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    • 4. 发明授权
    • Pedestal heat transfer and temperature control
    • 基座传热和温度控制
    • US07941039B1
    • 2011-05-10
    • US11851310
    • 2007-09-06
    • Krishnan ShrinivasanStephen V. GentilePeter WoytowitzSassan RohamGeorge KamianMichael Rivkin
    • Krishnan ShrinivasanStephen V. GentilePeter WoytowitzSassan RohamGeorge KamianMichael Rivkin
    • A21B2/00C23C16/00
    • C23C16/56H01L21/67103H01L21/67115
    • Provided herein are assemblies that, when coupled to an object, are capable of keeping the object at a uniform elevated temperature while removing large amounts of heat from an external source. Applications include various integrated circuit fabrication processes that use such external sources to expose wafers to radiation. In certain embodiments, the assemblies include a pedestal for supporting the wafer or other object. In certain embodiments, the assemblies include a calibrated heat resistance that allows heat be conducted away from the pedestal and wafer to maintain the desired set-point temperature. In certain embodiments, the pedestal may have one or more protrusions used to dissipate or transfer heat from the pedestal to a heat sink. Also, in certain embodiments, the pedestal surface is configured to have a spectral reflectivity of desired values in such way as to reflect the wavelengths that are emitted by an external radiant heat source.
    • 本文提供的是当与物体耦合时能够将物体保持在均匀升高的温度同时从外部源除去大量热量的组件。 应用包括使用这种外部源将晶片暴露于辐射的各种集成电路制造工艺。 在某些实施例中,组件包括用于支撑晶片或其它物体的基座。 在某些实施例中,组件包括校准的耐热性,其允许热量从基座和晶片导出以保持所需的设定点温度。 在某些实施例中,基座可以具有用于将热量从基座散热或传递到散热器的一个或多个突起。 而且,在某些实施例中,基座表面被配置为具有期望值的光谱反射率,以便反射由外部辐射热源发射的波长。