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1. 发明授权

US06826114B2 Data path reset circuit using clock enable signal, reset method, and semiconductor memory device including the data path reset circuit and adopting the reset method 有权
标题翻译：使用时钟使能信号，复位方式的数据路径复位电路和包括数据路径复位电路的半导体存储器件，并采用复位方法
公开(公告)号：US06826114B2
公开(公告)日：2004-11-30
申请号：US10624783
申请日：2003-07-22
申请人： Jung-bae Lee , Won-chang Jung
发明人： Jung-bae Lee , Won-chang Jung
IPC分类号： G11C800
CPC分类号： G11C7/1057 , G11C7/1051 , G11C7/1069 , G11C7/1078 , G11C7/1096
摘要： Provided are a reset circuit of a data path using a clock enable signal, a reset method and a semiconductor memory device having the reset circuit. The reset circuit includes an external voltage detector and a second reset signal generator, in which the second reset signal is used to reset a block related to a data path of the semiconductor memory device. The external voltage detector detects the level of an external voltage and generates a first reset signal. The second reset signal generator performs a logical sum of an external signal, which is externally input, and the first reset signal, and generates a second reset signal. The first reset signal is used to reset blocks other than the blocks related to the data path. The external signal is a clock enable signal. In the soft reset, the blocks related to the data path are reset using the external signal which is applied at a certain level. Thus, data conflicts or ineffective data can be prevented in executing operations according to the read/write commands which are applied after the soft reset.
摘要翻译：提供了使用时钟使能信号的数据路径的复位电路，复位方法和具有复位电路的半导体存储器件。复位电路包括外部电压检测器和第二复位信号发生器，其中第二复位信号用于复位与半导体存储器件的数据路径有关的块。外部电压检测器检测外部电压的电平并产生第一复位信号。第二复位信号发生器执行外部输入的外部信号与第一复位信号的逻辑和，并产生第二复位信号。第一复位信号用于复位与数据路径相关的块以外的块。外部信号是时钟使能信号。在软复位中，与数据通路相关的模块使用外部信号进行复位，该外部信号以一定的电平施加。因此，根据在软复位之后应用的读/写命令执行操作时，可以防止数据冲突或无效数据。

2. 发明授权

US06992905B2 High voltage generator having separate voltage supply circuit 失效
标题翻译：高压发生器具有单独的电压供应电路
公开(公告)号：US06992905B2
公开(公告)日：2006-01-31
申请号：US10885796
申请日：2004-07-08
申请人： Won-chang Jung
发明人： Won-chang Jung
IPC分类号： H02M3/18
CPC分类号： G11C5/145 , H02M3/07
摘要： A high voltage generation circuit comprises a first boosting unit, a second boosting unit, a delay circuit which delays the output of the first boosting unit as applied the second boosting unit, a pre-charge unit, and switch units which connect respective nodes in response to control signals. A voltage supply circuit is also provided that converts an externally supplied power source voltage (VCC) to a predetermined pre-charge voltage (VPP2).
摘要翻译：高电压发生电路包括第一升压单元，第二升压单元，延迟电路，其延迟施加第二升压单元的第一升压单元的输出，预充电单元以及响应于连接各个节点的开关单元控制信号。还提供一种电压供应电路，其将外部提供的电源电压（VCC）转换为预定的预充电电压（VPP 2）。

3. 发明申请

US20050099830A1 High voltage generator having separate voltage supply circuit 失效
标题翻译：高压发生器具有单独的电压供应电路
公开(公告)号：US20050099830A1
公开(公告)日：2005-05-12
申请号：US10885796
申请日：2004-07-08
申请人： Won-chang Jung
发明人： Won-chang Jung
IPC分类号： G11C5/14 , H02M3/07 , H02M3/18
CPC分类号： G11C5/145 , H02M3/07
摘要： A high voltage generation circuit comprises a first boosting unit, a second boosting unit, a delay circuit which delays the output of the first boosting unit as applied the second boosting unit, a pre-charge unit, and switch units which connect respective nodes in response to control signals. A voltage supply circuit is also provided that converts an externally supplied power source voltage (VCC) to a predetermined pre-charge voltage (VPP2).
摘要翻译：高电压发生电路包括第一升压单元，第二升压单元，延迟电路，其延迟施加第二升压单元的第一升压单元的输出，预充电单元以及响应于连接各个节点的开关单元控制信号。还提供一种电压供应电路，其将外部提供的电源电压（VCC）转换为预定的预充电电压（VPP 2）。

4. 发明授权

US07460418B2 Semiconductor memory device for stack package and read data skew control method thereof 有权
标题翻译：半导体存储器件，用于堆栈封装和读取数据偏移控制方法
公开(公告)号：US07460418B2
公开(公告)日：2008-12-02
申请号：US11746734
申请日：2007-05-10
申请人： Won-chang Jung , Hi-choon Lee
发明人： Won-chang Jung , Hi-choon Lee
IPC分类号： G11C8/00
CPC分类号： G11C7/1051 , G11C7/1057 , G11C7/1066 , G11C7/22 , G11C7/222 , G11C2207/105 , H01L2224/14181 , H01L2224/16145
摘要： A semiconductor memory device and a read data skew control method thereof, in which a point of time when read data is output can he controlled using pad bonding in stack packages. The semiconductor memory device includes a bonding option pad and a delay control circuit that controls the point of time when data is output from an output buffer depending on logic states of a signal applied to the bonding option pad. Thus, when using the semiconductor memory device in stack packages, the read data skew generated as a result of a load on a bonding wire can be compensated by connecting the bonding option pad to ground voltage or a supply voltage.
摘要翻译：在半导体存储器件及其读出数据偏移控制方法中，可以使用堆叠封装中的焊盘接合来控制读出数据被输出的时间点。半导体存储器件包括接合选择焊盘和延迟控制电路，该延迟控制电路根据施加到焊接选择焊盘的信号的逻辑状态来控制数据从输出缓冲器输出的时间点。因此，当在堆叠封装中使用半导体存储器件时，可以通过将焊接选择焊盘连接到接地电压或电源电压来补偿由于接合线上的负载而产生的读取数据偏斜。

