基本信息:
- 专利标题： 반도체 소자 테스트용 소켓장치
- 专利标题（英）：Socket device for testing an IC
- 专利标题（中）：用于测试IC的插座设备
- 申请号：KR1020130075093 申请日：2013-06-28
- 公开(公告)号：KR101485779B1 公开(公告)日：2015-01-26
- 发明人： 황동원 , 황재석 , 황재백
- 申请人： 황동원 , 하이콘 주식회사 , 황재석 , 황재백
- 申请人地址： 경기도 성남시 분당구 두밀로***번길 ** (하산운동)
- 专利权人： 황동원,하이콘 주식회사,황재석,황재백
- 当前专利权人： 황동원,하이콘 주식회사,황재석,황재백
- 当前专利权人地址： 경기도 성남시 분당구 두밀로***번길 ** (하산운동)
- 代理人： 이은철; 이우영
- 主分类号： G01R31/26
- IPC分类号： G01R31/26 ; H01L21/66
The present invention is a semiconductor device test for the socket device in related to, in particular a semiconductor device of the terminal (lead) of the form in accordance BGA (Ball Grid Array) type and LGA (Land Grid Array) type semiconductor device, or BGA / LGA hybrid relates to a socket device capable of testing a semiconductor device, the roller in the latch tip to improve the latch structure for pressure fixing a semiconductor element provided due to the similar sandpaper surface and the sliding friction of the semiconductor element top surface to about 10 million times more than the number of times of testing hayeoseo minimize wear and there is an effect capable of extending the life of the socket device innovatively and increase the testing efficiency, reducing costs.
公开/授权文献:
- KR1020150002981A 반도체 소자 테스트용 소켓장치 公开/授权日：2015-01-08
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R31/00 | 电性能的测试装置；电故障的探测装置；以所进行的测试在其他位置未提供为特征的电测试装置 |
| --------G01R31/26 | .单个半导体器件的测试 |