基本信息:
- 专利标题： COMPUTED TOMOGRAPHY FOR NON-DESTRUCTIVE EVALUATION OF MANUFACTURED PARTS
- 申请号：PCT/US2020/034784 申请日：2020-05-28
- 公开(公告)号：WO2020251760A1 公开(公告)日：2020-12-17
- 发明人： MOHR, Luke , LEE, Yu, Hsuan , OKUDA, Nozomu , KITT, Alex
- 申请人： EDISON WELDING INSTITUTE, INC.
- 申请人地址： 1250 Arthur E. Adams Drive Columbus, OH 43221 US
- 专利权人： EDISON WELDING INSTITUTE, INC.
- 当前专利权人： EDISON WELDING INSTITUTE, INC.
- 当前专利权人地址： 1250 Arthur E. Adams Drive Columbus, OH 43221 US
- 代理机构： MILLER, Courtney, J. et al.
- 优先权： US16/438,619 20190612
- 主分类号： G01N23/04
- IPC分类号： G01N23/04 ; G01N23/046
摘要：
A method for using computed tomography for non-destructive evaluation of a part, comprising: providing a computed tomography system; loading predetermined computed tomography system setup information; customizing settings with predetermined algorithmic parameters and functions depending on part features; processing projection counts; processing prior knowledge data relevant to the part; creating masking data from the customized settings; pre-processing reconstruction results based on the customized settings; performing algorithmic adjustments based on prior knowledge data and part geometry; performing algorithm adjustments during iterations; and post-processing reconstruction results.
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料，例如X射线、中子 |
| --------G01N23/02 | .通过使辐射透过材料 |
| ----------G01N23/04 | ..并形成图像 |