
基本信息:
- 专利标题: ATOMIC MAGNETOMETER SYSTEM
- 申请号:US17627401 申请日:2020-07-17
- 公开(公告)号:US20220260510A1 公开(公告)日:2022-08-18
- 发明人: Witold Chalupczak , Rafal Gartman , Patrick Bevington
- 申请人: NPL Management Limited , The University of Strathclyde
- 申请人地址: GB Teddington, Middlesex; GB Scotland
- 专利权人: NPL Management Limited,The University of Strathclyde
- 当前专利权人: NPL Management Limited,The University of Strathclyde
- 当前专利权人地址: GB Teddington, Middlesex; GB Scotland
- 优先权: GB1910213.6 20190717
- 国际申请: PCT/GB2020/051719 WO 20200717
- 主分类号: G01N24/00
- IPC分类号: G01N24/00 ; G01R33/26
摘要:
An atomic magnetometer system is disclosed that includes a variable magnetic field source (14) configured to provide an oscillating primary magnetic field to cause a sample (16) to produce a secondary magnetic field. The atomic magnetometer system also includes an atomic magnetometer for detecting the secondary magnetic field. The atomic magnetometer includes an atomic specimen, a pump and probe subsystem configured to pump the atomic specimen to create a polarisation and to probe atomic coherence precession within the atomic specimen with a probe beam, a detector configured to detect the probe beam to produce a detection signal. The system is configured to drive the variable magnetic field source (14) in dependence on the detection signal with a frequency tuned to rf resonance. A method of operating an atomic magnetometer is also disclosed.
公开/授权文献:
- US12044639B2 Atomic magnetometer system 公开/授权日:2024-07-23
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N24/00 | 利用核磁共振、电子顺磁共振或其他自旋效应来测试或分析材料 |