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1. 发明申请

US20100065310A1 METHOD FOR MANUFACTURING METALLIZED CERAMIC SUBSTRATE CHIP 审中-公开
标题翻译：用于制造金属化陶瓷衬底芯片的方法
公开(公告)号：US20100065310A1
公开(公告)日：2010-03-18
申请号：US12516394
申请日：2007-11-29
申请人： Yasuyuki Yamamoto , Kouichi Yamamoto , Masakatsu Maeda
发明人： Yasuyuki Yamamoto , Kouichi Yamamoto , Masakatsu Maeda
IPC分类号： H05K1/03 , H01R43/00
CPC分类号： H05K3/0052 , H01L23/13 , H01L2924/0002 , H05K1/0306 , H05K2201/09036 , H05K2201/0909 , H05K2203/0228 , Y10T29/49117 , Y10T29/49124 , H01L2924/00
摘要： A method for manufacturing a substrate chip including the steps of: setting the thickness of at least a part of a metal wiring pattern unit provided on the raw substrate to be 0.1 μm to 5 μm; forming a groove for creating at least a crack in the surface of the ceramic substrate along a planned cutting line which passes through the part of the metal wiring pattern unit by using a cutting wheel having a cutter blade being formed into substantially V shape in cross section along the circumferential portion of the disk rotating wheel; and cutting the raw substrate by giving load from just behind of the groove. When manufacturing metallized ceramic substrate chips by cutting (dividing) the ceramic substrate on the surface of which wiring patterns made of a metal film is formed, the method is capable of effectively using the base material, inhibiting defects in the metallized portion, and efficiently manufacturing the substrate chips in high yield.
摘要翻译：一种用于制造衬底芯片的方法，包括以下步骤：将设置在原始衬底上的金属布线图案单元的至少一部分的厚度设定为0.1μm至5μm; 形成用于沿着规划的切割线在陶瓷基板的表面中至少形成裂纹的槽，该切割线穿过金属布线图案单元的一部分，通过使用具有切割刀的切割轮，该切割轮具有大致V形截面沿着盘旋转轮的圆周部分; 并通过从凹槽的后面施加载荷来切割原始基底。当通过在形成由金属膜制成的布线图案的表面上切割（分割）陶瓷基板来制造金属化陶瓷基板芯片时，该方法能够有效地使用基材，抑制金属化部分中的缺陷并有效地制造基片芯片产量高。

2. 发明授权

US08128870B2 Drug discovery screening apparatus 失效
标题翻译：药物发现筛选仪
公开(公告)号：US08128870B2
公开(公告)日：2012-03-06
申请号：US12704865
申请日：2010-02-12
申请人： Taichirou Nedu , Kouichi Yamamoto , Takayuki Kei , Toshiyuki Suzuki
发明人： Taichirou Nedu , Kouichi Yamamoto , Takayuki Kei , Toshiyuki Suzuki
IPC分类号： G01N35/02 , G01N35/04
CPC分类号： G01N35/02 , G01N35/0099 , G01N35/028 , G01N2035/042 , G01N2035/0462 , G01N2035/0465 , Y10T436/113332 , Y10T436/114165
摘要： A drug discovery screening apparatus improves a testing operation efficiency. The drug discovery screening apparatus comprises an image measurement unit, an incubator unit integrally connected to the image measurement unit, a fixed stage disposed at the incubator unit, first conveyance for taking out one of plates stored in a carousel of the incubator unit and conveying the plate onto the fixed stage, second conveyance for taking out the plate conveyed onto the fixed stage and conveying the plate onto an XY stage disposed at the image measurement unit, and a control unit. The second conveyance comprises first and second conveyance arms, respectively supported horizontally by a conveyance unit support section, which convey the plates onto the fixed stage and XY stage so as to allow the respective plates to cross each other.
摘要翻译：药物发现筛选装置提高了检测操作的效率。药物发现筛选装置包括图像测量单元，与图像测量单元一体连接的培养箱单元，设置在培养器单元的固定台，用于取出存储在培养箱单元的转盘中的板之一，并输送将板移动到固定台上，第二传送装置用于取出传送到固定台上的板，并将板传送到设置在图像测量单元上的XY台上，以及控制单元。第二输送装置包括第一和第二输送臂，分别由输送单元支撑部分水平地支撑，该输送臂将板传送到固定台和XY台上，以允许相应的板彼此交叉。

