发明专利
TW201143975A 監控玻璃板拋光狀態之裝置與方法 APPARATUS AND METHOD FOR MONITORING GLASS PLATE POLISHING STATE
审中-公开
基本信息:
- 专利标题： 監控玻璃板拋光狀態之裝置與方法 APPARATUS AND METHOD FOR MONITORING GLASS PLATE POLISHING STATE
- 专利标题（英）：Apparatus and method for monitoring glass plate polishing state
- 专利标题（中）：监控玻璃板抛光状态之设备与方法 APPARATUS AND METHOD FOR MONITORING GLASS PLATE POLISHING STATE
- 申请号：TW100108277 申请日：2011-03-11
- 公开(公告)号：TW201143975A 公开(公告)日：2011-12-16
- 发明人： 文元載 , 吳亨泳 , 李大淵 , 宋在翊 , 金榮國 , 鄭圭澈 , 鄭賢哲
- 申请人： LG化學公司
- 申请人地址： LG CHEM, LTD. 南韓 KR
- 专利权人： LG化學公司
- 当前专利权人： LG化學公司
- 当前专利权人地址： LG CHEM, LTD. 南韓 KR
- 代理人： 吳冠賜; 楊慶隆; 蘇建太
- 优先权： 南韓 10-2010-0021658 20100311
- 主分类号： B24B
- IPC分类号： B24B
Disclosed are an apparatus and a method for monitoring a glass plate polishing state. The apparatus may include a location measuring unit for measuring a location on a glass plate being polished by a polishing machine, a current measuring unit for measuring an electric current flowing into the polishing machine, a memory unit for storing a reference value of the electric current flowing into the polishing machine for each polishing location of the glass plate, and a control unit for determining whether a polishing state is faulty, by comparing a value of the electric current measured by the current measuring unit for each polishing location measured by the location measuring unit with a corresponding reference value of the electric current stored in the memory unit for each polishing location.
公开/授权文献:
- TWI508819B 監控玻璃板拋光狀態之裝置與方法 公开/授权日：2015-11-21