基本信息:
- 专利标题： AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- 申请号：US17591402 申请日：2022-02-02
- 公开(公告)号：US20220244289A1 公开(公告)日：2022-08-04
- 发明人： Jason Bemis , David Aue , Aleksander Labuda
- 申请人： Oxford Instruments Asylum Research, Inc.
- 申请人地址： US CA Goleta
- 专利权人： Oxford Instruments Asylum Research, Inc.
- 当前专利权人： Oxford Instruments Asylum Research, Inc.
- 当前专利权人地址： US CA Goleta
- 主分类号： G01Q20/02
- IPC分类号： G01Q20/02 ; G01Q30/02 ; G01Q60/42 ; G01Q10/06 ; G01Q30/04
摘要：
An atomic force microscope is provided having a controller configured to store one or more positional parameters output by a sensor assembly when a light spot is located at a first preset position on the surface of the cantilever. The controller is further configured to operate an actuator assembly so as to induce movement of the spot away from the first preset position, to detect said movement of the first spot based on a change in the one or more positional parameters output by the sensor assembly, and to operate an optical assembly in response to the detected movement of the first spot to return the first spot to the first preset position.
公开/授权文献:
- US11644478B2 Automated optimization of AFM light source positioning 公开/授权日：2023-05-09
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01Q | 扫描探针技术或设备；扫描探针技术的应用，例如，扫描探针显微术 |
| ------G01Q20/00 | 监测探针的运动或位置 |
| --------G01Q20/02 | .通过光学方法 |