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    • 7. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US5546346A
    • 1996-08-13
    • US354124
    • 1994-12-06
    • Masashi AgataKazuhiro MatsuyamaHironori AkamatsuHirohito KikukawaAkihiro SawadaShunichi Iwanari
    • Masashi AgataKazuhiro MatsuyamaHironori AkamatsuHirohito KikukawaAkihiro SawadaShunichi Iwanari
    • G11C11/409G11C7/10G11C11/407G11C7/00
    • G11C7/1072
    • In a synchronous DRAM required to be capable of performing high-speed consecutive operations in synchronism with a clock signal, a DBI-line pair is connected between a DQ-line pair and an RDB-line pair, and pipeline operation whose single cycle time is divided into four periods is employed. This S-DRAM has following: a first precharge circuit for precharging or voltage-equalizing the DQ-line pair to a power supply voltage level in the first and forth periods only; a second precharge circuit for voltage-equalizing the DBI-line pair to a ground voltage level in the first and second periods only; a third precharge circuit for voltage-equalizing the RDB-line pair to the power supply voltage level in the first and second periods only; first and second differential amplifiers for transmitting data on the DQ lines onto the DBI lines in the third period and for holding the data on the DBI lines in the fourth period; and a third differential amplifier which transmits the data on the DBI lines onto the RDB lines in the third period and which holds the data on the RDB lines in the fourth period.
    • 在需要与时钟信号同步执行高速连续操作的同步DRAM中,DBI线对连接在DQ线对和RDB线对之间,其流水线操作的单周期时间为 分为四个阶段。 该S-DRAM具有以下:第一预充电电路,用于仅在第一和第四周期中将DQ线对预充电或电压均衡至电源电压电平; 第二预充电电路,用于仅在第一和第二周期中将DBI线对对电压均衡至接地电压电平; 第三预充电电路,用于仅在第一和第二周期中将RDB线对对电压均衡至电源电压电平; 第一和第二差分放大器,用于在第三周期中将DQ线上的数据发送到DBI线上,并且用于在第四周期中将数据保存在DBI线上; 以及第三差分放大器,其在第三周期中将DBI线上的数据发送到RDB线上,并且在第四周期中将数据保存在RDB线上。
    • 8. 发明授权
    • Semiconductor memory device having a prolonged data holding time
    • 半导体存储器件具有延长的数据保持时间
    • US5426601A
    • 1995-06-20
    • US184933
    • 1994-01-24
    • Masashi AgataHironori AkamatsuHirohito KikukawaAkihiro SawadaShunichi Iwanari
    • Masashi AgataHironori AkamatsuHirohito KikukawaAkihiro SawadaShunichi Iwanari
    • G11C5/14
    • G11C5/147G11C5/143
    • An external power supply voltage V.sub.CC is applied to a peripheral circuit as a first internal power supply voltage V.sub.PERI. A power supply voltage control circuit outputs a voltage control signal V.sub.SIG of a high logic level if V.sub.CC is not greater than a low limit voltage V.sub.0L in a voltage range specified by VCC recommended operating conditions, otherwise it outputs V.sub.SIG of a low logic level. A power supply circuit applies a second internal power supply voltage V.sub.W and a third internal power supply voltage V.sub.WORD to a memory cell section. V.sub.W is equal to V.sub.PERI if V.sub.SIG is HIGH, while on the other hand V.sub.W is a voltage as a result of boosting V.sub.PERI. V.sub.WORD is a voltage as a result of boosting VW to a further extent. A row decoder sends out V.sub.W onto an enable signal line of a row of sense amplifiers, and V.sub.WORD onto a word line of a memory cell array so that V.sub.W becomes a high-logic-level data write voltage to a memory cell. This adequately prolongs the data-holding time with no sacrifice in memory cell voltage resistance.
