基本信息:
- 专利标题： 비접촉식 발광다이오드 검사장치
- 专利标题（英）：Noncontact inspection apparatus for Light Emitting Diode
- 专利标题（中）：发光二极管非接触式检测装置
- 申请号：KR1020110118907 申请日：2011-11-15
- 公开(公告)号：KR101303602B1 公开(公告)日：2013-09-11
- 发明人： 이동호 , 안보혁
- 申请人： 주식회사 미르기술
- 申请人地址： 경기도 군포시 고산로 ***, 제***동 ***호 (당정동, SK 벤티움)
- 专利权人： 주식회사 미르기술
- 当前专利权人： 주식회사 미르기술
- 当前专利权人地址： 경기도 군포시 고산로 ***, 제***동 ***호 (당정동, SK 벤티움)
- 代理人： 손승철
- 主分类号： H01L21/66
- IPC分类号： H01L21/66
Non-contact type light emitting diode inspection apparatus according to an embodiment of the present invention is a device for after taking the light emitting diodes to the camera as compared to the pre-stored images the target image to determine the good or bad of light emitting diodes, the light emitting diode a stage unit for loading and fixing or transferring the light-emitting diode in the test position; Located on top of the stage portion, located in the said first illuminating the top and first illumination for irradiating the visible light of blue than the wavelength region in the light-emitting diode and a second illumination for irradiating the visible light of green wavelength region to the light emitting diode illuminating; Cameras located on top of the lighting unit, recording the image of the light emitting diode; Vision processing unit for reading an image taken by the camera to determine the good or bad of the light emitting diode; And a control unit comprising the stages and the motion controller for controlling the camera unit.
公开/授权文献:
- KR1020130053239A 비접촉식 발광다이오드 검사장치 公开/授权日：2013-05-23
信息查询:
EspacenetIPC结构图谱:
| H | 电学 |
| --H01 | 基本电气元件 |
| ----H01L | 半导体器件；其他类目未包含的电固体器件 |
| ------H01L21/00 | 专门适用于制造或处理半导体或固体器件或其部件的方法或设备 |
| --------H01L21/66 | .在制造或处理过程中的测试或测量 |