基本信息:
- 专利标题： 信号処理方法、信号処理装置、放射線検出装置、及びコンピュータプログラム
- 专利标题（英）：SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTION DEVICE, AND COMPUTER PROGRAM
- 申请号：PCT/JP2022/030812 申请日：2022-08-12
- 公开(公告)号：WO2023017866A1 公开(公告)日：2023-02-16
- 发明人： 村田 駿介 , ウ゛ァリーエウ゛ イルダール
- 申请人： 株式会社堀場製作所
- 申请人地址： 〒6018510 京都府京都市南区吉祥院宮の東町２番地 Kyoto
- 专利权人： 株式会社堀場製作所
- 当前专利权人： 株式会社堀場製作所
- 当前专利权人地址： 〒6018510 京都府京都市南区吉祥院宮の東町２番地 Kyoto
- 代理机构： 河野 英仁
- 优先权： JP2021-131966 2021-08-13
- 主分类号： G01T1/17
- IPC分类号： G01T1/17 ; G01N23/223
Provided are a signal processing method, a signal processing device, a radiation detection device, and a computer program that allow sufficient elimination of a sum peak from a spectrum of radiation. This signal processing method for processing a signal containing an answering wave to be generated in response to detection of radiation executes correction processing including: measuring a feature amount corresponding to a time for which the answering wave or an answering wave group formed by a plurality of answering waves continues; counting, for each wave height, the number of the answering waves or the answering wave groups containing the measured feature amount within a predetermined first range containing the feature amount of a single answering wave; and deducting a specific value from the counted number in accordance with the answering wave or the answering wave group not containing the feature amount within the first range.
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01T | 核辐射或X射线辐射的测量 |
| ------G01T1/00 | X射线辐射、γ射线辐射、微粒子辐射或宇宙线辐射的测量 |
| --------G01T1/16 | .辐射强度测量 |
| ----------G01T1/17 | ..专用型探测器以外的电路装置 |