    • 外部电源电压VCC作为第一内部电源电压VPERI施加到外围电路。 如果VCC在VCC推荐工作条件下规定的电压范围内VCC不大于下限电压V0L,则电源电压控制电路输出高逻辑电平的电压控制信号VSIG,否则输出低逻辑电平的VSIG。 电源电路将第二内部电源电压VW和第三内部电源电压VWORD施加到存储单元部分。 如果VSIG为高电平,则VW等于VPERI,而另一方面,VW是VPERI升压的电压。 VWORD是由于将VW进一步升高而产生的电压。 行解码器将VW发送到一行读出放大器的使能信号线上,并将VWORD发送到存储单元阵列的字线上,以使VW成为存储单元的高逻辑电平数据写入电压。 这样就可以在不牺牲存储单元耐压的情况下充分延长数据保持时间。
    • 9. 发明授权
    • Circuit redundancy having a variable impedance circuit
    • 具有可变阻抗电路的电路冗余
    • US5396124A
    • 1995-03-07
    • US128726
    • 1993-09-30
    • Akihiro SawadaHiroyuki Yamauchi
    • Akihiro SawadaHiroyuki Yamauchi
    • G11C29/00H03K19/003
    • G11C29/80G11C29/808G11C29/83G11C29/84G11C29/846
    • In a semiconductor memory having a redundant circuit, a plurality of first normal cells and a plurality of first spare cells are connected to a first pair of data lines, and a plurality of second normal cells and a plurality of second spare cells are connected to a second pair of data lines. Both pairs of data lines are connected to an output data line through a selecting amplifier. A normal cell is selected based on a combination of NGWL1, NGWL2, . . . with BLK1, BLK2, both NGWL1, NGWL2, . . . and BLK1, BLK2 being supplied from a decoder, and a spare cell is selected based on a combination of the BLK1, BLK2 supplied from the decoder with SGWL1, SGWL2, . . . supplied from a redundancy judging circuit. A second spare cell is selected when a first normal cell is selected, and a first spare cell is selected when a second normal cell is selected. Only at the time when a spare address is entered, one of the SGWL1, SGWL 2, . . . is raised. This not only achieves a high-speed reading and a high defect-relief rate, but also reduces the current consumption and the chip area.
    • 在具有冗余电路的半导体存储器中,多个第一正常单元和多个第一备用单元连接到第一对数据线,并且多个第二正常单元和多个第二备用单元连接到 第二对数据线。 两对数据线通过选择放大器连接到输出数据线。 基于NGWL1,NGWL2的组合选择正常单元格。 。 。 与BLK1,BLK2,NGWL1,NGWL2,。 。 。 并且从解码器提供BLK1,BLK2,并且基于从解码器提供的BLK1,BLK2与SGWL1,SGWL2组合来选择备用单元。 。 。 从冗余判断电路提供。 当选择第一正常小区时选择第二备用小区,并且当选择第二正常小区时选择第一备用小区。 只有在输入备用地址时,SGWL1,SGWL 2, 。 。 被提高 这不仅实现了高速读数和高缺陷缓解率,而且降低了电流消耗和芯片面积。
    • 10. 发明申请
    • Piezoactuator drive detection device and electronic device
    • 压电驱动器检测装置和电子装置
    • US20070001547A1
    • 2007-01-04
    • US11476057
    • 2006-06-28
    • Akihiro Sawada
    • Akihiro Sawada
    • H01L41/09
    • G04C3/12G04C17/0058H02N2/0025H02N2/004H02N2/026H02N2/062H02N2/103H02N2/142
    • To provide a drive detection means for a piezoelectric actuator that can detect an amount driven without requiring adding an encoder or other component while also preventing increasing the load. A rotor is disposed eccentrically to the axis of rotation to change the pressure applied from the rotor to a contact part as the rotor is driven. When the pressure changes, the amplitude of the detection signal output from the detection electrode 18 of the piezoelectric element changes in conjunction with rotor rotation, and how much the rotor has been driven can be detected by detecting the amplitude change. Size and thickness can therefore be reduced because providing an encoder, switch, or other component is unnecessary, and current consumption can also be reduced.
    • 提供一种用于压电致动器的驱动检测装置,该驱动器检测装置可以在不需要增加编码器或其他部件的同时也可以检测驱动量,同时也防止增加负载。 当转子被驱动时,转子偏心地设置在旋转轴上,以将从转子施加的压力改变为接触部分。 当压力变化时,从压电元件的检测电极18输出的检测信号的振幅与转子旋转一起变化,并且可以通过检测振幅变化来检测转子多少。 因此,由于不需要提供编码器,开关或其他部件,因此可以减小尺寸和厚度,并且还可以减少电流消耗。