散射光检测信号以判断缺陷的存在的缺陷判断步骤，判断存在缺陷的每个位置的缺陷的尺寸的缺陷维度判断步骤和显示显示位置的步骤o n样品表面和缺陷的每个位置的缺陷的尺寸。

2. 发明授权

US09588054B2 Defect inspection method, low light detecting method and low light detector 有权
标题翻译：缺陷检测方法，低光检测方法和低光检测器
公开(公告)号：US09588054B2
公开(公告)日：2017-03-07
申请号：US13882542
申请日：2011-10-14
申请人： Yuta Urano , Toshifumi Honda , Takahiro Jingu
发明人： Yuta Urano , Toshifumi Honda , Takahiro Jingu
IPC分类号： G01N21/86 , H01J3/14 , G01N21/88 , G01N21/95 , G01N21/956
CPC分类号： G01N21/8806 , G01N21/4795 , G01N21/8851 , G01N21/9501 , G01N21/956 , G01N2021/8835
摘要： A defect inspection method includes an illumination light adjustment step of adjusting light emitted from a light source, an illumination intensity distribution control step of forming light flux obtained in the illumination light adjustment step into desired illumination intensity distribution, a sample scanning step of displacing a sample in a direction substantially perpendicular to a longitudinal direction of the illumination intensity distribution, a scattered light detection step of counting the number of photons of scattered light emitted from plural small areas in an area irradiated with illumination light to produce plural scattered light detection signals corresponding to the plural small areas, a defect judgment step of processing the plural scattered light detection signals to judge presence of a defect, a defect dimension judgment step of judging dimensions of the defect in each place in which the defect is judged to be present and a display step of displaying a position on sample surface and the dimensions of the defect in each place in which the defect is judged to be present.
摘要翻译：缺陷检查方法包括调整从光源发出的光的照明光调节步骤，将在所述照明光调节步骤中获得的光束形成为期望的照度分布的照度分布控制步骤，将样品置换的样本扫描步骤在与照明强度分布的长度方向大致正交的方向上，对从照明光照射的区域的多个小区域发射的散射光的光数进行计数，生成与多个散射光检测信号对应的散射光检测信号的散射光检测步骤多个小区域，处理多个散射光检测信号以判断缺陷的存在的缺陷判断步骤，判断存在缺陷的每个位置的缺陷的尺寸的缺陷维度判断步骤和显示显示位置的步骤o n样品表面和缺陷的每个位置的缺陷的尺寸。

3. 发明申请

US20130010281A1 INSPECTION METHOD AND INSPECTION DEVICE 审中-公开
公开(公告)号：US20130010281A1
公开(公告)日：2013-01-10
申请号：US13621121
申请日：2012-09-15
申请人： Izuo Horai , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
发明人： Izuo Horai , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
IPC分类号： G01N21/956
CPC分类号： G01N21/9501 , G01N21/65 , G01N21/9505 , G01N2021/4711 , G01N2021/473 , G01N2021/8861 , G01N2021/8864
摘要： An inspection method and an inspection device, or apparatus each capable of conducting composition analysis of a defect detected by elastic or stokes scattered light, an inspection surface or defect on the surface of the inspection surface, or a defect on the surface of the inspection object and its internal composition. A surface inspection method for optically detecting elastic or stokes scattering or inelastic or anti-stokes scattered light from inside the surface of the inspection object, for detecting existence of defects of the inspection object and features of the defects, for detecting positions of the detected defects on the surface of the inspection object, classifying and analyzing the detected defects in accordance with their features on the basis of the positions of the defects and the features of the defects or the classification result of the defects.