3. 发明授权

US07598497B2 Charged particle beam scanning method and charged particle beam apparatus 有权
标题翻译：带电粒子束扫描法和带电粒子束装置
公开(公告)号：US07598497B2
公开(公告)日：2009-10-06
申请号：US11892332
申请日：2007-08-22
申请人： Kouichi Yamamoto , Kaneo Kageyama
发明人： Kouichi Yamamoto , Kaneo Kageyama
IPC分类号： H01J37/26
CPC分类号： H01J37/265 , H01J37/222 , H01J37/28 , H01J2237/1536 , H01J2237/2809 , H01J2237/2817 , H01J2237/2826
摘要： A method and an apparatus for calculating a scan signal so that the scan region becomes a scan region which is based on magnification ratio between desired magnification in a scan-line interval direction and desired magnification in a scan-line direction, and performing a calculation for rotating the scan direction with respect to the scan signal in order to suppress a distortion which is caused to occur when the technology where the scan direction of a charged particle beam is rotated is applied to the technology where the charged particle beam is scanned such that the scan-line interval is enlarged.
摘要翻译：一种用于计算扫描信号的方法和装置，使得扫描区域变为基于扫描线间隔方向上的期望倍率与扫描线方向上的期望倍率之间的倍率的扫描区域，并且对扫描区域进行计算相对于扫描信号旋转扫描方向，以便在将带电粒子束的扫描方向旋转的技术应用于扫描带电粒子束的技术时，抑制发生的变形，使得扫描线间隔被放大。

4. 发明授权

US07194362B2 Switching circuit and individual voltmeter apparatus 有权
标题翻译：开关电路和个别电压表装置
公开(公告)号：US07194362B2
公开(公告)日：2007-03-20
申请号：US11085196
申请日：2005-03-22
申请人： Satoshi Ishikawa , Kouichi Yamamoto
发明人： Satoshi Ishikawa , Kouichi Yamamoto
IPC分类号： G01R15/00 , G01R19/00 , G05F1/00
CPC分类号： G01R19/2503 , G01R31/3658
摘要： It is an object to provide an individual voltmeter apparatus utilizing a switching circuit which suppresses the variation of the consumption power of the unit cell of a set of batteries. The power supply of a first current path 2m1 and a second current path 2m2 of a level shift circuit 2m is between the unit cell Vm+1 and V1, and between the unit cell Vm+1 and one lower rank cell Vm, respectively. The same current, which responds to all semiconductor switches, flows in the first current path 2m1. In the second current path 2m2, a larger current is provided to the second current path in which the semiconductor switch is connected to the higher rank unit cell.
摘要翻译：本发明的目的是提供一种利用开关电路的单独的电压表装置，其抑制一组电池的单电池的消耗功率的变化。电平移位电路2 m的第一电流通路2 m 1和第二电流通路2 m 2的电源位于单元电池Vm + 1和V 1之间，单元电池Vm + 1和下一级之间细胞Vm。响应于所有半导体开关的相同电流在第一电流通路2 m 1中流动。在第二电流通路2m 2中，向半导体开关连接到较高级单元的第二电流通路提供较大的电流。

