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    • 7. 发明授权
    • Electronic logic to enhance switch reliability in detecting openings and
closures of redundant switches
    • 用于提高开关可靠性的电子逻辑,用于检测冗余开关的开关和闭合
    • US4626708A
    • 1986-12-02
    • US572338
    • 1984-01-20
    • James A. Cooper
    • James A. Cooper
    • G06F11/00G06F11/16H03K19/20H03K19/003G06F7/02H04L1/00
    • G06F11/0796G06F11/0751G06F11/16H03K19/20
    • A logic circuit is used to enhance redundant switch reliability. Two or more switches are monitored for logical high or low output. The output for the logic circuit produces a redundant and failsafe representation of the switch outputs. When both switch outputs are high, the output is high. Similarly, when both switch outputs are low, the logic circuit's output is low. When the output states of the two switches do not agree, the circuit resolves the conflict by memorizing the last output state which both switches were simultaneously in and produces the logical complement of this output state. Thus, the logic circuit of the present invention allows the redundant switches to be treated as if they were in parallel when the switches are open and as if they were in series when the switches are closed. A failsafe system having maximum reliability is thereby produced.
    • 逻辑电路用于增强冗余开关的可靠性。 监视两个或多个开关以进行逻辑高或低输出。 逻辑电路的输出产生交换机输出的冗余和故障保护表示。 当两个开关输出为高电平时,输出为高电平。 类似地,当两个开关输出都为低电平时,逻辑电路的输出为低电平。 当两个开关的输出状态不一致时,电路通过记忆两个开关同时处于最后的输出状态来解决冲突,并产生该输出状态的逻辑补码。 因此,本发明的逻辑电路允许冗余开关被当作开关处于并联状态,并且当开关闭合时它们是串联的。 由此产生具有最高可靠性的故障安全系统。
    • 9. 发明申请
    • METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE
    • 制造半导体器件的方法
    • US20110151649A1
    • 2011-06-23
    • US12961410
    • 2010-12-06
    • James A. CooperXiaokun Wang
    • James A. CooperXiaokun Wang
    • H01L21/20
    • H01L29/7395
    • A method for fabricating a semiconductor device includes forming a first semiconductor layer on a front side of the semiconductor substrate. Additional semiconductor layers may be formed on a font side of the first semiconductor layer. The substrate is subsequently removed. In some embodiments, one or more additional semiconductor layers may be formed on the back side of the first semiconductor layer after the semiconductor substrate has been removed. Additionally, in some embodiments, a portion of the first semiconductor layer is removed along with the semiconductor substrate. In such embodiments, the first semiconductor layer is subsequently etched to a known thickness. Source regions and device electrodes may be then be formed.
    • 一种制造半导体器件的方法包括在半导体衬底的前侧形成第一半导体层。 另外的半导体层可以形成在第一半导体层的字体侧上。 随后除去衬底。 在一些实施例中,在去除半导体衬底之后,可以在第一半导体层的背面上形成一个或多个附加的半导体层。 另外,在一些实施例中,第一半导体层的一部分与半导体衬底一起被去除。 在这样的实施例中,第一半导体层随后被蚀刻到已知的厚度。 然后可以形成源区和器件电极。