![Optical inspection with alternating configurations](/abs-image/US/2006/03/30/US20060066843A1/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: Optical inspection with alternating configurations
- 专利标题(中):具有交替配置的光学检查
- 申请号:US11234492 申请日:2005-09-22
- 公开(公告)号:US20060066843A1 公开(公告)日:2006-03-30
- 发明人: Avishay Guetta , Doron Korngut , Doron Shoham , Iddo Pinkas , Ronen Eynat
- 申请人: Avishay Guetta , Doron Korngut , Doron Shoham , Iddo Pinkas , Ronen Eynat
- 主分类号: G01N21/88
- IPC分类号: G01N21/88
摘要:
An imaging system for inspection of a sample includes an illumination module, which irradiates a surface of the sample with pulsed optical radiation. A mechanical scanner translates at least one of the sample and part of the imaging system so as to scan an area irradiated by the pulsed optical radiation over the surface in order to irradiate successive, partially overlapping frames on the surface by respective successive pulses of the pulsed radiation. A collection module collects the optical radiation scattered from the surface so as to capture a sequence of images of the irradiated frames. A system controller varies a configuration of the imaging system in alternation between at least first and second different optical configurations in synchronization with the pulsed optical radiation.
摘要(中):
用于检查样品的成像系统包括照射模块,其照射具有脉冲光辐射的样品表面。 机械扫描器将成像系统的样本和部分中的至少一个平移以扫描由表面上的脉冲光辐射照射的区域,以便通过相应的连续的脉冲脉冲来照射表面上的连续的部分重叠的帧 辐射。 收集模块收集从表面散射的光辐射,以捕获被照射的帧的图像序列。 系统控制器与脉冲光辐射同步地在至少第一和第二不同光学配置之间交替地改变成像系统的配置。
公开/授权文献:
- US07397552B2 Optical inspection with alternating configurations 公开/授权日:2008-07-08
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N21/00 | 利用光学手段,即利用红外光、可见光或紫外光来测试或分析材料 |
--------G01N21/01 | .便于进行光学测试的装置或仪器 |
----------G01N21/88 | ..测试瑕疵、缺陷或污点的存在 |