基本信息:
- 专利标题: 박막 표시 소자의 검사 수정 방법 및 검사 수정 장치
- 专利标题(英):Test correction method and apparatus of thin film display device
- 专利标题(中):薄膜显示装置的测试校正方法和装置
- 申请号:KR1020110131719 申请日:2011-12-09
- 公开(公告)号:KR101368150B1 公开(公告)日:2014-02-27
- 发明人: 나까오도시유끼 , 마루야마시게노부 , 가따오까후미오
- 申请人: 가부시키가이샤 히다치 하이테크놀로지즈
- 申请人地址: **-**, NISHISHINBASHI *-CHOME, MINATO-KU, TOKYO JAPAN
- 专利权人: 가부시키가이샤 히다치 하이테크놀로지즈
- 当前专利权人: 가부시키가이샤 히다치 하이테크놀로지즈
- 当前专利权人地址: **-**, NISHISHINBASHI *-CHOME, MINATO-KU, TOKYO JAPAN
- 代理人: 장수길; 박충범; 이중희
- 优先权: JPJP-P-2011-004234 2011-01-12
- 主分类号: H01L51/56
- IPC分类号: H01L51/56
The present invention, in the OLED panel of the color filter method, a single wavelength, but also as providing a check modifying and checking correcting device of a thin film display element, and can check and modify a high reliability, can improve the yield, a light-emitting layer a method and apparatus by formed on the metal electrode film and examine the state of light emission of the thin-film display device having a transparent electrode film formed on the metal electrode film and the side of the opposite of the light-emitting layer to correct the defective portions, the metal electrode and the electric power to the transparent electrode applied to and emitting a light emitting layer, observing the state of light emission of the light emitting layer from the side of the transparent electrode to the metal electrode to detect a position where it does not emit light in the light-emitting layer, based on the information of the position where it does not emit light in the detected light-emitting layer the laser irradiation from the side of the transparent electrode and the opposite electrode to the metal film was configured to remove the upper position of the metal electrodes do not emit light in the light emitting layer.
公开/授权文献:
- KR1020120081927A 박막 표시 소자의 검사 수정 방법 및 검사 수정 장치 公开/授权日:2012-07-20