基本信息:
- 专利标题: 반도체 제품 테스트 핸들러 및 반도체 제품 테스트 방법
- 专利标题(英):Apparatus for testing semiconductor product and method for testing semiconductor product
- 专利标题(中):测试半导体产品的设备和测试半导体产品的方法
- 申请号:KR1020130128221 申请日:2013-10-28
- 公开(公告)号:KR101481644B1 公开(公告)日:2015-01-15
- 发明人: 신종천 , 하동호
- 申请人: 신종천 , 하동호
- 申请人地址: 경기도 구리시 건원대로 **, ***동 ***호 (인창동, 삼보아파트)
- 专利权人: 신종천,하동호
- 当前专利权人: 신종천,하동호
- 当前专利权人地址: 경기도 구리시 건원대로 **, ***동 ***호 (인창동, 삼보아파트)
- 代理人: 김인한; 김희곤; 박용순
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; H01L21/66 ; H01L21/67
본 발명은, 개발 과정에서의 반도체 제품, 샘플로 소량 생산된 반도체 제품 등의 소규모 반도체 제품의 테스트에도 사용이 가능하고, 종래의 핸들러 대비 소형/저가로 제조가 가능하므로 고객의 다양한 니즈(needs)를 충족할 수 있다.
The present invention, semiconductor products comprises a product can implement to be accommodated a large number, and moves the plurality of semiconductor products accommodated in at least one portion of the product can implement is a blank state and the rest of the semiconductor product is accommodated state feed tray, feed tray, which includes a pick-Place, and pick Place a semiconductor tester for testing the products go by, if the test results of the testing of semiconductor products in the tester normal (Good), spaces for pick-and-play Suga test semiconductor products in relates to a semiconductor test handler product is located on the state of the product can implement.
The present invention can be used in the testing of small-scale semiconductor product with a small amount of the produced semiconductor products such as semiconductor products, the samples of the development process, and can be manufactured in a small / low-cost conventional handler contrast, because a variety of needs of customers (needs) the can be met.
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |
--------G01R31/26 | .单个半导体器件的测试 |