基本信息:
- 专利标题: 검사장치 및 검사방법
- 专利标题(英):Apparatus and method for inspecting a printed circuit board
- 专利标题(中):检查印刷电路板的装置和方法
- 申请号:KR1020140086887 申请日:2014-07-10
- 公开(公告)号:KR1020150045358A 公开(公告)日:2015-04-28
- 发明人: 후카미요시유키
- 申请人: 가부시키가이샤 니혼 마이크로닉스
- 申请人地址: 일본 도쿄도 무사시노시 기치조지혼죠 *-*-*
- 专利权人: 가부시키가이샤 니혼 마이크로닉스
- 当前专利权人: 가부시키가이샤 니혼 마이크로닉스
- 当前专利权人地址: 일본 도쿄도 무사시노시 기치조지혼죠 *-*-*
- 代理人: 김명신; 박지하; 박장규; 김민철; 원석희; 이동기
- 优先权: JPJP-P-2013-217515 2013-10-18
- 主分类号: G01R31/02
- IPC分类号: G01R31/02 ; H05K3/00
Even if the capacitance of the wiring of a subject small, and provides the inspection apparatus and inspection method capable of performing a scan of a subject by the measurement of capacitance.
During the test device (1) and the substrate (2) consisting of insulating material, the substrate (2) capacitive electrode 3, a portion is exposed is installed in the substrate 2, to constitute a connection from the surface of the substrate 2, It has a common electrode 4 provided. Capacitive electrode 3 and the common electrode 4 are arranged spaced apart from each other has a parallel portion that is configured to be electrically isolated. Inspection device (1) it is combined in the gas 102 and the wiring board 101 of the inspection object having a wire 103 passing through it, connected to the connection portion of the one end of the wiring 103 and the capacitive electrode 3, and then, the wiring 103 of measuring the electrical capacitance between the common electrode and the other end (4) checks the wiring substrate 101.
公开/授权文献:
- KR101575968B1 검사장치 및 검사방법 公开/授权日:2015-12-08
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |
--------G01R31/02 | .对电设备、线路或元件进行短路、断路、泄漏或不正确连接的测试 |