基本信息:
- 专利标题： 피시험 집적 회로용 예측, 적응성 전력 공급기
- 专利标题（英）：Predictive, adaptive power supply for an integrated circuit under test
- 专利标题（中）：预测，适用于测试中的集成电路的自适应电源
- 申请号：KR1020047011685 申请日：2003-01-29
- 公开(公告)号：KR101024872B1 公开(公告)日：2011-03-31
- 发明人： 엘드리지벤자민엔. , 밀러찰스에이.
- 申请人： 폼팩터, 인크.
- 申请人地址： **** Southfront Road, Livermore, CA ***** U.S.A.
- 专利权人： 폼팩터, 인크.
- 当前专利权人： 폼팩터, 인크.
- 当前专利权人地址： **** Southfront Road, Livermore, CA ***** U.S.A.
- 代理人： 신정건; 김태홍
- 优先权： US10/062,999 2002-01-30; US10/206,276 2002-07-25
- 国际申请： PCT/US2003/002581 2003-01-29
- 国际公布： WO2003065064 2003-08-07
- 主分类号： G01R31/319
- IPC分类号： G01R31/319
전력 공급기, DUT, 전류 펄스, 피드백, 클록 신호, 예측 신호, 적응 신호
Main power supply supplies current to the power terminal of the (DUT) integrated circuit devices during testing through the path impedance. Requires the DUT to the current at the power input terminal of the subsequent edge of the applied clock signal to the DUT during a test as the transistors in the IC switch in response to a clock signal edge to temporarily increase. In order to limit the variation (noise) of the voltage at the power input terminal, the auxiliary power supply will supply additional current pulse to the power input terminal so as to satisfy an increased demand during each cycle, the progress of the clock signal. The magnitude of the current pulse is a function of the increase in prediction of the current requirements for which the clock cycle in progress, on the size of the adaptive signal which is controlled by a feedback circuit provided in order to limit the variation of the voltage generated at the power input terminals of the DUT a function. Power supply, DUT, the current pulse, the feedback clock signal, prediction signal, the adaptive signal
公开/授权文献:
- KR1020040079960A 피시험 집적 회로용 예측, 적응성 전력 공급기 公开/授权日：2004-09-16
信息查询:
EspacenetIPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01R | 测量电变量；测量磁变量（通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
| ------G01R31/00 | 电性能的测试装置；电故障的探测装置；以所进行的测试在其他位置未提供为特征的电测试装置 |
| --------G01R31/02 | .对电设备、线路或元件进行短路、断路、泄漏或不正确连接的测试 |
| ----------G01R31/317 | ..数字电路的测试 |
| ------------G01R31/3181 | ...性能测试 |
| --------------G01R31/319 | ....测试器硬件，即输出处理电路 |