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    • 4. 发明专利
    • Connection structure for semiconductor device and wiring board
    • 半导体器件和接线板的连接结构
    • JP2010267743A
    • 2010-11-25
    • JP2009116921
    • 2009-05-13
    • Mitsubishi Electric Corp三菱電機株式会社
    • NAKANO SEISHIISHIDA KAZUNORIYAMAGUCHI KAZUHIROTAKANO JIHEIMITANI JUN
    • H01L21/60H05K1/18
    • H01L2224/48091H01L2224/48137H01L2924/15184H01L2924/15311H01L2924/16152H01L2924/00014
    • PROBLEM TO BE SOLVED: To provide a BGA (Ball Grid Array) connection structure of high connection reliability.
      SOLUTION: The connection structure for a semiconductor device and wiring board is characterized in that a semiconductor device 1 is BGA connected to a wiring board (mounting substrate 10) with solder. The connection structure includes a stud pin 8, board pads (a first metal pad 7 and a second metal pad 11), and a fillet shape junction. The stud pin 8 is formed longer than a solder bump in the axial direction, and formed in a shape where the cross section at one end joined to the semiconductor device side and the cross section at the other end joined to the wiring board side become larger than the cross section at the central part. Each of the board pads is arranged at the semiconductor device side and the mounting substrate side respectively to join both ends of the stud pin 8, and has a size larger than both ends of the stud pin 8. The fillet shape junction is prepared between the stud pin 8, the semiconductor device 1, and the mounting substrate 10 by solder.
      COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供高连接可靠性的BGA(球栅阵列)连接结构。 解决方案:半导体器件和布线板的连接结构的特征在于,半导体器件1是通过焊料与布线板(安装基板10)连接的BGA。 连接结构包括螺柱销8,板焊盘(第一金属焊盘7和第二金属焊盘11)以及圆角形结。 螺柱销8在轴向上比焊料凸块形成得更长,并且形成为与半导体器件侧连接的一端的截面和另一端的与布线板侧接合的截面变大的形状 比中部的横断面。 每个板焊盘分别设置在半导体器件侧和安装基板侧,以连接螺柱销8的两端,并且具有大于螺柱销8的两端的尺寸。圆角形状接合部在 螺柱销8,半导体装置1和安装基板10。 版权所有(C)2011,JPO&INPIT
    • 7. 发明专利
    • OPTICAL ELEMENT MODULE
    • JP2000056184A
    • 2000-02-25
    • JP22398398
    • 1998-08-07
    • MITSUBISHI ELECTRIC CORP
    • NAKANO SEISHI
    • G02B6/42H01S5/00H01S5/30
    • PROBLEM TO BE SOLVED: To suppress degradation characteristics due to optical axis deviation at the time of YAG laser welding and caused by a temperature cycle test by joining a ferrule and a ferrule holder near both ends of the ferrule by the YAG laser welding. SOLUTION: This optical element module is composed of a light emitting element 1, a lens 2 for converging the light of the light emitting element 1, a holder 3 for holding the light emitting element 1 and the lens 2, an optical fiber 4 for transmitting the optical signals of the light emitting element 1 to the outside, a ferrule 5 for holding the optical fiber 4, the ferrule holder B6 for holding the ferrule 5 through YAG laser welding C10a and the through YAG laser welding D10b. That is, the vicinities of both ends of the ferrule are joined by the through YAG laser welding. Thus, the inclination of the ferrule 5 in the hole of the ferrule holder B6 is suppressed and they are joined without causing the optical axis deviation by the inclination of the ferrule 5. Thus, the optical element module for hardly causing characteristic degradation is easily formed.
    • 8. 发明专利
    • OPTICAL ELEMENT MODULE
    • JPH09230175A
    • 1997-09-05
    • JP3668796
    • 1996-02-23
    • MITSUBISHI ELECTRIC CORP
    • NAKANO SEISHI
    • G02B6/42
    • PROBLEM TO BE SOLVED: To make it possible to easily electrically insulate a photodetector and a holder by adhering and fixing this photodetector and this holder by means of an adhesive compounded with insulators, such as silica or plastic, in the form of beads. SOLUTION: A ring 3 which electrically insulates the photodetector 1 and the metallic holder 2 for holding the photodetector 1 is inserted between the photodetector 1 and the holder 2. The insulators 8, such as silica or plastic, in the form of beads are compounded with the adhesives 6 to adhere and fix both. Namely, the insulators 8, such as silica or plastic, in the form of beads which are compounded with the adhesive 6 at a compounding ratio of 1:1 at which the strength of adhesion is the same as that of only the adhesive and the insulation characteristic is good are held between the photodetector 1 and the holder 2 at the time of adhering the photodetector and the holder. As a result, there is no metallic contact of the photodetector 1 and the inside wall of the holder 2 and the easy electrical insulation and adhesion are attained even if the photodetector 1 is adhered deviatively to the holder 2.