5. 发明授权

US5538691A Reaction vessel for optical measurement 失效
标题翻译：用于光学测量的反应容器
公开(公告)号：US5538691A
公开(公告)日：1996-07-23
申请号：US199155
申请日：1994-03-23
申请人： Kaori Tosa , Yoshiyuki Hama , Kouichi Yamamoto , Ryuuji Akiyama , Masakazu Yoshida , Hiroshi Yagi , Kazuhisa Shigemori , Tomomi Sakamoto
发明人： Kaori Tosa , Yoshiyuki Hama , Kouichi Yamamoto , Ryuuji Akiyama , Masakazu Yoshida , Hiroshi Yagi , Kazuhisa Shigemori , Tomomi Sakamoto
IPC分类号： B01L3/00 , G01N21/03 , G01N21/77
CPC分类号： G01N21/648 , B01L3/508 , G01N21/03 , G01N2021/7733
摘要： An apparatus for optical measurement is formed as a one-piece molding. The apparatus has a reaction vessel and pre-treatment vessels, at least part of the partitioning wall between the both serves as an optical waveguide body, and a light absorber vessel is formed adjacent the reaction vessel (24). Simplification of the process of manufacture thus is attained. With a light absorber accommodated in the light absorber vessel, (25), reaction components of excitation light and other noise light components that are propagated through the optical waveguide body can be sufficiently attenuated to improve the S/N ratio of the optical measurement.
摘要翻译： PCT No.PCT / JP93 / 00873 Sec。 371日期1994年3月23日 102（e）1994年3月23日PCT提交1993年6月25日PCT公布。公开号WO94 / 00761 日期1994年1月6日光学测量装置形成为一体成型。该装置具有反应容器和预处理容器，两者之间的分隔壁的至少一部分用作光波导体，并且在反应容器（24）附近形成光吸收容器。实现了简化制造过程。通过容纳在光吸收容器中的光吸收体（25），可以充分地衰减通过光波导体传播的激发光和其他噪声光成分的反应成分，以提高光学测量的S / N比。

6. 发明授权

US08203504B2 Image forming method and charged particle beam apparatus 有权
标题翻译：成像方法和带电粒子束装置
公开(公告)号：US08203504B2
公开(公告)日：2012-06-19
申请号：US12907912
申请日：2010-10-19
申请人： Atsushi Kobaru , Hidetoshi Morokuma , Hiroki Kawada , Sho Takami , Katsuhiro Sasada , Kouichi Yamamoto , Norio Satou , Kunio Nakanishi
发明人： Atsushi Kobaru , Hidetoshi Morokuma , Hiroki Kawada , Sho Takami , Katsuhiro Sasada , Kouichi Yamamoto , Norio Satou , Kunio Nakanishi
IPC分类号： G09G1/08
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/1536 , H01J2237/31749
摘要： An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.
摘要翻译：一种适于在用带电粒子束扫描二维区域时抑制充电倾斜的图像形成方法和带电粒子束装置。扫描位于第一扫描线和第二扫描线之间的第三扫描线。在扫描第一，第二和第三扫描线之后，在第一扫描线和第三扫描线之间以及第二和第三扫描线之间扫描多条扫描线。

7. 发明授权

US07817105B2 Image forming method and charged particle beam apparatus 有权
标题翻译：成像方法和带电粒子束装置
公开(公告)号：US07817105B2
公开(公告)日：2010-10-19
申请号：US11713687
申请日：2007-03-05
申请人： Atsushi Kobaru , Hidetoshi Morokuma , Hiroki Kawada , Sho Takami , Katsuhiro Sasada , Kouichi Yamamoto , Norio Satou , Kunio Nakanishi
发明人： Atsushi Kobaru , Hidetoshi Morokuma , Hiroki Kawada , Sho Takami , Katsuhiro Sasada , Kouichi Yamamoto , Norio Satou , Kunio Nakanishi
IPC分类号： G09G1/08 , G21K1/08
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/1536 , H01J2237/31749
摘要： An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.
摘要翻译：一种适于在用带电粒子束扫描二维区域时抑制充电倾斜的图像形成方法和带电粒子束装置。扫描位于第一扫描线和第二扫描线之间的第三扫描线。在扫描第一，第二和第三扫描线之后，在第一扫描线和第三扫描线之间以及第二和第三扫描线之间扫描多条扫描线。