4. 发明申请

US20090009753A1 INSPECTION METHOD AND INSPECTION DEVICE 有权
标题翻译：检验方法和检验装置
公开(公告)号：US20090009753A1
公开(公告)日：2009-01-08
申请号：US12167570
申请日：2008-07-03
申请人： Izuo Horai , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
发明人： Izuo Horai , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
IPC分类号： G01N21/88
CPC分类号： G01N21/9501 , G01N21/65 , G01N21/9505 , G01N2021/4711 , G01N2021/473 , G01N2021/8861 , G01N2021/8864
摘要： An inspection method and an inspection device, or apparatus each capable of conducting composition analysis of a defect detected by elastic or stokes scattered light, an inspection surface or defect on the surface of the inspection surface, or a defect on the surface of the inspection object and its internal composition. A surface inspection method for optically detecting elastic or stokes scattering or inelastic or anti-stokes scattered light from inside the surface of the inspection object, for detecting existence of defects of the inspection object and features of the defects, for detecting positions of the detected defects on the surface of the inspection object, classifying and analyzing the detected defects in accordance with their features on the basis of the positions of the defects and the features of the defects or the classification result of the defects.
摘要翻译：检查方法和检查装置或装置，其能够对由检查表面的弹性或sto kes散射光，检查面或缺陷检测到的缺陷或检查对象的表面上的缺陷进行组成分析及其内在组成。一种表面检查方法，用于光学检测来自检查对象的表面内的弹性或斯托克斯散射或非弹性或反射散射光，用于检测检查对象的缺陷的存在和缺陷的特征，用于检测检测到的缺陷的位置在检查对象的表面上，根据缺陷的位置和缺陷的特征或缺陷的分类结果，根据其特征对检测到的缺陷进行分类和分析。

5. 发明授权

US07777876B2 Inspection method and inspection device 有权
标题翻译：检验方法和检验装置
公开(公告)号：US07777876B2
公开(公告)日：2010-08-17
申请号：US12167570
申请日：2008-07-03
申请人： Izuo Horai , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
发明人： Izuo Horai , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/65 , G01N21/9505 , G01N2021/4711 , G01N2021/473 , G01N2021/8861 , G01N2021/8864
摘要： An inspection method and an inspection device, or apparatus each capable of conducting composition analysis of a defect detected by elastic or stokes scattered light, an inspection surface or defect on the surface of the inspection surface, or a defect on the surface of the inspection object and its internal composition. A surface inspection method for optically detecting elastic or stokes scattering or inelastic or anti-stokes scattered light from inside the surface of the inspection object, for detecting existence of defects of the inspection object and features of the defects, for detecting positions of the detected defects on the surface of the inspection object, classifying and analyzing the detected defects in accordance with their features on the basis of the positions of the defects and the features of the defects or the classification result of the defects.
摘要翻译：检查方法和检查装置或装置，其能够对由检查表面的弹性或sto kes散射光，检查面或缺陷检测到的缺陷或检查对象的表面上的缺陷进行组成分析及其内在组成。一种表面检查方法，用于光学检测来自检查对象的表面内的弹性或斯托克斯散射或非弹性或反射散射光，用于检测检查对象的缺陷的存在和缺陷的特征，用于检测检测到的缺陷的位置在检查对象的表面上，根据缺陷的位置和缺陷的特征或缺陷的分类结果，根据其特征对检测到的缺陷进行分类和分析。

6. 发明授权

US09007581B2 Inspection method and inspection device 有权
标题翻译：检验方法和检验装置
公开(公告)号：US09007581B2
公开(公告)日：2015-04-14
申请号：US13621121
申请日：2012-09-15
申请人： Izuo Horai , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
发明人： Izuo Horai , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
IPC分类号： G01J3/00 , G01N21/00 , G01N21/95 , G01N21/65 , G01N21/47 , G01N21/88
CPC分类号： G01N21/9501 , G01N21/65 , G01N21/9505 , G01N2021/4711 , G01N2021/473 , G01N2021/8861 , G01N2021/8864
摘要： An inspection method and an inspection device, or apparatus each capable of conducting composition analysis of a defect detected by elastic or stokes scattered light, an inspection surface or defect on the surface of the inspection surface, or a defect on the surface of the inspection object and its internal composition. A surface inspection method for optically detecting elastic or stokes scattering or inelastic or anti-stokes scattered light from inside the surface of the inspection object, for detecting existence of defects of the inspection object and features of the defects, for detecting positions of the detected defects on the surface of the inspection object, classifying and analyzing the detected defects in accordance with their features on the basis of the positions of the defects and the features of the defects or the classification result of the defects.
摘要翻译：检查方法和检查装置或装置，其能够对由检查表面的弹性或sto kes散射光，检查面或缺陷检测到的缺陷或检查对象的表面上的缺陷进行组成分析及其内在组成。一种表面检查方法，用于光学检测来自检查对象的表面内的弹性或斯托克斯散射或非弹性或反射散射光，用于检测检查对象的缺陷的存在和缺陷的特征，用于检测检测到的缺陷的位置在检查对象的表面上，根据缺陷的位置和缺陷的特征或缺陷的分类结果，根据其特征对检测到的缺陷进行分类和分析。

