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    • 2. 发明授权
    • Method for anodic oxidation
    • 阳极氧化方法
    • US5503730A
    • 1996-04-02
    • US407049
    • 1995-03-17
    • Nagato OsanoHirofumi MiyakiShiro Higashikozono
    • Nagato OsanoHirofumi MiyakiShiro Higashikozono
    • C25D11/04C25D21/12C25D11/02
    • C25D11/04C25D11/005C25D21/12
    • Disclosed are a method and an apparatus for forming a specular protective film in which the intensity of reflected light is made even with a variation in the angle of incidence of the incident light. In the anodic oxidation treatment, the current value applied to a plurality of specular parts is sampled at a predetermined interval (S301), and each sampled value is integrated over time (S302) and the average value is obtained. A comparison is made between an obtained average value and a preset value, and if the average value is greater, the application of current to all the specular parts is stopped (S303). The preset value is the amount of electricity conducted to form an anodic oxide film having a film thickness corresponding to a desired reflectance which is determined from the relation between the preset film thickness of anodic oxide film and the reflectance. Also, a process for checking to see whether or not the voltage produced by applying the current to each specular part at the start of anodic oxidation treatment is at a predetermined rise slope (S304 to S310), and a process for correcting the current applied to each specular part so as to be equal to the average value during the anodic oxidation treatment are provided (S311 to S315).
    • 公开了一种用于形成镜面保护膜的方法和装置,其中反射光的强度即使随着入射光的入射角的变化也被制成。 在阳极氧化处理中,以预定间隔对施加到多个镜面部分的电流值进行采样(S301),并且每个采样值随时间积分(S302),并获得平均值。 在获得的平均值和预设值之间进行比较,如果平均值较大,则停止向所有镜面部分施加电流(S303)。 预设值是形成具有对应于由阳极氧化膜的预设膜厚与反射率之间的关系确定的所需反射率的膜厚度的阳极氧化膜的导电量。 此外,检查在阳极氧化处理开始时通过对每个镜面部分施加电流而产生的电压是否处于预定的上升斜率的处理(S304〜S310),以及用于校正施加到 提供每个镜面部分以等于阳极氧化处理期间的平均值(S311至S315)。