基本信息:
- 专利标题： 자동광학 검사장치
- 专利标题（英）：auto optical inspection system
- 专利标题（中）：自动光学检测系统
- 申请号：KR1020120078932 申请日：2012-07-19
- 公开(公告)号：KR101434637B1 公开(公告)日：2014-08-26
- 发明人： 임쌍근 , 고민성 , 강민구 , 이상윤 , 이현민
- 申请人： (주) 인텍플러스
- 申请人地址： 대전광역시 유성구 테크노*로 *** (탑립동)
- 专利权人： (주) 인텍플러스
- 当前专利权人： (주) 인텍플러스
- 当前专利权人地址： 대전광역시 유성구 테크노*로 *** (탑립동)
- 代理人： 특허법인 신지
- 主分类号： G01N21/88
- IPC分类号： G01N21/88 ; G01B11/00
The present invention is an automatic optical inspection system checks the property is secured is disclosed in accordance with the irradiated with different lights on the image frame to be superimposed in the course of the tests conducted nopyeojum the geomchulryeok. According to the invention, and the stage on which the object to be inspected is mounted, and a recording unit for photographing a target object mounted on the stage, and a lighting unit irradiating light to the target object, the relative position of the imaging unit and the object to be inspected , but modified to include a moving unit for linearly moving the stage or the recording unit, the moving speed of the mobile unit is set so that a part of the N-th image and the (N + 1) th image obtained by the photographing unit can be mutually nested.
公开/授权文献:
- KR1020140012341A 자동광학 검사장치 公开/授权日：2014-02-03
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N21/00 | 利用光学手段，即利用红外光、可见光或紫外光来测试或分析材料 |
| --------G01N21/01 | .便于进行光学测试的装置或仪器 |
| ----------G01N21/88 | ..测试瑕疵、缺陷或污点的存在 |