7. 发明申请

US20100271626A1 INSPECTION METHOD AND INSPECTION DEVICE 审中-公开
标题翻译：检验方法和检验装置
公开(公告)号：US20100271626A1
公开(公告)日：2010-10-28
申请号：US12830922
申请日：2010-07-06
申请人： Izuo HORAI , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
发明人： Izuo HORAI , Hirokazu Koyabu , Yuta Urano , Takahiro Jingu
IPC分类号： G01N21/00
CPC分类号： G01N21/9501 , G01N21/65 , G01N21/9505 , G01N2021/4711 , G01N2021/473 , G01N2021/8861 , G01N2021/8864
摘要： An inspection method and an inspection device, or apparatus each capable of conducting composition analysis of a defect detected by elastic or stokes scattered light, an inspection surface or defect on the surface of the inspection surface, or a defect on the surface of the inspection object and its internal composition. A surface inspection method for optically detecting elastic or stokes scattering or inelastic or anti-stokes scattered light from inside the surface of the inspection object, for detecting existence of defects of the inspection object and features of the defects, for detecting positions of the detected defects on the surface of the inspection object, classifying and analyzing the detected defects in accordance with their features on the basis of the positions of the defects and the features of the defects or the classification result of the defects.
摘要翻译：检查方法和检查装置或装置，其能够对由检查表面的弹性或sto kes散射光，检查面或缺陷检测到的缺陷或检查对象的表面上的缺陷进行组成分析及其内在组成。一种表面检查方法，用于光学检测来自检查对象的表面内的弹性或斯托克斯散射或非弹性或反射散射光，用于检测检查对象的缺陷的存在和缺陷的特征，用于检测检测到的缺陷的位置在检查对象的表面上，根据缺陷的位置和缺陷的特征或缺陷的分类结果，根据其特征对检测到的缺陷进行分类和分析。

8. 发明授权

US08884207B2 Photoelectric conversion element, defect inspecting apparatus, and defect inspecting method 有权
标题翻译：光电转换元件，缺陷检查装置和缺陷检查方法
公开(公告)号：US08884207B2
公开(公告)日：2014-11-11
申请号：US13821246
申请日：2011-07-26
申请人： Hiroshi Kawaguchi , Takahiro Jingu
发明人： Hiroshi Kawaguchi , Takahiro Jingu
IPC分类号： H01L27/00 , H04N3/14 , H04N5/347 , H04N5/372 , H01L27/146 , G01N21/95 , G01N21/88
CPC分类号： H01L27/14601 , G01N21/8806 , G01N21/9501 , H04N5/347 , H04N5/37206 , H04N5/37213
摘要： Provided are a photoelectric conversion element, wherein the processing speed can be increased and resolution can be changed without increasing cost, and a defect inspecting apparatus and a defect inspecting method using the photoelectric conversion element. A photoelectric conversion element having a plurality of sensor pixels has a multiplexer and a plurality of horizontal transfer registers. Sensor pixels are divided into a plurality of blocks such that the sensor pixels correspond to each of the horizontal transfer registers. The photoelectric conversion element is configured such that charges of the blocks are read by means of the multiplexer via respective corresponding horizontal transfer registers, and are outputted via the multiplexer.
摘要翻译：提供一种光电转换元件，其中可以提高处理速度并且可以在不增加成本的情况下改变分辨率，以及使用光电转换元件的缺陷检查装置和缺陷检查方法。具有多个传感器像素的光电转换元件具有多路复用器和多个水平传送寄存器。传感器像素被分成多个块，使得传感器像素对应于每个水平传送寄存器。光电转换元件被配置为使得通过多路复用器经由相应的水平传送寄存器读取块的电荷，并且经由多路复用器输出。

