An electronic prognostic and diagnostic system for determining infrared signature patterns emitted from electronic devices on circuit boards comprising a means for surveying and collecting infrared emission signature patterns emitted from each circuit assembly; at least one sensor array in communication with the means for surveying and collecting infrared emission signatures, each sensor array sensing and receiving infrared data information from the means for surveying and collecting infrared emission signatures, each sensor array generating current and voltage signals which are proportional to the infrared emission signatures thereby defining an infrared emission signature pattern; and electronic means for comparing and processing infrared data information, the electronic means for comparing and processing in electrical communication with each sensor array to receive the current and voltage signals, the electronic means for comparing and processing further including a means for resolving the location of the infrared signature pattern.