8. 发明申请

US20070215374A1 Structure and method for stopping water in shielded electric wire 有权
标题翻译：屏蔽电线停水的结构及方法
公开(公告)号：US20070215374A1
公开(公告)日：2007-09-20
申请号：US11723225
申请日：2007-03-19
申请人： Hidehiro Ichikawa , Kouichi Yamamoto , Shigemi Hashizawa
发明人： Hidehiro Ichikawa , Kouichi Yamamoto , Shigemi Hashizawa
IPC分类号： H01R9/05
CPC分类号： H01R4/72 , H01B7/285 , Y02A30/14
摘要： To simply provide a water-stopping structures for shielded electric wire in the shielded portion of the wire at a low cost, a water stop structure in a shielded electric wire is comprised by stripping a sheath 4 of the shielded electric wire in the middle part thereof; permeating an adhesive into the exposed shield member 3; overlaying a heat shrinkable tube 12 over the shield member via hot melt 14; and heat shrinking the heat shrinkable tube 12 in a state where both ends of the heat shrinkable tube 12 are overlapped with the outer periphery of the sheath 4.
摘要翻译：为了以较低的成本简单地在屏蔽电线中提供屏蔽电线的防水结构，屏蔽电线中的防水结构包括通过在其中间部分剥离屏蔽电线的护套4 ; 将粘合剂渗透到暴露的屏蔽构件3中; 通过热熔体14将热收缩管12覆盖在屏蔽构件上; 并且在热收缩管12的两端与护套4的外周重叠的状态下热收缩热收缩管12。

9. 发明申请

US20070024528A1 IMAGE FORMING METHOD AND CHARGED PARTICLE BEAM APPARATUS 有权
标题翻译：图像形成方法和充电颗粒光束装置
公开(公告)号：US20070024528A1
公开(公告)日：2007-02-01
申请号：US11298590
申请日：2005-12-12
申请人： Atsushi Kobaru , Hidetoshi Morokuma , Hiroki Kawada , Sho Takami , Katsuhiro Sasada , Kouichi Yamamoto , Norio Satou , Kunio Nakanishi
发明人： Atsushi Kobaru , Hidetoshi Morokuma , Hiroki Kawada , Sho Takami , Katsuhiro Sasada , Kouichi Yamamoto , Norio Satou , Kunio Nakanishi
IPC分类号： G09G3/00
CPC分类号： H01J37/265 , H01J37/28 , H01J2237/1536 , H01J2237/31749
摘要： An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.
摘要翻译：一种适于在用带电粒子束扫描二维区域时抑制充电倾斜的图像形成方法和带电粒子束装置。扫描位于第一扫描线和第二扫描线之间的第三扫描线。在扫描第一，第二和第三扫描线之后，在第一扫描线和第三扫描线之间以及第二和第三扫描线之间扫描多条扫描线。

10. 发明申请

US20050073317A1 Insulation resistance drop detector and method of detecting state thereof 有权
标题翻译：绝缘电阻跌落检测器及其状态检测方法
公开(公告)号：US20050073317A1
公开(公告)日：2005-04-07
申请号：US10959503
申请日：2004-10-07
申请人： Kouichi Yamamoto , Satoshi Ishikawa , Kenji Uchida , Toshihiro Katsuta
发明人： Kouichi Yamamoto , Satoshi Ishikawa , Kenji Uchida , Toshihiro Katsuta
IPC分类号： G01R31/02 , B60L3/00 , G01R27/02 , G01R27/18 , G01R35/00 , G01R31/00
CPC分类号： G01R35/00 , G01R27/18 , G01R31/025
摘要： An insulation resistance drop detector 50 and a method of detecting a state of malfunction of the detector 50 are provided. When open of a coupling capacitor Co or malfunction of a low pass filter 53 is occurred, a time constant of the low pass filter 53 is decreased and a rising time of an output of the low pass filter 53 against an output of a pulse signal P1 becomes shorter than that in a state of normal. Thereby, malfunction of the detector 50 can be detected based on the output of the filter 53 corresponding to change of frequency of the pulse signal P1.
摘要翻译：提供绝缘电阻降检测器50和检测器50故障状态的方法。当耦合电容器Co断开或发生低通滤波器53的故障时，低通滤波器53的时间常数减小，低通滤波器53的输出的上升时间相对于脉冲信号P1 变得比正常情况下要短。因此，可以基于与脉冲信号P1的频率变化对应的滤波器53的输出来检测检测器50的故障。

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