9. 发明申请

US20140198321A1 SURFACE SHAPE MEASURING APPARATUS 有权
标题翻译：表面形状测量装置
公开(公告)号：US20140198321A1
公开(公告)日：2014-07-17
申请号：US14240669
申请日：2012-07-27
申请人： Masaaki Ito , Takahiro Jingu , Hisashi Hatano
发明人： Masaaki Ito , Takahiro Jingu , Hisashi Hatano
IPC分类号： G01B11/24 , G01N21/55
CPC分类号： G01B11/303 , G01B11/24 , G01B2210/56 , G01N21/4738 , G01N21/55 , G01N21/9501 , G01N2201/12
摘要： In related art, consideration is not given to that a spatial distribution of scattered light changes in various direction such as forward/backward/sideways according to a difference in micro roughness. Particularly, although a step-terrace structure appearing on an epitaxial growth wafer produces anisotropy in the scattered light distribution, consideration is not given to this point in the related art. The invention includes a process in which light is illuminated to a sample surface, plural detection optical systems mutually different in directions of optical axes detect a spatial distribution of scattered light, and a spatial frequency spectrum of the sample surface is calculated.
摘要翻译：在现有技术中，不考虑散射光的空间分布根据微粗糙度的差异而在各种方向如前后/侧面变化。特别地，虽然出现在外延生长晶片上的台阶平台结构在散射光分布中产生各向异性，但是在现有技术中没有考虑到这一点。本发明包括将光照射到样品表面的方法，在光轴方向上彼此不同的多个检测光学系统检测散射光的空间分布，并且计算样品表面的空间频谱。

10. 发明申请

US20130286387A1 DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE 有权
标题翻译：缺陷检查方法和缺陷检查装置
公开(公告)号：US20130286387A1
公开(公告)日：2013-10-31
申请号：US13996613
申请日：2011-11-25
申请人： Masami Makuuchi , Takahiro Jingu
发明人： Masami Makuuchi , Takahiro Jingu
IPC分类号： G01N21/95
CPC分类号： G01N21/9501
摘要： When the intensity of scattering light from a defect on a sample becomes very low according to the diameter of the defect, the dark noise from a sensor device itself accounts which a large proportion of the detected signal outputted from the sensor and thus it is difficult to detect minute defects. Furthermore, since a laser light source is pulsed into oscillation, pulse components from the laser light source are superimposed on the detected signal outputted from the sensor, and therefore it is difficult to detect defects with high accuracy. The present invention is a defect inspection device having irradiation means which producing pulsed operation and irradiating a surface of a sample with a laser beam, detection means which detecting scattering light generated at the surface of the sample in response to the irradiation provided by the irradiation means, and a processing portion which generating a delay signal based on the laser beam emitted by the irradiation means and processing the scattering light detected by the detection means using the delay signal.
摘要翻译：当来自样品的缺陷的散射光的强度根据缺陷的直径变得非常低时，来自传感器装置本身的暗噪声考虑到从传感器输出的检测信号的大部分，因此难以检测微小缺陷。此外，由于激光光源被脉冲振荡，所以来自激光光源的脉冲成分叠加在从传感器输出的检测信号上，因此难以高精度地检测出缺陷。本发明是一种具有产生脉冲操作并用激光束照射样品表面的照射装置的检测装置，检测装置响应于由照射装置提供的照射而检测在样品表面产生的散射光以及处理部，其基于由照射装置发射的激光束产生延迟信号，并使用延迟信号处理由检测装置检测到的散射光。

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