发明专利
TWI280367B 無線固定器中力之支配的方法及裝置 METHOD AND APPARATUS FOR THE MANAGEMENT OF FORCES IN A WIRELESS FIXTURE
失效
基本信息:
- 专利标题: 無線固定器中力之支配的方法及裝置 METHOD AND APPARATUS FOR THE MANAGEMENT OF FORCES IN A WIRELESS FIXTURE
- 专利标题(英):Method and apparatus for the management of forces in a wireless fixture
- 专利标题(中):无线固定器中力之支配的方法及设备 METHOD AND APPARATUS FOR THE MANAGEMENT OF FORCES IN A WIRELESS FIXTURE
- 申请号:TW091132016 申请日:2002-10-28
- 公开(公告)号:TWI280367B 公开(公告)日:2007-05-01
- 发明人: 茄里夫‧亞利肯茄克 CHERIF AHRIKENCHEIKH , 茱莉L. 史達瑪 JULIE L. STAHMER
- 申请人: 安捷倫科技公司 AGILENT TECHNOLOGIES, INC.
- 申请人地址: 美國
- 专利权人: 安捷倫科技公司 AGILENT TECHNOLOGIES, INC.
- 当前专利权人: 安捷倫科技公司 AGILENT TECHNOLOGIES, INC.
- 当前专利权人地址: 美國
- 代理人: 惲軼群; 陳文郎
- 优先权: 美國 10/114,546 20020402
- 主分类号: G01R
- IPC分类号: G01R
The present invention is directed to a method and apparatus for balancing forces in a fixture and reducing forces in a probe plate housed in the fixture. A plurality of double-ended probes are positioned in the probe plate. A first bit, located at one of the double-ended probe is in contact with a board under test. A second oppositely disposed bit located on the other end of the double-ended probe is in contact with a wireless PCB. A spring runs the length of the double-ended probe and is in contact with the first bit and the second bit. As downward forces are applied from the board under test and upward forces are applied from the wireless PCB, the bits move downward and upward respectively and the spring compresses, alleviating/reducing forces in the probe plate. In addition, since the spring runs the length of the double ended probe and is in contact with both the first bit and the second bit, the downward forces coming from the board under test are balanced against the upward forces coming from the wireless PCB. The double-ended probe is press fitted into the probe plate with several concentric circles to restrict pivoting around an axis. Lastly, the probe plate includes a probe field designed to mate with the board under test. The double-ended probes placed in the probe plate are then in position to balance non-uniform forces coming from the board under test or the wireless PCB.