5. 发明申请

US20080043548A1 SEMICONDUCTOR MEMORY DEVICE FOR STACK PACKAGE AND READ DATA SKEW CONTROL METHOD THEREOF 有权
标题翻译：用于堆叠封装的半导体存储器件及其数据读取控制方法
公开(公告)号：US20080043548A1
公开(公告)日：2008-02-21
申请号：US11746734
申请日：2007-05-10
申请人： Won-chang Jung , Hi-choon Lee
发明人： Won-chang Jung , Hi-choon Lee
IPC分类号： G11C7/00
CPC分类号： G11C7/1051 , G11C7/1057 , G11C7/1066 , G11C7/22 , G11C7/222 , G11C2207/105 , H01L2224/14181 , H01L2224/16145
摘要： A semiconductor memory device and a read data skew control method thereof, in which a point of time when read data is output can he controlled using pad bonding in stack packages. The semiconductor memory device includes a bonding option pad and a delay control circuit that controls the point of time when data is output from an output buffer depending on logic states of a signal applied to the bonding option pad. Thus, when using the semiconductor memory device in stack packages, the read data skew generated as a result of a load on a bonding wire can be compensated by connecting the bonding option pad to ground voltage or a supply voltage.
摘要翻译：在半导体存储器件及其读出数据偏移控制方法中，可以使用堆叠封装中的焊盘接合来控制读出数据被输出的时间点。半导体存储器件包括接合选项焊盘和延迟控制电路，该延迟控制电路根据施加到焊接选项焊盘的信号的逻辑状态来控制数据从输出缓冲器输出的时间点。因此，当在堆叠封装中使用半导体存储器件时，可以通过将焊接选择焊盘连接到接地电压或电源电压来补偿由于接合线上的负载而产生的读取数据偏斜。

6. 发明授权

US06982917B2 DRAM partial refresh circuits and methods 有权
标题翻译： DRAM部分刷新电路和方法
公开(公告)号：US06982917B2
公开(公告)日：2006-01-03
申请号：US10192406
申请日：2002-07-10
申请人： Yun-sang Lee , Won-chang Jung
发明人： Yun-sang Lee , Won-chang Jung
IPC分类号： G11C7/00
CPC分类号： G11C11/406
摘要： Circuits and methods for refreshing memory banks in a DRAM are provided. A refresh circuit is provided in a DRAM having at least one memory bank and a plurality of word lines connected to memory locations in the memory bank. The word lines are subdivided into first and second groups of subword lines. The refresh circuit includes a delay circuit, a first driving circuit, and a second driving circuit. The delay circuit receives a refresh signal and outputs a delayed refresh signal a predetermined time delay later. The first driving circuit responds to the refresh signal by driving word lines in the first group of subword lines and the second driving circuit responds to the delayed refresh signal by driving word lines in the second group of subword lines.
摘要翻译：提供了用于刷新DRAM中的存储体的电路和方法。在具有至少一个存储体和连接到存储体中的存储器位置的多条字线的DRAM中提供刷新电路。字线被细分为第一和第二组子字线。刷新电路包括延迟电路，第一驱动电路和第二驱动电路。延迟电路接收刷新信号并且稍后在预定的时间延迟中输出延迟的刷新信号。第一驱动电路通过驱动第一组子字线中的字线来响应刷新信号，并且第二驱动电路通过驱动第二组子字线中的字线来响应延迟的刷新信号。

7. 发明授权

US06819623B2 Integrated circuit memory devices having efficient column select signal generation during normal and refresh modes of operation and methods of operating same 失效
标题翻译：在正常和刷新操作模式期间产生有效的列选择信号的集成电路存储器件及其操作方法
公开(公告)号：US06819623B2
公开(公告)日：2004-11-16
申请号：US10392413
申请日：2003-03-19
申请人： Won-chang Jung
发明人： Won-chang Jung
IPC分类号： G11C808
CPC分类号： G11C11/406 , G11C11/4087
摘要： An integrated circuit memory device includes an XY array of memory cell sub-blocks and row and column decoder circuitry that is electrically coupled to the array. The array includes first and second offset grids of sub-word line driver control circuits therein, with each of the sub-word line driver control circuits configured to selectively activate a pair of the memory cell sub-blocks in response to a respective pair of active row and column select signals. In order to improve power consumption requirements when switching back and fourth between normal and refresh modes of operation, the row and column decoder circuitry is configured to drive a selected one of a plurality of row select lines associated with the first grid with an asserted row select signal and a plurality of column select lines associated with the second grid with asserted column select signals during a write operation.
摘要翻译：集成电路存储器件包括存储单元子块的XY阵列和电耦合到阵列的行和列解码器电路。阵列包括其中的子字线驱动器控制电路的第一和第二偏移栅格，其中每个子字线驱动器控制电路被配置为响应于相应的一对有效的选择性地激活一对存储器单元子块行和列选择信号。为了在正常操作和刷新操作模式之间切换回切换和第四切换时提高功耗要求，行和列解码器电路被配置为用断言的行选择来驱动与第一格栅相关联的多个行选择线中的所选择的一行信号以及在写入操作期间与具有断言的列选择信号的第二格栅相关联的多个列选择线。

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