发明专利
JP2008089474A Sensor unit for thermal analysis equipment and method for manufacturing the same
审中-公开
基本信息:
- 专利标题: Sensor unit for thermal analysis equipment and method for manufacturing the same
- 专利标题(中):用于热分析设备的传感器单元及其制造方法
- 申请号:JP2006272175 申请日:2006-10-03
- 公开(公告)号:JP2008089474A 公开(公告)日:2008-04-17
- 发明人: TANAKA NORIHIRO , OTAKE TOMOJI , TAKADA YOSHIHIRO
- 申请人: Rigaku Corp , 株式会社リガク
- 专利权人: Rigaku Corp,株式会社リガク
- 当前专利权人: Rigaku Corp,株式会社リガク
- 优先权: JP2006272175 2006-10-03
- 主分类号: G01N25/00
- IPC分类号: G01N25/00 ; G01K7/02
摘要:
PROBLEM TO BE SOLVED: To provide a sensor unit for thermal analysis equipment, capable of keeping a heat conduction between a furnace body and samples to detect a temperature difference between the samples with high sensitivity, while suppressing the heat conduction between a measurement sample and a reference sample, and to provide a method for manufacturing the same. SOLUTION: The sensor unit 30 for the thermal analysis equipment 1, which detects the temperature difference between the measurement sample S and the reference sample R in each sample container, includes: a base part 31 formed of an insulator and installed in the vicinity of a temperature-controlled furnace unit; a multiple thermocouple 32 formed by joining two kinds of thermocouple elements alternately, wherein a particular part of the thermocouple element is joined to the base part; and a pair of heat sensitive parts 35, 36 formed of an insulator, having a mounting surface on which each sample container is mounted, and joining to element junctions of the multiple thermocouple. The pair of heat sensitive parts 35, 36 are installed spaced apart from the base part 31. COPYRIGHT: (C)2008,JPO&INPIT
摘要(中):
要解决的问题:为了提供用于热分析设备的传感器单元,能够保持炉体和样品之间的热传导,以高灵敏度地检测样品之间的温度差,同时抑制测量之间的热传导 样品和参考样品,并提供其制造方法。 解决方案:用于检测每个样品容器中的测量样品S和参考样品R之间的温度差的热分析设备1的传感器单元30包括:由绝缘体形成的基部31, 温度控制炉单元附近; 通过交替地接合两种热电偶元件形成的多重热电偶32,其中热电偶元件的特定部分与基部接合; 以及由绝缘体形成的一对热敏部件35,36,其具有安装在每个样品容器上的安装表面,并且连接到多个热电偶的元件结。 一对热敏部件35,36与基部部件31分开设置。版权所有(C)2008,JPO&INPIT
信息查询:
EspacenetIPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N25/00 | 应用热方法测试或分析材料 |