基本信息:
- 专利标题: レーザ式ガス分析計
- 专利标题(英):LASER TYPE GAS ANALYZER
- 申请号:JP2019166584 申请日:2019-09-12
- 公开(公告)号:JP2021043117A 公开(公告)日:2021-03-18
- 发明人: 中野 芳樹 , 小泉 和裕 , 山内 芳准 , 武田 直希
- 申请人: 富士電機株式会社
- 申请人地址: 神奈川県川崎市川崎区田辺新田1番1号
- 专利权人: 富士電機株式会社
- 当前专利权人: 富士電機株式会社
- 当前专利权人地址: 神奈川県川崎市川崎区田辺新田1番1号
- 代理人: 龍華国際特許業務法人
- 主分类号: H01S5/022
- IPC分类号: H01S5/022 ; H01S5/06 ; H01S5/0687 ; G01N21/39
To provide a laser type gas analyzer that does not require a reference gas cell used for correction to prevent wavelength loss and reduces the cost through simplification of the device.SOLUTION: A laser type gas analyzer comprises a signal processing circuit for measuring the concentration of gas to be measured from a gas absorption waveform present in a first wavelength sweep range of a laser beam. The signal processing circuit includes a correction unit that identifies a position of a peak wavelength of the gas absorption waveform of the gas to be measured in a second wavelength sweep range based on a relative relationship of positions of peak wavelengths of a plurality of gas absorption waveforms detected by sweeping wavelengths of the laser beam in the second wavelength sweep range that is extended from the first wavelength sweep range, and corrects the first wavelength sweep range of the laser beam based on the identified position.SELECTED DRAWING: Figure 4